JPH1062809A5 - - Google Patents
Info
- Publication number
- JPH1062809A5 JPH1062809A5 JP1996213414A JP21341496A JPH1062809A5 JP H1062809 A5 JPH1062809 A5 JP H1062809A5 JP 1996213414 A JP1996213414 A JP 1996213414A JP 21341496 A JP21341496 A JP 21341496A JP H1062809 A5 JPH1062809 A5 JP H1062809A5
- Authority
- JP
- Japan
- Prior art keywords
- substrate
- projection
- pattern
- exposure method
- scanning direction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8213414A JPH1062809A (ja) | 1996-08-13 | 1996-08-13 | 投影露光方法 |
| KR1019970015622A KR100468234B1 (ko) | 1996-05-08 | 1997-04-25 | 노광방법,노광장치및디스크 |
| US08/848,394 US6204912B1 (en) | 1996-05-08 | 1997-05-08 | Exposure method, exposure apparatus, and mask |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8213414A JPH1062809A (ja) | 1996-08-13 | 1996-08-13 | 投影露光方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH1062809A JPH1062809A (ja) | 1998-03-06 |
| JPH1062809A5 true JPH1062809A5 (enExample) | 2004-08-19 |
Family
ID=16638842
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8213414A Pending JPH1062809A (ja) | 1996-05-08 | 1996-08-13 | 投影露光方法 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH1062809A (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW447009B (en) | 1999-02-12 | 2001-07-21 | Nippon Kogaku Kk | Scanning exposure method and scanning type exposure device |
| KR101006435B1 (ko) * | 2003-09-01 | 2011-01-06 | 삼성전자주식회사 | 노광 마스크, 이를 포함하는 노광 장치 및 이를 이용한표시 장치용 표시판의 제조 방법 |
| US7704850B2 (en) * | 2006-09-08 | 2010-04-27 | Asml Netherlands B.V. | Semiconductor device for measuring an overlay error, method for measuring an overlay error, lithographic apparatus and device manufacturing method |
| WO2019021858A1 (ja) | 2017-07-25 | 2019-01-31 | 凸版印刷株式会社 | 露光装置および露光方法 |
| JP7204507B2 (ja) * | 2019-02-05 | 2023-01-16 | キオクシア株式会社 | 露光方法および露光装置 |
| JP2019117403A (ja) * | 2019-03-22 | 2019-07-18 | 株式会社ニコン | 露光装置、並びにディスプレイ及びデバイスの製造方法 |
| JP6734573B2 (ja) * | 2019-03-22 | 2020-08-05 | 株式会社ニコン | 露光装置、並びにディスプレイ及びデバイスの製造方法 |
-
1996
- 1996-08-13 JP JP8213414A patent/JPH1062809A/ja active Pending
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