JPH075406Y2 - 試料面分析装置 - Google Patents

試料面分析装置

Info

Publication number
JPH075406Y2
JPH075406Y2 JP1985120707U JP12070785U JPH075406Y2 JP H075406 Y2 JPH075406 Y2 JP H075406Y2 JP 1985120707 U JP1985120707 U JP 1985120707U JP 12070785 U JP12070785 U JP 12070785U JP H075406 Y2 JPH075406 Y2 JP H075406Y2
Authority
JP
Japan
Prior art keywords
sample
ray
sample surface
scanning
peak
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1985120707U
Other languages
English (en)
Japanese (ja)
Other versions
JPS62115153U (enExample
Inventor
暉士 平居
武 荒木
秀人 古味
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP1985120707U priority Critical patent/JPH075406Y2/ja
Publication of JPS62115153U publication Critical patent/JPS62115153U/ja
Application granted granted Critical
Publication of JPH075406Y2 publication Critical patent/JPH075406Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP1985120707U 1985-08-05 1985-08-05 試料面分析装置 Expired - Lifetime JPH075406Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985120707U JPH075406Y2 (ja) 1985-08-05 1985-08-05 試料面分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985120707U JPH075406Y2 (ja) 1985-08-05 1985-08-05 試料面分析装置

Publications (2)

Publication Number Publication Date
JPS62115153U JPS62115153U (enExample) 1987-07-22
JPH075406Y2 true JPH075406Y2 (ja) 1995-02-08

Family

ID=31009276

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985120707U Expired - Lifetime JPH075406Y2 (ja) 1985-08-05 1985-08-05 試料面分析装置

Country Status (1)

Country Link
JP (1) JPH075406Y2 (enExample)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4322953Y1 (enExample) * 1964-01-16 1968-09-27
JPS53114288U (enExample) * 1977-02-18 1978-09-11

Also Published As

Publication number Publication date
JPS62115153U (enExample) 1987-07-22

Similar Documents

Publication Publication Date Title
JP5901814B1 (ja) 顕微分光装置
CN1270176C (zh) 对组合样品的结构和成分进行测量分析的方法及装置
US20150146858A1 (en) X-ray topography apparatus
JP4565119B2 (ja) ラマン分光装置
US7342995B2 (en) Apparatus for estimating specific polymer crystal
JPH075406Y2 (ja) 試料面分析装置
CN1504741A (zh) 金属原位分析仪
JPH0642357B2 (ja) 試料面分析装置
JP3405250B2 (ja) 分光測光器
JP5353671B2 (ja) Icp発光分光分析装置
JP2658127B2 (ja) 薄層のx線分光分析方法
JP2008008864A (ja) X線分析装置
JP4881307B2 (ja) 蛍光x線分析方法
JP3257571B2 (ja) 異物分析方法及び異物分析装置
JP2919598B2 (ja) X線トポグラフィ装置
JP4628127B2 (ja) 試料表面の測定方法及び分析方法並びに電子ビーム装置
JP2759830B2 (ja) X線解析方法及びその装置
CN213422958U (zh) 一种平面光谱扫描仪
KR20250165139A (ko) 엑스선 형광 분석장치 및 분석방법
JPS6226411B2 (enExample)
JPH04335147A (ja) X線回折装置
CN119845928A (zh) 一种基于3d映射的libs异质样品检测分析系统及方法
JP2876672B2 (ja) 表面分析装置
JPH0762990B2 (ja) 試料面分析装置
JP2751367B2 (ja) 表面分析装置