JPS62115153U - - Google Patents

Info

Publication number
JPS62115153U
JPS62115153U JP12070785U JP12070785U JPS62115153U JP S62115153 U JPS62115153 U JP S62115153U JP 12070785 U JP12070785 U JP 12070785U JP 12070785 U JP12070785 U JP 12070785U JP S62115153 U JPS62115153 U JP S62115153U
Authority
JP
Japan
Prior art keywords
sample
sample surface
ray
analysis device
excitation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP12070785U
Other languages
English (en)
Japanese (ja)
Other versions
JPH075406Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1985120707U priority Critical patent/JPH075406Y2/ja
Publication of JPS62115153U publication Critical patent/JPS62115153U/ja
Application granted granted Critical
Publication of JPH075406Y2 publication Critical patent/JPH075406Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)
JP1985120707U 1985-08-05 1985-08-05 試料面分析装置 Expired - Lifetime JPH075406Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1985120707U JPH075406Y2 (ja) 1985-08-05 1985-08-05 試料面分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1985120707U JPH075406Y2 (ja) 1985-08-05 1985-08-05 試料面分析装置

Publications (2)

Publication Number Publication Date
JPS62115153U true JPS62115153U (enExample) 1987-07-22
JPH075406Y2 JPH075406Y2 (ja) 1995-02-08

Family

ID=31009276

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1985120707U Expired - Lifetime JPH075406Y2 (ja) 1985-08-05 1985-08-05 試料面分析装置

Country Status (1)

Country Link
JP (1) JPH075406Y2 (enExample)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4322953Y1 (enExample) * 1964-01-16 1968-09-27
JPS53114288U (enExample) * 1977-02-18 1978-09-11

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4322953Y1 (enExample) * 1964-01-16 1968-09-27
JPS53114288U (enExample) * 1977-02-18 1978-09-11

Also Published As

Publication number Publication date
JPH075406Y2 (ja) 1995-02-08

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