JPS5397895A - X-ray analyzer - Google Patents
X-ray analyzerInfo
- Publication number
- JPS5397895A JPS5397895A JP1286677A JP1286677A JPS5397895A JP S5397895 A JPS5397895 A JP S5397895A JP 1286677 A JP1286677 A JP 1286677A JP 1286677 A JP1286677 A JP 1286677A JP S5397895 A JPS5397895 A JP S5397895A
- Authority
- JP
- Japan
- Prior art keywords
- ray analyzer
- sample
- electron beam
- ray
- ray spectrometer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Abstract
PURPOSE:To carry out surface analysis over a broad area without displacement of sample by providing a means for scanning electron beam on sample, X-ray spectrometer and X-ray detector, and altering the position is X-ray spectrometer corresponding to the position of the electron beam.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1286677A JPS5397895A (en) | 1977-02-08 | 1977-02-08 | X-ray analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1286677A JPS5397895A (en) | 1977-02-08 | 1977-02-08 | X-ray analyzer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5397895A true JPS5397895A (en) | 1978-08-26 |
JPS627974B2 JPS627974B2 (en) | 1987-02-20 |
Family
ID=11817325
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1286677A Granted JPS5397895A (en) | 1977-02-08 | 1977-02-08 | X-ray analyzer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5397895A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6076652A (en) * | 1983-09-30 | 1985-05-01 | Shimadzu Corp | Forming method of scanning x-ray image |
-
1977
- 1977-02-08 JP JP1286677A patent/JPS5397895A/en active Granted
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6076652A (en) * | 1983-09-30 | 1985-05-01 | Shimadzu Corp | Forming method of scanning x-ray image |
Also Published As
Publication number | Publication date |
---|---|
JPS627974B2 (en) | 1987-02-20 |
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