JPH0745029Y2 - Ｉｃ試験装置 - Google Patents

Ｉｃ試験装置

Info

Publication number
JPH0745029Y2
JPH0745029Y2 JP12786987U JP12786987U JPH0745029Y2 JP H0745029 Y2 JPH0745029 Y2 JP H0745029Y2 JP 12786987 U JP12786987 U JP 12786987U JP 12786987 U JP12786987 U JP 12786987U JP H0745029 Y2 JPH0745029 Y2 JP H0745029Y2
Authority
JP
Japan
Prior art keywords
signal
output
input
output terminal
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP12786987U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6433083U (en, 2012
Inventor
寛 塚原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advantest Corp
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Priority to JP12786987U priority Critical patent/JPH0745029Y2/ja
Publication of JPS6433083U publication Critical patent/JPS6433083U/ja
Application granted granted Critical
Publication of JPH0745029Y2 publication Critical patent/JPH0745029Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
JP12786987U 1987-08-21 1987-08-21 Ｉｃ試験装置 Expired - Lifetime JPH0745029Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12786987U JPH0745029Y2 (ja) 1987-08-21 1987-08-21 Ｉｃ試験装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12786987U JPH0745029Y2 (ja) 1987-08-21 1987-08-21 Ｉｃ試験装置

Publications (2)

Publication Number Publication Date
JPS6433083U JPS6433083U (en, 2012) 1989-03-01
JPH0745029Y2 true JPH0745029Y2 (ja) 1995-10-11

Family

ID=31380685

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12786987U Expired - Lifetime JPH0745029Y2 (ja) 1987-08-21 1987-08-21 Ｉｃ試験装置

Country Status (1)

Country Link
JP (1) JPH0745029Y2 (en, 2012)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100736673B1 (ko) * 2006-08-01 2007-07-06 주식회사 유니테스트 반도체 소자 테스트 장치

Also Published As

Publication number Publication date
JPS6433083U (en, 2012) 1989-03-01

Similar Documents

Publication Publication Date Title
JPH0691140B2 (ja) 半導体集積回路
JPH0745029Y2 (ja) Ｉｃ試験装置
KR940006230A (ko) 반도체 집적회로장치 및 그 기능시험방법
KR100230492B1 (ko) 입/출력 핀 전자 회로
JP2000065890A (ja) Ｌｓｉテストシステム
JP2003107128A (ja) 半導体試験装置及び試験方法
JP2598580Y2 (ja) Ｉｃ試験装置
JP4422223B2 (ja) Ｉｃ試験装置
JP2001147254A (ja) 半導体集積回路のテスト装置とそのテスト方法
JP3605146B2 (ja) Ｉ／ｏピンエレクトロニクス回路
JPH04204068A (ja) 開閉器試験装置
JP3223924B2 (ja) Ｉｃ試験装置用論理比較器
JPH0611509Y2 (ja) マトリツクススイツチ回路
JPS6378695A (ja) 回線接続装置
JPH01267475A (ja) 論理集積回路
US6411115B2 (en) Apparatus for testing a semiconductor and process for the same
SU1084804A2 (ru) Устройство дл отладки тестов
JPH0484783A (ja) 半導体集積回路の試験方式
JPH02201179A (ja) 集積回路試験装置
JPS63109633A (ja) パス導通試験方式
JP2962552B2 (ja) Ｉｃ試験装置
JPH1026655A (ja) Ｌｓｉの試験装置
JPH08233904A (ja) バウンダリスキャン回路
JPH03115873A (ja) 半導体集積回路
JP2723676B2 (ja) 半導体集積回路