JPH0725684Y2 - 全反射蛍光ｘ線分析装置 - Google Patents

全反射蛍光ｘ線分析装置

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Publication number
JPH0725684Y2
JPH0725684Y2 JP1988122131U JP12213188U JPH0725684Y2 JP H0725684 Y2 JPH0725684 Y2 JP H0725684Y2 JP 1988122131 U JP1988122131 U JP 1988122131U JP 12213188 U JP12213188 U JP 12213188U JP H0725684 Y2 JPH0725684 Y2 JP H0725684Y2
Authority
JP
Japan
Prior art keywords
ray
base plate
incident
sample
fluorescent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988122131U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0245447U (enrdf_load_stackoverflow
Inventor
幸雄 迫
財政 岩本
Original Assignee
理学電機工業株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 理学電機工業株式会社 filed Critical 理学電機工業株式会社
Priority to JP1988122131U priority Critical patent/JPH0725684Y2/ja
Publication of JPH0245447U publication Critical patent/JPH0245447U/ja
Application granted granted Critical
Publication of JPH0725684Y2 publication Critical patent/JPH0725684Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)
JP1988122131U 1988-09-20 1988-09-20 全反射蛍光ｘ線分析装置 Expired - Lifetime JPH0725684Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988122131U JPH0725684Y2 (ja) 1988-09-20 1988-09-20 全反射蛍光ｘ線分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988122131U JPH0725684Y2 (ja) 1988-09-20 1988-09-20 全反射蛍光ｘ線分析装置

Publications (2)

Publication Number Publication Date
JPH0245447U JPH0245447U (enrdf_load_stackoverflow) 1990-03-28
JPH0725684Y2 true JPH0725684Y2 (ja) 1995-06-07

Family

ID=31369771

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988122131U Expired - Lifetime JPH0725684Y2 (ja) 1988-09-20 1988-09-20 全反射蛍光ｘ線分析装置

Country Status (1)

Country Link
JP (1) JPH0725684Y2 (enrdf_load_stackoverflow)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3542003A1 (de) * 1985-11-28 1987-06-04 Geesthacht Gkss Forschung Verfahren zur zerstoerungsfreien analyse der oberflaechenschicht von proben

Also Published As

Publication number Publication date
JPH0245447U (enrdf_load_stackoverflow) 1990-03-28

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