JPH07153823A - Dmds(ディジタル式微小鏡素子)の鋸断後のウェファ同等処理 - Google Patents
Dmds(ディジタル式微小鏡素子)の鋸断後のウェファ同等処理Info
- Publication number
- JPH07153823A JPH07153823A JP14187194A JP14187194A JPH07153823A JP H07153823 A JPH07153823 A JP H07153823A JP 14187194 A JP14187194 A JP 14187194A JP 14187194 A JP14187194 A JP 14187194A JP H07153823 A JPH07153823 A JP H07153823A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- fixture
- upper space
- elements
- vacuum
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
- 238000012545 processing Methods 0.000 title claims description 18
- 238000004140 cleaning Methods 0.000 claims abstract description 6
- 230000001681 protective effect Effects 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims description 26
- 238000004519 manufacturing process Methods 0.000 abstract description 10
- 239000004065 semiconductor Substances 0.000 abstract description 10
- 238000000926 separation method Methods 0.000 abstract description 4
- 230000000694 effects Effects 0.000 abstract 1
- 235000012431 wafers Nutrition 0.000 description 67
- 238000007689 inspection Methods 0.000 description 5
- 239000000919 ceramic Substances 0.000 description 4
- 238000012937 correction Methods 0.000 description 4
- 239000010453 quartz Substances 0.000 description 4
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 229910001220 stainless steel Inorganic materials 0.000 description 4
- 239000010935 stainless steel Substances 0.000 description 4
- 238000005498 polishing Methods 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- 239000000428 dust Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 238000013467 fragmentation Methods 0.000 description 1
- 238000006062 fragmentation reaction Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B25—HAND TOOLS; PORTABLE POWER-DRIVEN TOOLS; MANIPULATORS
- B25B—TOOLS OR BENCH DEVICES NOT OTHERWISE PROVIDED FOR, FOR FASTENING, CONNECTING, DISENGAGING OR HOLDING
- B25B11/00—Work holders not covered by any preceding group in the subclass, e.g. magnetic work holders, vacuum work holders
- B25B11/005—Vacuum work holders
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0005—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by breaking, e.g. dicing
- B28D5/0052—Means for supporting or holding work during breaking
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/0058—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material
- B28D5/0082—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work
- B28D5/0094—Accessories specially adapted for use with machines for fine working of gems, jewels, crystals, e.g. of semiconductor material for supporting, holding, feeding, conveying or discharging work the supporting or holding device being of the vacuum type
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B28—WORKING CEMENT, CLAY, OR STONE
- B28D—WORKING STONE OR STONE-LIKE MATERIALS
- B28D5/00—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor
- B28D5/02—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills
- B28D5/022—Fine working of gems, jewels, crystals, e.g. of semiconductor material; apparatus or devices therefor by rotary tools, e.g. drills by cutting with discs or wheels
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B81—MICROSTRUCTURAL TECHNOLOGY
- B81C—PROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00865—Multistep processes for the separation of wafers into individual elements
- B81C1/00888—Multistep processes involving only mechanical separation, e.g. grooving followed by cleaving
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
- G02B26/0833—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD
- G02B26/0841—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements the reflecting element being a micromechanical device, e.g. a MEMS mirror, DMD the reflecting element being moved or deformed by electrostatic means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/028—Dicing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T225/00—Severing by tearing or breaking
- Y10T225/10—Methods
- Y10T225/12—With preliminary weakening
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Dicing (AREA)
- Micromachines (AREA)
- Mechanical Light Control Or Optical Switches (AREA)
- Processing Of Stones Or Stones Resemblance Materials (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US082183 | 1993-06-24 | ||
| US08/082,183 US5445559A (en) | 1993-06-24 | 1993-06-24 | Wafer-like processing after sawing DMDs |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH07153823A true JPH07153823A (ja) | 1995-06-16 |
Family
ID=22169571
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14187194A Ceased JPH07153823A (ja) | 1993-06-24 | 1994-06-23 | Dmds(ディジタル式微小鏡素子)の鋸断後のウェファ同等処理 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US5445559A (enExample) |
| EP (1) | EP0657759B1 (enExample) |
| JP (1) | JPH07153823A (enExample) |
| KR (1) | KR100276996B1 (enExample) |
| CN (1) | CN1054210C (enExample) |
| CA (1) | CA2126111A1 (enExample) |
| DE (1) | DE69429324T2 (enExample) |
| TW (1) | TW258828B (enExample) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100332967B1 (ko) * | 2000-05-10 | 2002-04-19 | 윤종용 | 디지털 마이크로-미러 디바이스 패키지의 제조 방법 |
| JP2003163180A (ja) * | 2001-11-26 | 2003-06-06 | Apic Yamada Corp | ワーク搬送装置及びダイシング装置 |
| JP2005353707A (ja) * | 2004-06-09 | 2005-12-22 | Ishikawa Seisakusho Ltd | 半導体基板の分断方法および半導体チップの選択転写方法 |
| WO2007114331A1 (ja) * | 2006-04-04 | 2007-10-11 | Miraial Co., Ltd. | 薄板収納容器 |
| JP2007281053A (ja) * | 2006-04-04 | 2007-10-25 | Miraial Kk | 薄板収納容器 |
| JP2008508110A (ja) * | 2004-08-09 | 2008-03-21 | アナログ デバイシス, インコーポレイテッド | Memsデバイスの製造方法 |
| JP2017038072A (ja) * | 2016-09-29 | 2017-02-16 | 三星ダイヤモンド工業株式会社 | 脆性材料基板の搬送ヘッド |
Families Citing this family (109)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6219015B1 (en) | 1992-04-28 | 2001-04-17 | The Board Of Directors Of The Leland Stanford, Junior University | Method and apparatus for using an array of grating light valves to produce multicolor optical images |
| US5597767A (en) * | 1995-01-06 | 1997-01-28 | Texas Instruments Incorporated | Separation of wafer into die with wafer-level processing |
| US5841579A (en) | 1995-06-07 | 1998-11-24 | Silicon Light Machines | Flat diffraction grating light valve |
| US6969635B2 (en) * | 2000-12-07 | 2005-11-29 | Reflectivity, Inc. | Methods for depositing, releasing and packaging micro-electromechanical devices on wafer substrates |
| US5915370A (en) * | 1996-03-13 | 1999-06-29 | Micron Technology, Inc. | Saw for segmenting a semiconductor wafer |
| JP3663728B2 (ja) * | 1996-03-28 | 2005-06-22 | 信越半導体株式会社 | 薄板の研磨機 |
| US5872046A (en) * | 1996-04-10 | 1999-02-16 | Texas Instruments Incorporated | Method of cleaning wafer after partial saw |
| US6225191B1 (en) * | 1996-04-12 | 2001-05-01 | Lucent Technologies Inc. | Process for the manufacture of optical integrated circuits |
| US6686291B1 (en) | 1996-05-24 | 2004-02-03 | Texas Instruments Incorporated | Undercut process with isotropic plasma etching at package level |
| US5803797A (en) * | 1996-11-26 | 1998-09-08 | Micron Technology, Inc. | Method and apparatus to hold intergrated circuit chips onto a chuck and to simultaneously remove multiple intergrated circuit chips from a cutting chuck |
| US5809987A (en) * | 1996-11-26 | 1998-09-22 | Micron Technology,Inc. | Apparatus for reducing damage to wafer cutting blades during wafer dicing |
| US5982553A (en) | 1997-03-20 | 1999-11-09 | Silicon Light Machines | Display device incorporating one-dimensional grating light-valve array |
| US5817569A (en) * | 1997-05-08 | 1998-10-06 | Texas Instruments Incorporated | Method of reducing wafer particles after partial saw |
| US6088102A (en) | 1997-10-31 | 2000-07-11 | Silicon Light Machines | Display apparatus including grating light-valve array and interferometric optical system |
| US6187654B1 (en) | 1998-03-13 | 2001-02-13 | Intercon Tools, Inc. | Techniques for maintaining alignment of cut dies during substrate dicing |
| US6319075B1 (en) * | 1998-04-17 | 2001-11-20 | Fci Americas Technology, Inc. | Power connector |
| US20020098743A1 (en) * | 1998-04-17 | 2002-07-25 | Schell Mark S. | Power connector |
| US7314377B2 (en) | 1998-04-17 | 2008-01-01 | Fci Americas Technology, Inc. | Electrical power connector |
| US6271808B1 (en) | 1998-06-05 | 2001-08-07 | Silicon Light Machines | Stereo head mounted display using a single display device |
| US6101036A (en) | 1998-06-23 | 2000-08-08 | Silicon Light Machines | Embossed diffraction grating alone and in combination with changeable image display |
| US6130770A (en) | 1998-06-23 | 2000-10-10 | Silicon Light Machines | Electron gun activated grating light valve |
| US6215579B1 (en) | 1998-06-24 | 2001-04-10 | Silicon Light Machines | Method and apparatus for modulating an incident light beam for forming a two-dimensional image |
| US6303986B1 (en) | 1998-07-29 | 2001-10-16 | Silicon Light Machines | Method of and apparatus for sealing an hermetic lid to a semiconductor die |
| US6872984B1 (en) | 1998-07-29 | 2005-03-29 | Silicon Light Machines Corporation | Method of sealing a hermetic lid to a semiconductor die at an angle |
| JP3516592B2 (ja) * | 1998-08-18 | 2004-04-05 | 沖電気工業株式会社 | 半導体装置およびその製造方法 |
| JP3485816B2 (ja) * | 1998-12-09 | 2004-01-13 | 太陽誘電株式会社 | ダイシング装置 |
| JP4388640B2 (ja) * | 1999-09-10 | 2009-12-24 | 株式会社ディスコ | Csp基板保持部材及び該csp基板保持部材が載置されるcsp基板用テーブル |
| US6635512B1 (en) * | 1999-11-04 | 2003-10-21 | Rohm Co., Ltd. | Method of producing a semiconductor device by dividing a semiconductor wafer into separate pieces of semiconductor chips |
| US6521477B1 (en) | 2000-02-02 | 2003-02-18 | Raytheon Company | Vacuum package fabrication of integrated circuit components |
| US6479320B1 (en) * | 2000-02-02 | 2002-11-12 | Raytheon Company | Vacuum package fabrication of microelectromechanical system devices with integrated circuit components |
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| US6387778B1 (en) | 2000-02-11 | 2002-05-14 | Seagate Technology Llc | Breakable tethers for microelectromechanical system devices utilizing reactive ion etching lag |
| US6690014B1 (en) | 2000-04-25 | 2004-02-10 | Raytheon Company | Microbolometer and method for forming |
| US6346030B1 (en) * | 2000-05-09 | 2002-02-12 | Sandia Corporation | Microdevice having interior cavity with high aspect ratio surface features and associated methods of manufacture and use |
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| US6335224B1 (en) | 2000-05-16 | 2002-01-01 | Sandia Corporation | Protection of microelectronic devices during packaging |
| DE60032521T2 (de) * | 2000-05-24 | 2007-11-22 | Silverbrook Research Pty. Ltd., Balmain | Verfahren zur herstellung von mikroelektromechanische vorrichtungen enthaltenden bauelementen durch verwendung von wenigstens einem uv-härtbaren band |
| KR100370398B1 (ko) * | 2000-06-22 | 2003-01-30 | 삼성전자 주식회사 | 전자 및 mems 소자의 표면실장형 칩 규모 패키징 방법 |
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| JP5571331B2 (ja) * | 2009-07-07 | 2014-08-13 | 株式会社ディスコ | 切削装置 |
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| JP2017054956A (ja) * | 2015-09-10 | 2017-03-16 | 株式会社ディスコ | 被加工物の支持治具 |
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- 1994-06-16 EP EP19940109280 patent/EP0657759B1/en not_active Expired - Lifetime
- 1994-06-17 CA CA 2126111 patent/CA2126111A1/en not_active Abandoned
- 1994-06-23 JP JP14187194A patent/JPH07153823A/ja not_active Ceased
- 1994-06-23 KR KR1019940014413A patent/KR100276996B1/ko not_active Expired - Fee Related
- 1994-06-24 CN CN94107015A patent/CN1054210C/zh not_active Expired - Fee Related
- 1994-08-29 TW TW83107896A patent/TW258828B/zh active
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100332967B1 (ko) * | 2000-05-10 | 2002-04-19 | 윤종용 | 디지털 마이크로-미러 디바이스 패키지의 제조 방법 |
| JP2003163180A (ja) * | 2001-11-26 | 2003-06-06 | Apic Yamada Corp | ワーク搬送装置及びダイシング装置 |
| JP2005353707A (ja) * | 2004-06-09 | 2005-12-22 | Ishikawa Seisakusho Ltd | 半導体基板の分断方法および半導体チップの選択転写方法 |
| JP2008508110A (ja) * | 2004-08-09 | 2008-03-21 | アナログ デバイシス, インコーポレイテッド | Memsデバイスの製造方法 |
| JP4809838B2 (ja) * | 2004-08-09 | 2011-11-09 | アナログ デバイシス, インコーポレイテッド | Memsデバイスの製造方法 |
| US8343369B2 (en) | 2004-08-09 | 2013-01-01 | Analog Devices, Inc. | Method of producing a MEMS device |
| WO2007114331A1 (ja) * | 2006-04-04 | 2007-10-11 | Miraial Co., Ltd. | 薄板収納容器 |
| JP2007281053A (ja) * | 2006-04-04 | 2007-10-25 | Miraial Kk | 薄板収納容器 |
| JP2017038072A (ja) * | 2016-09-29 | 2017-02-16 | 三星ダイヤモンド工業株式会社 | 脆性材料基板の搬送ヘッド |
Also Published As
| Publication number | Publication date |
|---|---|
| EP0657759B1 (en) | 2001-12-05 |
| KR100276996B1 (ko) | 2001-02-01 |
| CA2126111A1 (en) | 1994-12-25 |
| EP0657759A2 (en) | 1995-06-14 |
| CN1104341A (zh) | 1995-06-28 |
| DE69429324D1 (de) | 2002-01-17 |
| US5605489A (en) | 1997-02-25 |
| TW258828B (enExample) | 1995-10-01 |
| EP0657759A3 (en) | 1995-08-09 |
| DE69429324T2 (de) | 2002-08-08 |
| KR950001989A (ko) | 1995-01-04 |
| CN1054210C (zh) | 2000-07-05 |
| US5445559A (en) | 1995-08-29 |
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