JPH0714926Y2 - 半導体試験装置の波形入出力装置 - Google Patents
半導体試験装置の波形入出力装置Info
- Publication number
- JPH0714926Y2 JPH0714926Y2 JP11847588U JP11847588U JPH0714926Y2 JP H0714926 Y2 JPH0714926 Y2 JP H0714926Y2 JP 11847588 U JP11847588 U JP 11847588U JP 11847588 U JP11847588 U JP 11847588U JP H0714926 Y2 JPH0714926 Y2 JP H0714926Y2
- Authority
- JP
- Japan
- Prior art keywords
- relay contact
- output
- under test
- semiconductor device
- relay
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11847588U JPH0714926Y2 (ja) | 1988-09-09 | 1988-09-09 | 半導体試験装置の波形入出力装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP11847588U JPH0714926Y2 (ja) | 1988-09-09 | 1988-09-09 | 半導体試験装置の波形入出力装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0239179U JPH0239179U (US20080293856A1-20081127-C00150.png) | 1990-03-15 |
JPH0714926Y2 true JPH0714926Y2 (ja) | 1995-04-10 |
Family
ID=31362870
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP11847588U Expired - Lifetime JPH0714926Y2 (ja) | 1988-09-09 | 1988-09-09 | 半導体試験装置の波形入出力装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0714926Y2 (US20080293856A1-20081127-C00150.png) |
-
1988
- 1988-09-09 JP JP11847588U patent/JPH0714926Y2/ja not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPH0239179U (US20080293856A1-20081127-C00150.png) | 1990-03-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH0714926Y2 (ja) | 半導体試験装置の波形入出力装置 | |
JPS62120547A (ja) | インサ−キツトエミユレ−タ接続方式 | |
JP2000206166A (ja) | Ecu機能検査装置の評価システム | |
JPH0540457Y2 (US20080293856A1-20081127-C00150.png) | ||
JPS63148580A (ja) | 入出力コネクタ分離型プリント基板 | |
JPH0519819Y2 (US20080293856A1-20081127-C00150.png) | ||
JPS628533Y2 (US20080293856A1-20081127-C00150.png) | ||
JPH06258345A (ja) | Lsiテストアダプタ | |
JP2502931Y2 (ja) | テストプラグ | |
JPS629276A (ja) | 半導体集積回路検査装置 | |
JPS60113165A (ja) | 半導体素子のバ−ンイン装置 | |
JP2519283Y2 (ja) | カ−ドモジユ−ル | |
JP2556129B2 (ja) | フレキシブルプローブカード | |
JPH04355378A (ja) | コンタクトプローブ接触確認法 | |
JPH01210874A (ja) | 半導体装置の検査方法 | |
JPS62174283U (US20080293856A1-20081127-C00150.png) | ||
JPH03293571A (ja) | 半導体集積回路試験装置 | |
JPS6329273A (ja) | バ−ンイン基板 | |
JPS596553A (ja) | 論理回路 | |
JPS62108166A (ja) | プリント回路ユニツト・チエツク処理方式 | |
JPS6247981U (US20080293856A1-20081127-C00150.png) | ||
JPH0593763A (ja) | 電子回路装置の試験方法及び装置 | |
JPH0933614A (ja) | 接続装置 | |
JPS6417476U (US20080293856A1-20081127-C00150.png) | ||
JPH05264653A (ja) | Soj型icソケット |