JPH0611463Y2 - 高周波プローブ - Google Patents

高周波プローブ

Info

Publication number
JPH0611463Y2
JPH0611463Y2 JP14315787U JP14315787U JPH0611463Y2 JP H0611463 Y2 JPH0611463 Y2 JP H0611463Y2 JP 14315787 U JP14315787 U JP 14315787U JP 14315787 U JP14315787 U JP 14315787U JP H0611463 Y2 JPH0611463 Y2 JP H0611463Y2
Authority
JP
Japan
Prior art keywords
shaped
conductor
plate
film
tip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP14315787U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6421309U (enExample
Inventor
克哉 佐藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Anritsu Corp
Original Assignee
Anritsu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anritsu Corp filed Critical Anritsu Corp
Priority to JP14315787U priority Critical patent/JPH0611463Y2/ja
Publication of JPS6421309U publication Critical patent/JPS6421309U/ja
Application granted granted Critical
Publication of JPH0611463Y2 publication Critical patent/JPH0611463Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Measuring Leads Or Probes (AREA)
JP14315787U 1987-02-06 1987-09-21 高周波プローブ Expired - Lifetime JPH0611463Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14315787U JPH0611463Y2 (ja) 1987-02-06 1987-09-21 高周波プローブ

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP62-15493 1987-02-06
JP1549387 1987-02-06
JP14315787U JPH0611463Y2 (ja) 1987-02-06 1987-09-21 高周波プローブ

Publications (2)

Publication Number Publication Date
JPS6421309U JPS6421309U (enExample) 1989-02-02
JPH0611463Y2 true JPH0611463Y2 (ja) 1994-03-23

Family

ID=31717316

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14315787U Expired - Lifetime JPH0611463Y2 (ja) 1987-02-06 1987-09-21 高周波プローブ

Country Status (1)

Country Link
JP (1) JPH0611463Y2 (enExample)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6232789B1 (en) 1997-05-28 2001-05-15 Cascade Microtech, Inc. Probe holder for low current measurements
DE10143173A1 (de) 2000-12-04 2002-06-06 Cascade Microtech Inc Wafersonde
EP1509776A4 (en) 2002-05-23 2010-08-18 Cascade Microtech Inc PROBE TO TEST ANY TESTING EQUIPMENT
US6724205B1 (en) 2002-11-13 2004-04-20 Cascade Microtech, Inc. Probe for combined signals
US7057404B2 (en) 2003-05-23 2006-06-06 Sharp Laboratories Of America, Inc. Shielded probe for testing a device under test
DE112004002554T5 (de) 2003-12-24 2006-11-23 Cascade Microtech, Inc., Beaverton Active wafer probe
WO2006031646A2 (en) 2004-09-13 2006-03-23 Cascade Microtech, Inc. Double sided probing structures
US7449899B2 (en) 2005-06-08 2008-11-11 Cascade Microtech, Inc. Probe for high frequency signals
JP5080459B2 (ja) 2005-06-13 2012-11-21 カスケード マイクロテック インコーポレイテッド 広帯域能動／受動差動信号プローブ
US7990165B2 (en) * 2006-04-21 2011-08-02 National Institute Of Advanced Industrial Science And Technology Contact probe and method of making the same
WO2007146285A2 (en) 2006-06-09 2007-12-21 Cascade Microtech, Inc. Differential signal probe with integral balun
US7403028B2 (en) 2006-06-12 2008-07-22 Cascade Microtech, Inc. Test structure and probe for differential signals
US7443186B2 (en) 2006-06-12 2008-10-28 Cascade Microtech, Inc. On-wafer test structures for differential signals

Also Published As

Publication number Publication date
JPS6421309U (enExample) 1989-02-02

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