JPH0611463Y2 - High frequency probe - Google Patents
High frequency probeInfo
- Publication number
- JPH0611463Y2 JPH0611463Y2 JP14315787U JP14315787U JPH0611463Y2 JP H0611463 Y2 JPH0611463 Y2 JP H0611463Y2 JP 14315787 U JP14315787 U JP 14315787U JP 14315787 U JP14315787 U JP 14315787U JP H0611463 Y2 JPH0611463 Y2 JP H0611463Y2
- Authority
- JP
- Japan
- Prior art keywords
- shaped
- conductor
- plate
- film
- tip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
- Measuring Leads Or Probes (AREA)
Description
【考案の詳細な説明】 [産業上の利用分野] 本考案は高周波プローブに関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to a high frequency probe.
[従来の技術] 第7図(a)は従来の高周波プローブを示す一部切欠き
正面図、同図(b)は同図(a)のB−B線断面図であ
る。[Prior Art] FIG. 7 (a) is a partially cutaway front view showing a conventional high-frequency probe, and FIG. 7 (b) is a sectional view taken along line BB of FIG. 7 (a).
同軸伝送路10の信号用導体10aとアース用導体10
bは一枚の板状誘電体11上に延出され、この板状誘電
体11には前記信号用導体10aに対応する膜状信号用
導体12が中心に形成され、その両側にこの膜状信号用
導体12との間で一定の特性インピーダンス(普通は5
0Ω)を形成する前記アース用導体10bに対応する膜
状アース用導体13a,13bが形成されている。The signal conductor 10a and the ground conductor 10 of the coaxial transmission line 10
b is extended on one plate-shaped dielectric body 11, and the film-shaped signal conductor 12 corresponding to the signal conductor 10a is formed at the center of the plate-shaped dielectric body 11, and the film-shaped signal conductors 12 are formed on both sides thereof. A constant characteristic impedance (normally 5
Membrane ground conductors 13a and 13b corresponding to the ground conductor 10b forming 0 Ω) are formed.
そして板状誘電体11は、接続金具13により同軸伝送
路10に固定接続されている。The plate-shaped dielectric 11 is fixedly connected to the coaxial transmission line 10 by the connection fitting 13.
[考案が解決しようとする問題点] しかしこのような構造の高周波プローブでは図示ないし
被測定物と接触させる際に、高周波プローブ側の同一平
面上の複数の接点(膜状信号用導体12と膜状アース用
導体13a,13bの計3箇所)が一体構造であるため
に被測定物側の複数の接点に同時に平行して接触し難
く、良好な接触状態を得ることは困難だった。[Problems to be Solved by the Invention] However, in the high-frequency probe having such a structure, a plurality of contacts (the film-shaped signal conductor 12 and the film) on the same plane on the high-frequency probe side are brought into contact with the object to be measured or shown in the drawing. It is difficult to simultaneously make parallel contact with a plurality of contact points on the side of the object to be measured, since it is difficult to obtain a good contact state because the conductors 13a and 13b for forming a ground are integrated into a single structure.
この考案はこれらの欠点を取り除くために考えられたも
のであり、その目的は高周波プローブと被測定物を容易
にかつ確実に接触させることができるような高周波プロ
ーブを提供することにある。The present invention has been conceived in order to eliminate these drawbacks, and an object thereof is to provide a high frequency probe capable of easily and surely contacting the high frequency probe and the object to be measured.
[問題点を解決するための手段] 上記目的を達成するために、本考案の高周波プローブ
は、信号用導体(10a)およびアース用導体(10
b)で構成される同軸伝送路(10)と、 可撓性を有し該同軸伝送路の信号用導体に固定されて先
端部が揺動自在であるとともに、一方の面に被測定物
(5)の信号端子に先端部が接触自在な膜状信号用導体
(2)が形成された板状誘電体(1)と、 該板状誘電体の両側面に垂直に配置され、かつ、前記同
軸伝送路のアース導体に固定されて先端部が揺動自在で
あるとともに、膜状信号用導体との間で常に一定の特性
インピーダンスが形成される板状アース用導体(3)と
を具備したことを特徴としている。[Means for Solving the Problems] In order to achieve the above object, the high-frequency probe of the present invention includes a signal conductor (10a) and a grounding conductor (10).
a coaxial transmission line (10) composed of b) and a flexible end fixed to a signal conductor of the coaxial transmission line so that a tip end thereof can swing, and an object to be measured ( 5) A plate-shaped dielectric body (1) having a signal-shaped signal conductor (2) whose tip portion is freely contactable with the signal terminal, and arranged vertically to both side surfaces of the plate-shaped dielectric body, and It is provided with a plate-shaped grounding conductor (3) which is fixed to a grounding conductor of a coaxial transmission line and has a free-end portion which can be swung, and which always forms a constant characteristic impedance with the film-shaped signal conductor. It is characterized by that.
また、入力信号を終端あるいはモニタするために、前記
膜状信号用導体(2)を板状誘電体(1)面上の先端近
傍(1a)で折り返し、かつ折り返した先端部分から板
状誘電体(1)の先端部(1aa)まで膜状信号用導体
を設け、折り返した膜状信号用導体(2)間に膜状アー
ス用導体(3a)を形成し、この膜状アース用導体(3
a)と板状誘電体(1)の両側面にそれぞれ設けられる
2つの板状アース用導体(3)と信号用導体(2)との
間で一定の特性インピーダンスを形成した構成とするこ
ともできる。Further, in order to terminate or monitor the input signal, the film-shaped signal conductor (2) is folded back near the tip (1a) on the surface of the plate-shaped dielectric (1), and the plate-shaped dielectric is formed from the folded back tip. A film-shaped signal conductor is provided up to the tip (1aa) of (1), a film-shaped ground conductor (3a) is formed between the folded film-shaped signal conductors (2), and the film-shaped ground conductor (3) is formed.
It is also possible to form a constant characteristic impedance between the signal conductor (2) and the two plate-shaped grounding conductors (3) provided on both side surfaces of a) and the plate-shaped dielectric body (1). it can.
[作用] 板状誘電体1及び板状アース用導体3は、一体構造でな
く個々に可撓性を有し、かつ板状誘電体1に対して板状
アース用導体3が垂直に可撓性を有しているため、高周
波プローブとしての板状誘電体1上の膜状信号用導体2
及び板状アース用導体3は、常に一定のインピーダンス
を保ち、かつ被測定物に対して容易に接触することがで
き、安定した接触状態を保つことができる。[Operation] The plate-shaped dielectric 1 and the plate-shaped grounding conductor 3 are not integrated structure and have flexibility individually, and the plate-shaped grounding conductor 3 is flexible with respect to the plate-shaped dielectric 1 vertically. Film conductor 1 on the plate-shaped dielectric 1 serving as a high-frequency probe, since
The plate-shaped grounding conductor 3 always maintains a constant impedance and can easily contact the object to be measured, so that a stable contact state can be maintained.
[実施例] 以下、本考案の高周波プローブを図面に基づき説明す
る。[Embodiment] Hereinafter, a high frequency probe of the present invention will be described with reference to the drawings.
第1図(a)は、本考案の実施例を示す一部切欠き平面
図、同図(b)は、同図(a)のA−A線断面図、同図
(c)は、同図(a)のC−C線断面図である。1 (a) is a partially cutaway plan view showing an embodiment of the present invention, FIG. 1 (b) is a sectional view taken along the line AA of FIG. 1 (a), and FIG. 1 (c) is the same. It is CC sectional view taken on the line of FIG.
図に示す如く、同軸伝送路10の一端には、板状誘電体
1が設けられている。As shown in the figure, a plate-shaped dielectric 1 is provided at one end of the coaxial transmission line 10.
板状誘電体1は、平面図からみて先端部が狭まった板状
に形成され、この板状誘電体1の一方の面(上面)には
中央に膜状信号用導体2が形成されている。膜状信号用
導体2の一端は、同軸伝送路10の信号用導体10aに
ハンダ等で接続され、電気的導通が図られている。The plate-shaped dielectric 1 is formed in a plate shape having a narrowed end when viewed from a plan view, and the film-shaped signal conductor 2 is formed in the center on one surface (upper surface) of the plate-shaped dielectric 1. . One end of the film-shaped signal conductor 2 is connected to the signal conductor 10a of the coaxial transmission line 10 by soldering or the like to establish electrical conduction.
また、板状誘電体1の両側には、第1図(c)に示す如
く、この板状誘電体1に対して垂直に板状アース用導体
3,3が立設されている。板状アース用導体3,3は、
側面から見て先端が微小寸法に形成され、同軸伝送路1
0のアース用導体10bに接続金具4により各々がハン
ダ等で接続され、電気的導通が図られている。またこの
アース用導体3,3の先端付近には、接点部3b,3b
が形成されている。Further, as shown in FIG. 1 (c), plate-shaped grounding conductors 3 are vertically provided on both sides of the plate-shaped dielectric 1 so as to be perpendicular to the plate-shaped dielectric 1. The plate-shaped earth conductors 3 are
When viewed from the side, the tip is formed in a minute size, and the coaxial transmission line 1
Each of them is connected to the grounding conductor 10b of 0 by the connecting metal fitting 4 by soldering or the like to achieve electrical continuity. Also, near the tip of the grounding conductors 3 and 3, contact portions 3b and 3b are provided.
Are formed.
そしてこれら、膜状信号用導体2、板状アース用導体
3,3が形成する高周波プローブの先端部では一定の特
性インピーダンス(例えば50Ω)を保つために、膜状
信号用導体2の先端に行くにつれてテーパー状になって
いる。つまり、膜状信号用導体2と、この両側の板状ア
ース用導体3,3は先端につれ所定のギャップ比で徐々
に小さな幅に互いに接近したものとなっている。Then, in order to maintain a constant characteristic impedance (for example, 50Ω) at the tip of the high-frequency probe formed by the film-shaped signal conductor 2 and the plate-shaped grounding conductors 3 and 3, the tip goes to the tip of the film-shaped signal conductor 2. As it becomes tapered. That is, the film-shaped signal conductor 2 and the plate-shaped grounding conductors 3, 3 on both sides of the film-shaped signal conductor 2 are gradually close to each other with a predetermined gap ratio toward the tip.
これにより、先端部分における膜状信号用導体2と板状
アース用導体3,3との間隔は任意に変更ができる。
(すなわち被測定物の端子間ピッチが任意に決定でき
る) 次に、上記構成による動作を説明する。As a result, the distance between the film-shaped signal conductor 2 and the plate-shaped ground conductors 3 and 3 at the tip portion can be arbitrarily changed.
(That is, the pitch between terminals of the object to be measured can be arbitrarily determined) Next, the operation of the above configuration will be described.
被測定物5に対してアース用導体3,3はアース用導体
3,3の接点部3b,3bとこの付近の膜状信号用導体
2を接触させ、入力信号を被測定物に供給する。The ground conductors 3, 3 contact the contact points 3b, 3b of the ground conductors 3, 3 and the film-shaped signal conductor 2 in the vicinity of the object to be measured 5, and supply an input signal to the object to be measured.
このとき、膜状信号用導体2が形成された板状誘電体1
と、板状アース用導体3,3とは互いに固定されておら
ず、各々が別個に同軸伝送路10に可撓性を有して支持
されているから、例えば第2図(第1図(c)に対応し
た動作図)に示す如く、例えば平面状の被測定物5に対
してこれら膜状信号用導体2、及び板状アース用導体
3,3を適度に押圧するのみでいずれもが良好に接触で
きる。したがって、被測定物5と、高周波プローブとの
電気的接続が安定して行なえる。At this time, the plate-shaped dielectric 1 on which the film-shaped signal conductor 2 is formed
, And the plate-shaped grounding conductors 3 are not fixed to each other, but each of them is separately supported by the coaxial transmission line 10 with flexibility, so that, for example, FIG. As shown in the operation diagram corresponding to (c)), for example, only by appropriately pressing the film-shaped signal conductor 2 and the plate-shaped ground conductors 3 and 3 against the flat object 5 to be measured, both Good contact. Therefore, the electrical connection between the DUT 5 and the high frequency probe can be stably performed.
次に、第3図に示すのは、本考案の第2の実施例を示す
一部切欠き平面図である。Next, FIG. 3 is a partially cutaway plan view showing a second embodiment of the present invention.
この実施例において、同軸伝送路10は、前記入力信号
を供給するものと、この入力信号をモニタあるいは終端
するものの2本が設けられている。In this embodiment, two coaxial transmission lines 10 are provided, one for supplying the input signal and one for monitoring or terminating the input signal.
そして板状誘電体1上には、先端部で折り返された膜状
信号用導体2が形成されている。この膜状信号用導体2
の折り返し部分からは先端にかけてさらに膜状信号用導
体が形成されている。これら膜状信号用導体2の一端は
2本の同軸伝送路10の信号用導体10aに各々接続さ
れている。The film-shaped signal conductor 2 folded back at the tip is formed on the plate-shaped dielectric 1. This film-shaped signal conductor 2
A film-shaped signal conductor is further formed from the folded-back portion to the tip. One ends of the film-shaped signal conductors 2 are connected to the signal conductors 10a of the two coaxial transmission lines 10, respectively.
また、板状アース用導体3,3は、板状誘電体1の両側
に立設され、かつ折り返された膜状信号用導体2の中央
には、同様にアースの作用をなす膜状アース用導体3a
が形成されており、板状アース用導体3,3は接続金具
4により、膜状アース用導体3aと共に同軸伝送路のア
ース用導体10bに接続されている。Further, the plate-shaped ground conductors 3, 3 are provided on both sides of the plate-shaped dielectric 1 and in the center of the folded film-shaped signal conductor 2, the film-shaped ground conductors that similarly perform the function of grounding. Conductor 3a
And the plate-shaped grounding conductors 3, 3 are connected to the grounding conductor 10b of the coaxial transmission line together with the film-shaped grounding conductor 3a by the connection fitting 4.
板状アース用導体3,3は前述した如く、さらに膜状ア
ース用導体3aについても膜状信号用導体2と一定のギ
ャップ比を保ってテーパー状に形成され一定の特性イン
ピーダンスを保ったものとなっている。As described above, the plate-shaped grounding conductors 3 and 3 are formed in a taper shape with the film-shaped grounding conductor 3a maintaining a constant gap ratio with the film-shaped signal conductor 2 to maintain a constant characteristic impedance. Has become.
上述の構成による動作を説明すると、これら膜状信号用
導体2が形成された板状誘電体1と、板状アース用導体
3,3とは互いに固定されておらず可撓性を有しており
いずれも被測定物に対して良好に接触できる。The operation of the above-described configuration will be described. The plate-shaped dielectric 1 on which the film-shaped signal conductor 2 is formed and the plate-shaped ground conductors 3 and 3 are not fixed to each other and have flexibility. Each of these can make good contact with the object to be measured.
さらに、一方の同軸伝送路10により入力信号を供給す
るとともに、他方の同軸伝送路10によりこれをモニタ
あるいは終端することができる。Further, the input signal can be supplied by one coaxial transmission line 10 and can be monitored or terminated by the other coaxial transmission line 10.
次に、第4図(a)〜(d)には、本考案の第3の実施
例が示してある。この実施例は、第3図に示した第2の
実施例を改良したものであり、第2の実施例と同様の構
成部分には第3図と同様の符号を付してその説明は省略
する。Next, FIGS. 4 (a) to 4 (d) show a third embodiment of the present invention. This embodiment is an improvement of the second embodiment shown in FIG. 3, and the same components as those in the second embodiment are designated by the same reference numerals as those in FIG. 3 and their description is omitted. To do.
第4図(a),(b),(d)に示すように、本実施例
の高周波プローブは、その先端部の近傍において、二枚
の板状アース用導体3,3を接続手段としての二本の金
ワイヤ6,6によって中央の膜状アース用導体3aにそ
れぞれ接続・導通させたことを特徴としている。即ちこ
の金ワイヤ6は、その一端を膜状アース用導体3aの先
端に固定して電気的な導通状態を保ちながら、その他端
を板状アース用導体3の接点部3bに近い端縁部に固定
されている。従って板状誘電体1と板状アース用導体3
とが相対的に揺動しても、アース相互の電気的接続が途
切れることはない。また、この高周波プローブは、第4
図(b),(c)に示すように、被測定物5に対して最
先端部分で接触するので、前記金ワイヤ6が被測定物5
に直接触れることはない。As shown in FIGS. 4 (a), (b), and (d), the high-frequency probe of this embodiment has two plate-shaped grounding conductors 3, 3 as connecting means near the tip thereof. It is characterized in that it is connected to and electrically connected to the central film-shaped earth conductor 3a by two gold wires 6 and 6, respectively. That is, the gold wire 6 has one end fixed to the tip of the film-shaped grounding conductor 3a to maintain electrical continuity, and the other end to the edge portion close to the contact portion 3b of the plate-shaped grounding conductor 3. It is fixed. Therefore, the plate-shaped dielectric 1 and the plate-shaped grounding conductor 3
Even if and oscillate relatively, the electrical connection between the earths will not be interrupted. In addition, this high frequency probe
As shown in FIGS. (B) and (c), the gold wire 6 is in contact with the object to be measured 5 at the most distal end.
You will never directly touch.
本実施例の高周波プローブは、第2の実施例と同様の作
用・効果を有する他、第2の実施例よりもさらに優れた
次のような効果を示すことができる。即ち、第3図に示
した第2の実施例のように、アースがオープンの状態に
なる構造だと、高い周波数まで特性が延びず、第5図
(a)に示すように6,5GHzあたりでディップが生
じてしまう。ところが本実施例は前述のような構造であ
るから、第5図(b)に示すように高い周波数(例えば
12GHz)まで特性が良くなるという効果がある。The high-frequency probe of the present embodiment has the same actions and effects as those of the second embodiment, and can exhibit the following effects which are more excellent than those of the second embodiment. That is, in the structure in which the ground is in the open state as in the second embodiment shown in FIG. 3, the characteristics do not extend to high frequencies, and as shown in FIG. Causes a dip. However, since this embodiment has the structure as described above, there is an effect that the characteristics are improved up to a high frequency (for example, 12 GHz) as shown in FIG. 5 (b).
また、本実施例では、接続手段として二本の金ワイヤ6
を用いたが、金ワイヤ6の本数は二本に限定されるもの
ではないし、さらに帯状の金リボンを用いてアース相互
の接続をしてもよい。さらにワイヤ及びリボンの材質は
金に限らず、金合金であってもよい。また第4の実施例
として、第6図(a),(b)に示すように、板状誘電
体1にスルホール7を設け、このスルホール7を介して
膜状アース用導体3aを板状誘電体1の反対面に電気的
に導出し、同面上において他の膜状アース用導体8及び
その先端に設けた金ワイヤ9によってこれを板状アース
用導体3に接続するようにしてもよい。この実施例の場
合にも、金ワイヤ9のかわりに金リボンを用いることが
でき、その本数は任意である。また同様にリボン及びワ
イヤの材質は金合金であってもよい。In addition, in this embodiment, two gold wires 6 are used as connecting means.
However, the number of the gold wires 6 is not limited to two, and a band-shaped gold ribbon may be used to connect the grounds to each other. Further, the material of the wire and the ribbon is not limited to gold, and may be gold alloy. As a fourth embodiment, as shown in FIGS. 6 (a) and 6 (b), a through hole 7 is provided in the plate-shaped dielectric 1 and the film-shaped earth conductor 3a is connected through the through hole 7 to the plate-shaped dielectric. You may make it electrically lead to the other surface of the body 1, and connect this to the plate-shaped grounding conductor 3 by another film-shaped grounding conductor 8 and the gold wire 9 provided at the tip on the same surface. . Also in the case of this embodiment, a gold ribbon can be used instead of the gold wire 9, and the number thereof is arbitrary. Similarly, the material of the ribbon and the wire may be a gold alloy.
尚、上述の各実施例で説明した同軸伝送路10の代わり
にコープレナー,マイクロストリップ,トリプレート等
の伝送路であっても良い。Incidentally, instead of the coaxial transmission line 10 described in each of the above-mentioned embodiments, a transmission line such as a coplanar, a microstrip or a triplate may be used.
[考案の効果] 以上説明したように本考案による高周波プローブによれ
ば、信号用導体とアース導体とが別個に形成され、各々
が可撓性を有しているため、被測定物に対して良好に接
触することが出来る効果がある。[Advantages of the Invention] As described above, according to the high frequency probe of the present invention, the signal conductor and the ground conductor are formed separately and each has flexibility, so It has the effect of being able to make good contact.
第1図(a)は、本考案の高周波プローブの一実施例を
示す一部切欠き平面図、第1図(b)は、同図(a)の
A−A線断面図、第1図(c)は、同図(a)のc−c
線断面図、第2図は、同動作図、第3図は、本考案の第
2の実施例を示す一部切欠き平面図、第4図(a)は本
考案の第3の実施例を示す平面図、同図(b)は同実施
例の高周波プローブが被測定物に対して接触した状態を
側面から示す図、同図(c)は同図(b)における先端
正面図、同図(d)は同図(b)におけるdd′矢視
図、第5図(a)は第2の実施例における挿入損失を示
すグラフ、同図(b)は第3の実施例における挿入損失
を示すグラフ、第6図(a)は本考案の第4の実施例を
示す断面図、同図(b)は同図(a)における上面図、
第7図(a)は、従来の高周波プローブを示す一部切欠
き平面図、第7図(b)は、同図(a)のB−B線断面
図である。 1…板状誘電体、2…膜状信号用導体、3…板状アース
用導体、3a…膜状アース導体、3b…接点部、4…接
続金具、5…被測定物、6…接続手段としての金ワイ
ヤ、7…接続手段を構成するスルホール、8…接続手段
を構成する他の膜状アース用導体、9…接続手段を構成
する金ワイヤ、10…同軸伝送路、10a…信号用導
体、10b…アース用導体。FIG. 1 (a) is a partially cutaway plan view showing an embodiment of the high frequency probe of the present invention, and FIG. 1 (b) is a sectional view taken along the line AA of FIG. 1 (a). (C) is cc of FIG.
FIG. 2 is a partially cutaway plan view showing a second embodiment of the present invention, and FIG. 4 (a) is a third embodiment of the present invention. Is a plan view showing a state in which the high-frequency probe of the embodiment is in contact with an object to be measured, and FIG. 6C is a front view of the tip in FIG. FIG. 5D is a view taken along the line dd ′ in FIG. 5B, FIG. 5A is a graph showing insertion loss in the second embodiment, and FIG. 5B is insertion loss in the third embodiment. FIG. 6 (a) is a sectional view showing a fourth embodiment of the present invention, FIG. 6 (b) is a top view in FIG. 6 (a),
FIG. 7 (a) is a partially cutaway plan view showing a conventional high-frequency probe, and FIG. 7 (b) is a sectional view taken along line BB of FIG. 7 (a). DESCRIPTION OF SYMBOLS 1 ... Plate dielectric, 2 ... Membrane signal conductor, 3 ... Plate ground conductor, 3a ... Membrane ground conductor, 3b ... Contact part, 4 ... Connection fitting, 5 ... Measured object, 6 ... Connection means As a wire, 7 ... through hole constituting connecting means, 8 ... another film ground conductor constituting connecting means, 9 ... Gold wire constituting connecting means, 10 ... Coaxial transmission line, 10a ... Signal conductor 10b ... conductor for grounding.
Claims (5)
(10b)で構成される同軸伝送路(10)と、 可撓性を有し該同軸伝送路の信号用導体に固定されて先
端部が揺動自在であるとともに、一方の面に被測定物
(5)の信号端子に先端部が接触自在な膜状信号用導体
(2)が形成された板状誘電体(1)と、 該板状誘電体の両側面に垂直に配置され、かつ、前記同
軸伝送路のアース導体に固定されて先端部が揺動自在で
あるとともに、膜状信号用導体との間で常に一定の特性
インピーダンスが形成される板状アース用導体(3)と
を具備した高周波プローブ。1. A coaxial transmission line (10) comprising a signal conductor (10a) and a grounding conductor (10b), and a tip end portion which is flexible and fixed to the signal conductor of the coaxial transmission line. And a plate-like dielectric (1) having a film-shaped signal conductor (2) formed on one surface thereof, the tip of which is in contact with the signal terminal of the DUT (5). It is arranged vertically to both side surfaces of the plate-shaped dielectric, is fixed to the ground conductor of the coaxial transmission line, and has a free-end portion, and has a constant characteristic impedance with the film-shaped signal conductor. High-frequency probe having a plate-shaped grounding conductor (3) on which the ridge is formed.
に、前記膜状信号用導体(2)を板状誘電体(1)面上
の先端近傍(1a)で折り返し、かつ折り返した先端部
分から板状誘電体(1)の先端部(1aa)まで膜状信
号用導体を設け、折り返した膜状信号用導体(2)間に
膜状アース用導体(3a)を形成し、この膜状アース用
導体(3a)と板状誘電体(1)の両側面にそれぞれ設
けられる2つの板状アース用導体(3)と信号用導体
(2)との間で一定の特性インピーダンスを形成した実
用新案登録請求の範囲第1項記載による高周波プロー
ブ。2. In order to terminate or monitor an input signal, the film-shaped signal conductor (2) is folded back near the tip (1a) on the surface of the plate-shaped dielectric (1), and a plate is formed from the folded back tip. A film-shaped signal conductor is provided up to the tip (1aa) of the film-shaped dielectric (1), and a film-shaped ground conductor (3a) is formed between the folded film-shaped signal conductors (2). Registering a utility model in which a constant characteristic impedance is formed between the conductor (3a) and the two conductors (3) for grounding the plate and the signal conductor (2) provided on both sides of the dielectric plate (1). A high frequency probe according to claim 1.
アース用導体(3)とを、接続手段によって先端部の近
傍で電気的に接続した実用新案登録請求の範囲第2項記
載の高周波プローブ。3. A utility model registration claim according to claim 2, wherein said film-shaped grounding conductor (3a) and said plate-shaped grounding conductor (3) are electrically connected by a connecting means in the vicinity of the tip. High frequency probe.
続手段としての金ワイヤ(6)の一端を固定し、該金ワ
イヤ(6)の他端を前記板状アース用導体(3)の先端
部に固定した実用新案登録請求の範囲第3項記載の高周
波プローブ。4. One end of a gold wire (6) as a connecting means is fixed to the tip of the film-shaped grounding conductor (3a), and the other end of the gold wire (6) is fixed to the plate-shaped grounding conductor (3). ) The high frequency probe according to claim 3, which is fixed to the tip of the utility model.
(7)と、該スルホール(7)を介して板状誘電体
(1)の反対面上に前記膜状アース用導体(3a)を導
出する他の膜状アース用導体(8)と、他の膜状アース
用導体(8)の導体先端を板状アース用導体(3)に接
続する金ワイヤ(9)と、によって前記接続手段を構成
した実用新案登録請求の範囲第3項記載の高周波プロー
ブ。5. A through hole (7) formed in the plate dielectric (1), and the film-like grounding conductor (3a) on the opposite surface of the plate dielectric (1) through the through hole (7). And a gold wire (9) for connecting the conductor tip of the other film-shaped grounding conductor (8) to the plate-shaped grounding conductor (3). The high-frequency probe according to claim 3, wherein the utility model is registered as a connection means.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP14315787U JPH0611463Y2 (en) | 1987-02-06 | 1987-09-21 | High frequency probe |
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62-15493 | 1987-02-06 | ||
JP1549387 | 1987-02-06 | ||
JP14315787U JPH0611463Y2 (en) | 1987-02-06 | 1987-09-21 | High frequency probe |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6421309U JPS6421309U (en) | 1989-02-02 |
JPH0611463Y2 true JPH0611463Y2 (en) | 1994-03-23 |
Family
ID=31717316
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP14315787U Expired - Lifetime JPH0611463Y2 (en) | 1987-02-06 | 1987-09-21 | High frequency probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0611463Y2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008512680A (en) | 2004-09-13 | 2008-04-24 | カスケード マイクロテック インコーポレイテッド | Double-sided probing structure |
JP5109064B2 (en) | 2006-04-21 | 2012-12-26 | 独立行政法人産業技術総合研究所 | Contact probe and manufacturing method thereof |
-
1987
- 1987-09-21 JP JP14315787U patent/JPH0611463Y2/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
JPS6421309U (en) | 1989-02-02 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US6945796B2 (en) | Impedance-tuned connector | |
JP4285597B2 (en) | Impedance-adjusted termination assembly and connector including the assembly | |
US6457983B1 (en) | Impedance-tuned connector | |
US20070259561A1 (en) | Lumped resistance electrical cable | |
JP2704305B2 (en) | High frequency connector and method of manufacturing the same | |
US6191594B1 (en) | Adapter for a measurement test probe | |
US5808475A (en) | Semiconductor probe card for low current measurements | |
US6362703B1 (en) | Vertical interconnect between coaxial and rectangular coaxial transmission line via compressible center conductors | |
JPH0611463Y2 (en) | High frequency probe | |
JPH0541413Y2 (en) | ||
JP3483961B2 (en) | High frequency connector | |
JPH02208572A (en) | High frequency probe | |
US20110043192A1 (en) | Coaxial-cable probe structure | |
JP2004309257A (en) | Probe card | |
JPH065640Y2 (en) | Contact structure of probe | |
JP2002290115A (en) | Input/output end part connection structure for millimeter wave transmission line | |
JP2572932Y2 (en) | High frequency measurement probe | |
JPH0635189Y2 (en) | High frequency probe | |
JP3199050B2 (en) | Coaxial-microstrip line converter | |
JPH11183564A (en) | Test fixture and semiconductor testing apparatus using the same | |
JP2538960Y2 (en) | Probe for evaluating high frequency characteristics of electronic devices | |
JPH03117769U (en) | ||
JPH08248063A (en) | Coaxial contact probe | |
JPH04131774U (en) | high frequency probe | |
CN118054240A (en) | Connector with a plurality of connectors |