JPH058800B2 - - Google Patents
Info
- Publication number
- JPH058800B2 JPH058800B2 JP59209897A JP20989784A JPH058800B2 JP H058800 B2 JPH058800 B2 JP H058800B2 JP 59209897 A JP59209897 A JP 59209897A JP 20989784 A JP20989784 A JP 20989784A JP H058800 B2 JPH058800 B2 JP H058800B2
- Authority
- JP
- Japan
- Prior art keywords
- ray
- rays
- spectroscopic element
- wavelength
- cumulative film
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators
- G21K1/062—Devices having a multilayer structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/061—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements characterised by a multilayer structure
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K2201/00—Arrangements for handling radiation or particles
- G21K2201/06—Arrangements for handling radiation or particles using diffractive, refractive or reflecting elements
- G21K2201/067—Construction details
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Engineering & Computer Science (AREA)
- High Energy & Nuclear Physics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59209897A JPS6189547A (ja) | 1984-10-08 | 1984-10-08 | X線分光素子 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP59209897A JPS6189547A (ja) | 1984-10-08 | 1984-10-08 | X線分光素子 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6189547A JPS6189547A (ja) | 1986-05-07 |
JPH058800B2 true JPH058800B2 (enrdf_load_stackoverflow) | 1993-02-03 |
Family
ID=16580451
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP59209897A Granted JPS6189547A (ja) | 1984-10-08 | 1984-10-08 | X線分光素子 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6189547A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01213599A (ja) * | 1988-02-23 | 1989-08-28 | Nippon Telegr & Teleph Corp <Ntt> | 反射型回折格子 |
US7742566B2 (en) * | 2007-12-07 | 2010-06-22 | General Electric Company | Multi-energy imaging system and method using optic devices |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60178342A (ja) * | 1984-02-24 | 1985-09-12 | Shimadzu Corp | X線分光用結晶 |
-
1984
- 1984-10-08 JP JP59209897A patent/JPS6189547A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6189547A (ja) | 1986-05-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPH11304728A (ja) | X線計測装置 | |
JPH08184572A (ja) | 全反射x線分析装置 | |
JPH0769477B2 (ja) | X線分光装置 | |
De Boer | Angular dependence of X‐ray fluorescence intensities | |
JPH08128971A (ja) | Exafs測定装置 | |
JPH058800B2 (enrdf_load_stackoverflow) | ||
JP2940757B2 (ja) | X線回折分析装置 | |
JP3026369B2 (ja) | 軟x線多層膜反射鏡 | |
JP3034420B2 (ja) | 蛍光x線分析におけるバックグランド補正法 | |
JPH0833359B2 (ja) | 全反射蛍光x線分析装置 | |
JPH0798285A (ja) | X線評価装置 | |
JPH0792112A (ja) | X線評価装置 | |
JP3217871B2 (ja) | X線分析装置および全反射蛍光x線分析装置 | |
JP3188393B2 (ja) | 多層膜分光素子 | |
JP2952284B2 (ja) | X線光学系の評価方法 | |
JPH0772298A (ja) | X線分光器およびx線分光素子 | |
US6650728B2 (en) | Apparatus and method for the analysis of atomic and molecular elements by wavelength dispersive X-ray spectrometric devices | |
JPH1151883A (ja) | 蛍光x線分析装置および方法 | |
JP3095031B2 (ja) | 軟x線多層膜分光素子 | |
SU741122A1 (ru) | Способ рентгеновского спектрального анализа | |
JPH06160312A (ja) | X線評価装置 | |
SU584234A1 (ru) | Способ измерени параметров решетки монокристаллов и устройство дл его реализации | |
JPH0682400A (ja) | 全反射蛍光x線分析装置 | |
Martin | Filling the spectroscopic gap between microwaves and the infra-red. Part I | |
JPH03209156A (ja) | 蛍光x線分析装置及び複合人工多層膜体 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |