JPH0582000B2 - - Google Patents

Info

Publication number
JPH0582000B2
JPH0582000B2 JP59056056A JP5605684A JPH0582000B2 JP H0582000 B2 JPH0582000 B2 JP H0582000B2 JP 59056056 A JP59056056 A JP 59056056A JP 5605684 A JP5605684 A JP 5605684A JP H0582000 B2 JPH0582000 B2 JP H0582000B2
Authority
JP
Japan
Prior art keywords
circuit
address
defective
memory
bits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59056056A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60201599A (ja
Inventor
Tetsuo Matsumoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP59056056A priority Critical patent/JPS60201599A/ja
Publication of JPS60201599A publication Critical patent/JPS60201599A/ja
Publication of JPH0582000B2 publication Critical patent/JPH0582000B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1076—Parity data used in redundant arrays of independent storages, e.g. in RAID systems
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
JP59056056A 1984-03-26 1984-03-26 半導体集積回路装置 Granted JPS60201599A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59056056A JPS60201599A (ja) 1984-03-26 1984-03-26 半導体集積回路装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59056056A JPS60201599A (ja) 1984-03-26 1984-03-26 半導体集積回路装置

Publications (2)

Publication Number Publication Date
JPS60201599A JPS60201599A (ja) 1985-10-12
JPH0582000B2 true JPH0582000B2 (zh) 1993-11-17

Family

ID=13016421

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59056056A Granted JPS60201599A (ja) 1984-03-26 1984-03-26 半導体集積回路装置

Country Status (1)

Country Link
JP (1) JPS60201599A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007179697A (ja) * 2005-12-28 2007-07-12 Toshiba Corp 半導体集積回路およびその検査方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61123100A (ja) * 1984-11-20 1986-06-10 Fujitsu Ltd 半導体記憶装置
JP4191355B2 (ja) 2000-02-10 2008-12-03 株式会社ルネサステクノロジ 半導体集積回路装置
JP2001358313A (ja) * 2000-06-14 2001-12-26 Hitachi Ltd 半導体装置
JP2005174386A (ja) 2003-12-08 2005-06-30 Elpida Memory Inc 半導体集積回路装置
US9183082B2 (en) 2013-01-29 2015-11-10 Qualcomm Incorporated Error detection and correction of one-time programmable elements

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139399A (ja) * 1982-02-15 1983-08-18 Hitachi Ltd 半導体記憶装置
JPS58155593A (ja) * 1982-03-10 1983-09-16 Hitachi Ltd 半導体記憶装置

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS58139399A (ja) * 1982-02-15 1983-08-18 Hitachi Ltd 半導体記憶装置
JPS58155593A (ja) * 1982-03-10 1983-09-16 Hitachi Ltd 半導体記憶装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007179697A (ja) * 2005-12-28 2007-07-12 Toshiba Corp 半導体集積回路およびその検査方法

Also Published As

Publication number Publication date
JPS60201599A (ja) 1985-10-12

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