JPH0576589B2 - - Google Patents
Info
- Publication number
- JPH0576589B2 JPH0576589B2 JP60091419A JP9141985A JPH0576589B2 JP H0576589 B2 JPH0576589 B2 JP H0576589B2 JP 60091419 A JP60091419 A JP 60091419A JP 9141985 A JP9141985 A JP 9141985A JP H0576589 B2 JPH0576589 B2 JP H0576589B2
- Authority
- JP
- Japan
- Prior art keywords
- power supply
- supply voltage
- circuit
- potential
- lsi
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000001514 detection method Methods 0.000 claims description 16
- 230000000295 complement effect Effects 0.000 claims description 3
- 238000005259 measurement Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 5
- 230000002950 deficient Effects 0.000 description 4
- 230000007547 defect Effects 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000006870 function Effects 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000003044 adaptive effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
Landscapes
- Measurement Of Current Or Voltage (AREA)
- Power Sources (AREA)
- Direct Current Feeding And Distribution (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60091419A JPS61249126A (ja) | 1985-04-27 | 1985-04-27 | 電源電圧低下検出回路 |
| US06/855,595 US4716323A (en) | 1985-04-27 | 1986-04-25 | Power voltage drop detecting circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP60091419A JPS61249126A (ja) | 1985-04-27 | 1985-04-27 | 電源電圧低下検出回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61249126A JPS61249126A (ja) | 1986-11-06 |
| JPH0576589B2 true JPH0576589B2 (cs) | 1993-10-22 |
Family
ID=14025847
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP60091419A Granted JPS61249126A (ja) | 1985-04-27 | 1985-04-27 | 電源電圧低下検出回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61249126A (cs) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03238365A (ja) * | 1990-02-15 | 1991-10-24 | Nec Corp | 低電圧検出回路 |
| JP2007327804A (ja) * | 2006-06-07 | 2007-12-20 | Nec Electronics Corp | 電圧降下測定回路 |
-
1985
- 1985-04-27 JP JP60091419A patent/JPS61249126A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS61249126A (ja) | 1986-11-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4716323A (en) | Power voltage drop detecting circuit | |
| JP2727921B2 (ja) | 半導体集積回路装置 | |
| US7629802B2 (en) | Semiconductor device including fuse and method for testing the same capable of suppressing erroneous determination | |
| US6548884B2 (en) | Semiconductor device | |
| JPH0428175B2 (cs) | ||
| US5285418A (en) | Semiconductor device having a temperature detection circuit | |
| US6489799B1 (en) | Integrated circuit device having process parameter measuring circuit | |
| JPS621199A (ja) | メモリ回路 | |
| EP0438074B1 (en) | Trimming code setting circuit having high reliability | |
| JP3642555B2 (ja) | 半導体装置及びそのテスト方法 | |
| JPH0576589B2 (cs) | ||
| JPH0318346B2 (cs) | ||
| US5917333A (en) | Semiconductor integrated circuit device with diagnostic circuit using resistor | |
| JP2830120B2 (ja) | 半導体メモリ装置 | |
| JPH0354841A (ja) | BiCMOS半導体装置 | |
| JP2751357B2 (ja) | トリミングコード設定回路 | |
| JP3644168B2 (ja) | 半導体集積回路 | |
| JP3076267B2 (ja) | 半導体集積回路 | |
| JPH0590940A (ja) | 半導体集積回路 | |
| JPH05259255A (ja) | 半導体集積回路 | |
| JPH0336748A (ja) | 半導体集積回路装置 | |
| JPH0640112B2 (ja) | 電源電圧検出保持回路 | |
| KR100243018B1 (ko) | 테스트 모드 회로 | |
| JPS61208315A (ja) | 半導体集積回路装置 | |
| JPH0544051B2 (cs) |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EXPY | Cancellation because of completion of term |