JPH0567652A - プローブ装置 - Google Patents

プローブ装置

Info

Publication number
JPH0567652A
JPH0567652A JP3254637A JP25463791A JPH0567652A JP H0567652 A JPH0567652 A JP H0567652A JP 3254637 A JP3254637 A JP 3254637A JP 25463791 A JP25463791 A JP 25463791A JP H0567652 A JPH0567652 A JP H0567652A
Authority
JP
Japan
Prior art keywords
chip
probe
probe card
inspected
stylus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3254637A
Other languages
English (en)
Japanese (ja)
Inventor
Wataru Karasawa
渉 唐沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Priority to JP3254637A priority Critical patent/JPH0567652A/ja
Priority to US07/937,790 priority patent/US5374888A/en
Priority to KR1019920016222A priority patent/KR100187559B1/ko
Priority to TW081107830A priority patent/TW221518B/zh
Publication of JPH0567652A publication Critical patent/JPH0567652A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S414/00—Material or article handling
    • Y10S414/135—Associated with semiconductor wafer handling
    • Y10S414/141—Associated with semiconductor wafer handling includes means for gripping wafer

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP3254637A 1991-09-05 1991-09-05 プローブ装置 Pending JPH0567652A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP3254637A JPH0567652A (ja) 1991-09-05 1991-09-05 プローブ装置
US07/937,790 US5374888A (en) 1991-09-05 1992-09-02 Electrical characteristics measurement method and measurement apparatus therefor
KR1019920016222A KR100187559B1 (ko) 1991-09-05 1992-09-05 전기적특성의 측정방법 및 그의 측정장치
TW081107830A TW221518B (oth) 1991-09-05 1992-10-01

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3254637A JPH0567652A (ja) 1991-09-05 1991-09-05 プローブ装置

Publications (1)

Publication Number Publication Date
JPH0567652A true JPH0567652A (ja) 1993-03-19

Family

ID=17267789

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3254637A Pending JPH0567652A (ja) 1991-09-05 1991-09-05 プローブ装置

Country Status (4)

Country Link
US (1) US5374888A (oth)
JP (1) JPH0567652A (oth)
KR (1) KR100187559B1 (oth)
TW (1) TW221518B (oth)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619145A (en) * 1993-06-19 1997-04-08 Tokyo Electron Limited Probe apparatus and method for inspecting object using the probe apparatus
US6075373A (en) * 1996-05-31 2000-06-13 Tokyo Electron Limited Inspection device for inspecting a semiconductor wafer
JP2009196740A (ja) * 2008-02-20 2009-09-03 Akim Kk 搬送装置
WO2011148601A1 (ja) 2010-05-26 2011-12-01 コベルコ建機株式会社 作業アタッチメント及び作業機械
US9212495B2 (en) 2011-08-24 2015-12-15 Kobelco Construction Machinery Co., Ltd. Work machine

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5561386A (en) * 1994-02-23 1996-10-01 Fujitsu Limited Chip tester with improvements in handling efficiency and measurement precision
DE69534124T2 (de) * 1994-04-18 2006-05-04 Micron Technology, Inc. Verfahren und Vorrichtung zum automatischen Positionieren elektronischer Würfel in Bauteilverpackungen
US5498970A (en) * 1995-02-06 1996-03-12 Minnesota Mining And Manufacturing Top load socket for ball grid array devices
US5686843A (en) * 1995-06-30 1997-11-11 International Business Machines Corporation Methods and apparatus for burn-in stressing and simultaneous testing of semiconductor device chips in a multichip module
US5667622A (en) * 1995-08-25 1997-09-16 Siemens Aktiengesellschaft In-situ wafer temperature control apparatus for single wafer tools
TW371347B (en) * 1995-12-27 1999-10-01 Advantest Corp Structure of rotary arm and device chuck part of a device handler
JPH10163280A (ja) * 1996-12-02 1998-06-19 Tokyo Electron Ltd 検査方法及び検査装置
US5982166A (en) * 1997-01-27 1999-11-09 Motorola, Inc. Method for measuring a characteristic of a semiconductor wafer using cylindrical control
US6008636A (en) * 1997-09-30 1999-12-28 Motorola, Inc. Test system with robot arm for delivering a device under test
US5982132A (en) * 1997-10-09 1999-11-09 Electroglas, Inc. Rotary wafer positioning system and method
US6001662A (en) * 1997-12-02 1999-12-14 International Business Machines Corporation Method and system for providing a reusable configurable self-test controller for manufactured integrated circuits
US6236902B1 (en) * 1998-02-24 2001-05-22 Data I/O Corporation Apparatus and method for retaining a device for processing
JPH11274252A (ja) * 1998-03-19 1999-10-08 Mitsubishi Electric Corp 半導体装置の検査装置及びその検査方法
US6246251B1 (en) * 1998-04-24 2001-06-12 International Rectifier Corp. Test process and apparatus for testing singulated semiconductor die
JP2000162275A (ja) * 1998-12-01 2000-06-16 Fujitsu Ltd 半導体試験方法及び半導体試験装置
DE19982805T1 (de) * 1998-12-02 2003-01-30 Delta Design Inc Vorrichtung und Verfahren zum Wenden eines IC-Bauelements
US6137303A (en) * 1998-12-14 2000-10-24 Sony Corporation Integrated testing method and apparatus for semiconductor test operations processing
JP4495726B2 (ja) * 2004-06-08 2010-07-07 株式会社アドバンテスト イメージセンサ用試験装置
ITUD20070239A1 (it) * 2007-12-18 2009-06-19 Baccini S P A Dispositivo di collaudo per collaudare piastre per circuiti elettronici e relativo procedimento
KR100979721B1 (ko) * 2008-12-04 2010-09-03 (주)에이피텍 반도체 다이의 검사 및 분류 일체화장치
TWI451100B (zh) * 2009-02-20 2014-09-01 京元電子股份有限公司 翻轉測試模組及其測試系統
US8836354B2 (en) * 2010-10-21 2014-09-16 Acculogic Corporation Apparatus for thermal testing of a printed circuit board
FR2987695A1 (fr) * 2012-07-03 2013-09-06 Commissariat Energie Atomique Dispositif et procede de support individuel de composants
FR2993096B1 (fr) 2012-07-03 2015-03-27 Commissariat Energie Atomique Dispositif et procede de support individuel de composants
KR101586391B1 (ko) * 2014-02-25 2016-01-18 한국영상기술(주) 시료 이물 검사 및 재배치 장치
US9846193B2 (en) * 2014-05-14 2017-12-19 Asm Technology Singapore Pte Ltd Semiconductor package testing apparatus
KR102569330B1 (ko) * 2015-06-24 2023-08-21 인디켈 에이에스 회전 프로브면을 가진 켈빈 프로브 시스템
JP6596374B2 (ja) * 2016-03-28 2019-10-23 東京エレクトロン株式会社 基板検査装置
KR20250009161A (ko) * 2023-07-10 2025-01-17 세메스 주식회사 프로브 카드 검사 시스템과 방법

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4295776A (en) * 1978-09-25 1981-10-20 Alan Payne Portable inverter for transferring bulk goods between pallets
US4571542A (en) * 1982-06-30 1986-02-18 Japan Synthetic Rubber Co., Ltd. Method and unit for inspecting printed wiring boards
WO1984000915A1 (en) * 1982-09-07 1984-03-15 Valeron Corp Tool changer mechanism for machining centers

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5619145A (en) * 1993-06-19 1997-04-08 Tokyo Electron Limited Probe apparatus and method for inspecting object using the probe apparatus
US6075373A (en) * 1996-05-31 2000-06-13 Tokyo Electron Limited Inspection device for inspecting a semiconductor wafer
JP2009196740A (ja) * 2008-02-20 2009-09-03 Akim Kk 搬送装置
WO2011148601A1 (ja) 2010-05-26 2011-12-01 コベルコ建機株式会社 作業アタッチメント及び作業機械
US9212495B2 (en) 2011-08-24 2015-12-15 Kobelco Construction Machinery Co., Ltd. Work machine

Also Published As

Publication number Publication date
KR100187559B1 (ko) 1999-06-01
US5374888A (en) 1994-12-20
TW221518B (oth) 1994-03-01
KR930006450A (ko) 1993-04-21

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