JPH0536752B2 - - Google Patents

Info

Publication number
JPH0536752B2
JPH0536752B2 JP58232814A JP23281483A JPH0536752B2 JP H0536752 B2 JPH0536752 B2 JP H0536752B2 JP 58232814 A JP58232814 A JP 58232814A JP 23281483 A JP23281483 A JP 23281483A JP H0536752 B2 JPH0536752 B2 JP H0536752B2
Authority
JP
Japan
Prior art keywords
phase
signal
timing
register
change
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58232814A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60125573A (ja
Inventor
Yoshihiko Hayashi
Ikuo Kawaguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP58232814A priority Critical patent/JPS60125573A/ja
Publication of JPS60125573A publication Critical patent/JPS60125573A/ja
Publication of JPH0536752B2 publication Critical patent/JPH0536752B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2882—Testing timing characteristics

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Manipulation Of Pulses (AREA)
JP58232814A 1983-12-12 1983-12-12 タイミングパルス発生器 Granted JPS60125573A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58232814A JPS60125573A (ja) 1983-12-12 1983-12-12 タイミングパルス発生器

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58232814A JPS60125573A (ja) 1983-12-12 1983-12-12 タイミングパルス発生器

Publications (2)

Publication Number Publication Date
JPS60125573A JPS60125573A (ja) 1985-07-04
JPH0536752B2 true JPH0536752B2 (US07223432-20070529-C00017.png) 1993-05-31

Family

ID=16945187

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58232814A Granted JPS60125573A (ja) 1983-12-12 1983-12-12 タイミングパルス発生器

Country Status (1)

Country Link
JP (1) JPS60125573A (US07223432-20070529-C00017.png)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61292579A (ja) * 1985-06-20 1986-12-23 Nec Corp 試験信号発生回路
JPH026767A (ja) * 1988-06-20 1990-01-10 Advantest Corp Ｉｃ試験用波形発生装置
JP4425537B2 (ja) * 2002-10-01 2010-03-03 株式会社アドバンテスト 試験装置、及び試験方法

Also Published As

Publication number Publication date
JPS60125573A (ja) 1985-07-04

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