JPH0523053B2 - - Google Patents

Info

Publication number
JPH0523053B2
JPH0523053B2 JP59058602A JP5860284A JPH0523053B2 JP H0523053 B2 JPH0523053 B2 JP H0523053B2 JP 59058602 A JP59058602 A JP 59058602A JP 5860284 A JP5860284 A JP 5860284A JP H0523053 B2 JPH0523053 B2 JP H0523053B2
Authority
JP
Japan
Prior art keywords
wafer
ring
dry etching
shaped member
etching apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59058602A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60201632A (ja
Inventor
Etsuo Wani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Priority to JP59058602A priority Critical patent/JPS60201632A/ja
Publication of JPS60201632A publication Critical patent/JPS60201632A/ja
Publication of JPH0523053B2 publication Critical patent/JPH0523053B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • ing And Chemical Polishing (AREA)
  • Drying Of Semiconductors (AREA)
JP59058602A 1984-03-27 1984-03-27 ドライエツチング装置 Granted JPS60201632A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59058602A JPS60201632A (ja) 1984-03-27 1984-03-27 ドライエツチング装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59058602A JPS60201632A (ja) 1984-03-27 1984-03-27 ドライエツチング装置

Publications (2)

Publication Number Publication Date
JPS60201632A JPS60201632A (ja) 1985-10-12
JPH0523053B2 true JPH0523053B2 (US06534493-20030318-C00166.png) 1993-03-31

Family

ID=13089059

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59058602A Granted JPS60201632A (ja) 1984-03-27 1984-03-27 ドライエツチング装置

Country Status (1)

Country Link
JP (1) JPS60201632A (US06534493-20030318-C00166.png)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6247130A (ja) * 1985-08-27 1987-02-28 Kokusai Electric Co Ltd 反応性イオンエツチング装置
JPH07107899B2 (ja) * 1985-11-06 1995-11-15 日電アネルバ株式会社 ドライエツチング装置
JP2506389B2 (ja) * 1987-11-09 1996-06-12 富士通株式会社 マスク基板のドライエッチング方法
JPH0730468B2 (ja) * 1988-06-09 1995-04-05 日電アネルバ株式会社 ドライエッチング装置
KR100281345B1 (ko) 1992-12-01 2001-03-02 조셉 제이. 스위니 전자기 결합성 플래너 플라즈마 장치에서의 산화물 에칭 공정
US6899785B2 (en) * 2001-11-05 2005-05-31 International Business Machines Corporation Method of stabilizing oxide etch and chamber performance using seasoning

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5533090A (en) * 1979-07-19 1980-03-08 Anelva Corp Etching method
JPS5555530A (en) * 1978-10-18 1980-04-23 Takuo Sugano Electrode device for plasma processor
JPS5582438A (en) * 1978-12-15 1980-06-21 Nec Corp Plasma etching device
JPS5595327A (en) * 1979-01-16 1980-07-19 Hitachi Ltd Reactive sputter-etching
JPS55154582A (en) * 1979-05-21 1980-12-02 Chiyou Lsi Gijutsu Kenkyu Kumiai Gas plasma etching method
JPS57185982A (en) * 1981-05-06 1982-11-16 Perkin Elmer Corp Plasma etching device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5555530A (en) * 1978-10-18 1980-04-23 Takuo Sugano Electrode device for plasma processor
JPS5582438A (en) * 1978-12-15 1980-06-21 Nec Corp Plasma etching device
JPS5595327A (en) * 1979-01-16 1980-07-19 Hitachi Ltd Reactive sputter-etching
JPS55154582A (en) * 1979-05-21 1980-12-02 Chiyou Lsi Gijutsu Kenkyu Kumiai Gas plasma etching method
JPS5533090A (en) * 1979-07-19 1980-03-08 Anelva Corp Etching method
JPS57185982A (en) * 1981-05-06 1982-11-16 Perkin Elmer Corp Plasma etching device

Also Published As

Publication number Publication date
JPS60201632A (ja) 1985-10-12

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term