JPS5582438A - Plasma etching device - Google Patents

Plasma etching device

Info

Publication number
JPS5582438A
JPS5582438A JP15611178A JP15611178A JPS5582438A JP S5582438 A JPS5582438 A JP S5582438A JP 15611178 A JP15611178 A JP 15611178A JP 15611178 A JP15611178 A JP 15611178A JP S5582438 A JPS5582438 A JP S5582438A
Authority
JP
Japan
Prior art keywords
substrate
reaction tube
plasma
etching
uniformity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15611178A
Other languages
Japanese (ja)
Inventor
Katsuichi Kaminaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Nippon Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp, Nippon Electric Co Ltd filed Critical NEC Corp
Priority to JP15611178A priority Critical patent/JPS5582438A/en
Publication of JPS5582438A publication Critical patent/JPS5582438A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes
    • H01J37/32431Constructional details of the reactor
    • H01J37/32623Mechanical discharge control means

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Drying Of Semiconductors (AREA)

Abstract

PURPOSE:To raise the uniformity of etching, by providing a shielding means near an etched semiconductor substrate in a reaction tube to eliminate the difference in the density of plasma between the central and peripheral parts of the substrate. CONSTITUTION:Metal electrodes 1, 2 are provided outside a reaction tube 3. An etched semiconductor substrate 9 is set in the reaction tube. The pressure in the tube is maintained at a prescribed level. An etching gas is introduced into the reaction tube. High-frequency power is applied across the metal electrodes 1, 2 to etch the substrate 9. An adjusting ring 10 is provided around the substrate 9 to restrict the supply of the etching gas to regulate the concentration of plasma on the peripheral part of the substrate 9 and feed enough plasma to its central part as well. This results in providing a uniform plasma distribution on the total surface of the substrate. Therefore, the uniformity of the etching is enhanced.
JP15611178A 1978-12-15 1978-12-15 Plasma etching device Pending JPS5582438A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15611178A JPS5582438A (en) 1978-12-15 1978-12-15 Plasma etching device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15611178A JPS5582438A (en) 1978-12-15 1978-12-15 Plasma etching device

Publications (1)

Publication Number Publication Date
JPS5582438A true JPS5582438A (en) 1980-06-21

Family

ID=15620543

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15611178A Pending JPS5582438A (en) 1978-12-15 1978-12-15 Plasma etching device

Country Status (1)

Country Link
JP (1) JPS5582438A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60201632A (en) * 1984-03-27 1985-10-12 Anelva Corp Dry etching apparatus
JPS633139U (en) * 1986-06-23 1988-01-11

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS48102774A (en) * 1972-04-10 1973-12-24
JPS52123173A (en) * 1976-04-08 1977-10-17 Fuji Photo Film Co Ltd Sputter etching method
JPS53125769A (en) * 1977-04-08 1978-11-02 Nec Corp Sputter etching method and container used for it

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS48102774A (en) * 1972-04-10 1973-12-24
JPS52123173A (en) * 1976-04-08 1977-10-17 Fuji Photo Film Co Ltd Sputter etching method
JPS53125769A (en) * 1977-04-08 1978-11-02 Nec Corp Sputter etching method and container used for it

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60201632A (en) * 1984-03-27 1985-10-12 Anelva Corp Dry etching apparatus
JPH0523053B2 (en) * 1984-03-27 1993-03-31 Anelva Corp
JPS633139U (en) * 1986-06-23 1988-01-11
JPH0514507Y2 (en) * 1986-06-23 1993-04-19

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