JPS5610932A - Plasma treating apparatus - Google Patents
Plasma treating apparatusInfo
- Publication number
- JPS5610932A JPS5610932A JP8762079A JP8762079A JPS5610932A JP S5610932 A JPS5610932 A JP S5610932A JP 8762079 A JP8762079 A JP 8762079A JP 8762079 A JP8762079 A JP 8762079A JP S5610932 A JPS5610932 A JP S5610932A
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- gas
- electrodes
- plasma
- barrier
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
Abstract
PURPOSE:To equalize a gas flow in a plasma treating apparatus by extending the end edge of one electrode to the periphery of the other electrode to produce a barrier of predetermined gap when inserting a substance to be treated between upper and lower electrodes and treating it with plasma while flowing reaction gas thereto. CONSTITUTION:An airtight chamber 5 is placed on a substrate 1 having an exhaust gas hole 6 at the center, and a lower electrode 2 is disposed in the chamber 5 while supporting it by a support 3. An upper electrode 4 having a number of gas injection holes 9 for injecting gas toward a lower surface is provided at predetermined gap oppositely to the electrode 2. Gas is supplied from a reaction gas supply hole 7 penetrated through the substrate 1 between the electrodes 2 and 4 to treat a number of semiconductor wafer 8 with plasma between the electrodes. In this configuration a barrier 10 having a conductor 10a at the root and an insulator 10b at the end is mounted at the peripheral edge of the lower electrode 2, and is erected at a gap on the peripheral edge of the upper electrode 2. In this manner the gas flow between the electrodes becomes uniform to enable uniform treatment of the wafers 8 on the periphery.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8762079A JPS5610932A (en) | 1979-07-09 | 1979-07-09 | Plasma treating apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP8762079A JPS5610932A (en) | 1979-07-09 | 1979-07-09 | Plasma treating apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5610932A true JPS5610932A (en) | 1981-02-03 |
Family
ID=13920008
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP8762079A Pending JPS5610932A (en) | 1979-07-09 | 1979-07-09 | Plasma treating apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5610932A (en) |
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57156034A (en) * | 1981-02-13 | 1982-09-27 | Ramu Research Corp | Plasma treating chamber |
JPS5811240U (en) * | 1981-07-14 | 1983-01-25 | 株式会社島津製作所 | Plasma CVD equipment |
JPS59143328A (en) * | 1983-02-03 | 1984-08-16 | Anelva Corp | Dry etching device |
JPS603479A (en) * | 1983-05-27 | 1985-01-09 | ル−カス・インダストリ−ズ・パブリツク・リミテツド・カンパニ− | Start motor |
JPS6012735A (en) * | 1983-07-01 | 1985-01-23 | Hitachi Ltd | Etching device |
JPS60115231A (en) * | 1983-11-28 | 1985-06-21 | Hitachi Ltd | Etching method |
JPS632325A (en) * | 1986-06-20 | 1988-01-07 | Fujitsu Ltd | Reactive ion etching apparatus |
JPS63136524A (en) * | 1986-11-27 | 1988-06-08 | Tokuda Seisakusho Ltd | Dry etching apparatus |
US5422139A (en) * | 1990-04-12 | 1995-06-06 | Balzers Aktiengesellschaft | Method for a reactive surface treatment of a workpiece and a treatment chamber for practicing such method |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5220760A (en) * | 1975-08-11 | 1977-02-16 | Toshiba Corp | Colour picture tube |
JPS5518400A (en) * | 1978-07-27 | 1980-02-08 | Eaton Corp | Plasma etching device |
-
1979
- 1979-07-09 JP JP8762079A patent/JPS5610932A/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5220760A (en) * | 1975-08-11 | 1977-02-16 | Toshiba Corp | Colour picture tube |
JPS5518400A (en) * | 1978-07-27 | 1980-02-08 | Eaton Corp | Plasma etching device |
Cited By (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS57156034A (en) * | 1981-02-13 | 1982-09-27 | Ramu Research Corp | Plasma treating chamber |
JPS6244971B2 (en) * | 1981-02-13 | 1987-09-24 | Ramu Risaachi Corp | |
JPS5811240U (en) * | 1981-07-14 | 1983-01-25 | 株式会社島津製作所 | Plasma CVD equipment |
JPS59143328A (en) * | 1983-02-03 | 1984-08-16 | Anelva Corp | Dry etching device |
JPS603479A (en) * | 1983-05-27 | 1985-01-09 | ル−カス・インダストリ−ズ・パブリツク・リミテツド・カンパニ− | Start motor |
JPS6012735A (en) * | 1983-07-01 | 1985-01-23 | Hitachi Ltd | Etching device |
JPS60115231A (en) * | 1983-11-28 | 1985-06-21 | Hitachi Ltd | Etching method |
JPS632325A (en) * | 1986-06-20 | 1988-01-07 | Fujitsu Ltd | Reactive ion etching apparatus |
JPS63136524A (en) * | 1986-11-27 | 1988-06-08 | Tokuda Seisakusho Ltd | Dry etching apparatus |
US5422139A (en) * | 1990-04-12 | 1995-06-06 | Balzers Aktiengesellschaft | Method for a reactive surface treatment of a workpiece and a treatment chamber for practicing such method |
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