JPH0517667Y2 - - Google Patents

Info

Publication number
JPH0517667Y2
JPH0517667Y2 JP8869687U JP8869687U JPH0517667Y2 JP H0517667 Y2 JPH0517667 Y2 JP H0517667Y2 JP 8869687 U JP8869687 U JP 8869687U JP 8869687 U JP8869687 U JP 8869687U JP H0517667 Y2 JPH0517667 Y2 JP H0517667Y2
Authority
JP
Japan
Prior art keywords
output
circuit
input
wiring
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP8869687U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63200176U (de
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8869687U priority Critical patent/JPH0517667Y2/ja
Publication of JPS63200176U publication Critical patent/JPS63200176U/ja
Application granted granted Critical
Publication of JPH0517667Y2 publication Critical patent/JPH0517667Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP8869687U 1987-06-09 1987-06-09 Expired - Lifetime JPH0517667Y2 (de)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8869687U JPH0517667Y2 (de) 1987-06-09 1987-06-09

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8869687U JPH0517667Y2 (de) 1987-06-09 1987-06-09

Publications (2)

Publication Number Publication Date
JPS63200176U JPS63200176U (de) 1988-12-23
JPH0517667Y2 true JPH0517667Y2 (de) 1993-05-12

Family

ID=30947021

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8869687U Expired - Lifetime JPH0517667Y2 (de) 1987-06-09 1987-06-09

Country Status (1)

Country Link
JP (1) JPH0517667Y2 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2820062B2 (ja) * 1995-04-12 1998-11-05 日本電気株式会社 半導体集積回路及びこの回路が実装されたプリント基板

Also Published As

Publication number Publication date
JPS63200176U (de) 1988-12-23

Similar Documents

Publication Publication Date Title
US9417283B2 (en) Semiconductor test system and method
JP2827229B2 (ja) 半導体集積回路
JP3502033B2 (ja) テスト回路
JP4618598B2 (ja) 半導体装置
JPH0517667Y2 (de)
JPH0862294A (ja) 半導体装置及び半導体装置のテスト方法
JPH10150082A (ja) 半導体試験装置
JP3080847B2 (ja) 半導体記憶装置
JP4705886B2 (ja) 回路基板の診断方法、回路基板およびcpuユニット
JPH0746130B2 (ja) Lsiシステム
US6765403B2 (en) Test circuit and test method for protecting an IC against damage from activation of too many current drawing circuits at one time
JP4690731B2 (ja) 半導体装置とそのテスト装置及びテスト方法。
JP3753797B2 (ja) マイクロコンピュータ装置
JPH09211076A (ja) 回路基板検査装置および半導体回路
JPH1010193A (ja) 半導体装置およびそれを用いた半導体装置実装体
JPS60147127A (ja) 内部信号テスト回路付集積回路
JPH0749363A (ja) チップオンボード基板のショート検出方法
US20070271057A1 (en) Inspection method of semiconductor integrated circuit and semiconductor
KR100294706B1 (ko) 경보 버퍼 자체 진단 시스템 및 그를 이용한 자체 진단 방법
JPS636471A (ja) 論理集積回路
JPH08152459A (ja) 半導体装置及びその試験方法
Masuda et al. 4613970 Integrated circuit device and method of diagnosing the same
Bruce et al. 4612805 Adhesion characterization test site
Thornton et al. 4616178 Pulsed linear integrated circuit tester
JPH04134275A (ja) 論理回路