JPH0473620B2 - - Google Patents

Info

Publication number
JPH0473620B2
JPH0473620B2 JP60011870A JP1187085A JPH0473620B2 JP H0473620 B2 JPH0473620 B2 JP H0473620B2 JP 60011870 A JP60011870 A JP 60011870A JP 1187085 A JP1187085 A JP 1187085A JP H0473620 B2 JPH0473620 B2 JP H0473620B2
Authority
JP
Japan
Prior art keywords
stage
distance
probe
semiconductor wafer
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60011870A
Other languages
English (en)
Japanese (ja)
Other versions
JPS61171145A (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1187085A priority Critical patent/JPS61171145A/ja
Publication of JPS61171145A publication Critical patent/JPS61171145A/ja
Publication of JPH0473620B2 publication Critical patent/JPH0473620B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
JP1187085A 1985-01-25 1985-01-25 半導体装置の検査方法 Granted JPS61171145A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1187085A JPS61171145A (ja) 1985-01-25 1985-01-25 半導体装置の検査方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1187085A JPS61171145A (ja) 1985-01-25 1985-01-25 半導体装置の検査方法

Publications (2)

Publication Number Publication Date
JPS61171145A JPS61171145A (ja) 1986-08-01
JPH0473620B2 true JPH0473620B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) 1992-11-24

Family

ID=11789755

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1187085A Granted JPS61171145A (ja) 1985-01-25 1985-01-25 半導体装置の検査方法

Country Status (1)

Country Link
JP (1) JPS61171145A (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63261727A (ja) * 1987-04-20 1988-10-28 Tokyo Electron Ltd 板状体の面歪み補正方法
US6337218B1 (en) 1999-05-28 2002-01-08 International Business Machines Corporation Method to test devices on high performance ULSI wafers

Also Published As

Publication number Publication date
JPS61171145A (ja) 1986-08-01

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Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees