JPH0470591B2 - - Google Patents

Info

Publication number
JPH0470591B2
JPH0470591B2 JP61315400A JP31540086A JPH0470591B2 JP H0470591 B2 JPH0470591 B2 JP H0470591B2 JP 61315400 A JP61315400 A JP 61315400A JP 31540086 A JP31540086 A JP 31540086A JP H0470591 B2 JPH0470591 B2 JP H0470591B2
Authority
JP
Japan
Prior art keywords
voltage
signal
relays
relay
signal line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP61315400A
Other languages
English (en)
Japanese (ja)
Other versions
JPS63167281A (ja
Inventor
Fumio Tokukasa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hioki EE Corp
Original Assignee
Hioki EE Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hioki EE Corp filed Critical Hioki EE Corp
Priority to JP61315400A priority Critical patent/JPS63167281A/ja
Publication of JPS63167281A publication Critical patent/JPS63167281A/ja
Publication of JPH0470591B2 publication Critical patent/JPH0470591B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
JP61315400A 1986-12-27 1986-12-27 回路基板検査装置におけるコンタクトピンのリレ−良否判定方法 Granted JPS63167281A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61315400A JPS63167281A (ja) 1986-12-27 1986-12-27 回路基板検査装置におけるコンタクトピンのリレ−良否判定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61315400A JPS63167281A (ja) 1986-12-27 1986-12-27 回路基板検査装置におけるコンタクトピンのリレ−良否判定方法

Publications (2)

Publication Number Publication Date
JPS63167281A JPS63167281A (ja) 1988-07-11
JPH0470591B2 true JPH0470591B2 (enrdf_load_stackoverflow) 1992-11-11

Family

ID=18064935

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61315400A Granted JPS63167281A (ja) 1986-12-27 1986-12-27 回路基板検査装置におけるコンタクトピンのリレ−良否判定方法

Country Status (1)

Country Link
JP (1) JPS63167281A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5101339B2 (ja) * 2008-02-29 2012-12-19 日置電機株式会社 検査装置

Also Published As

Publication number Publication date
JPS63167281A (ja) 1988-07-11

Similar Documents

Publication Publication Date Title
JPH0470591B2 (enrdf_load_stackoverflow)
JP3073806B2 (ja) デジタルマルチメータ
US4931742A (en) Self-protecting power bus testing system
JPH10153634A (ja) スピーカ出力自己診断装置
JPH045576A (ja) 接触抵抗の試験装置
JP3241777B2 (ja) インサーキットテスタ用オープンテスト装置
JP3353288B2 (ja) Ｌｓｉ試験装置
JPH0915310A (ja) 電源装置
JP3495545B2 (ja) 溶存酸素またはｐＨを測定する装置
JPS59200934A (ja) 測温抵抗体計測方式
JPS60120225A (ja) 電子秤
JP2950470B2 (ja) 検電器
JPH09211042A (ja) ４線式抵抗測定方法および装置
JPS58201075A (ja) トランスフアリ−ドスイツチの特性測定回路
JPS6378695A (ja) 回線接続装置
JPH0453461B2 (enrdf_load_stackoverflow)
CN119986349A (zh) 一种继电器的故障检测电路及故障检测方法
JPH1078470A (ja) ブリッジ出力段に接続されるインピーダンスの検査方法及び装置
JPH0620143Y2 (ja) 検査回路
JPS61178674A (ja) 半導体検査装置の自己診断回路
JPH05244222A (ja) モデム入力信号のレベル判定装置
JPH03229171A (ja) 半導体装置の試験装置
JPH04158273A (ja) カーボン接点型スイッチの検査装置
JPS6222083A (ja) Ｉｃテスタ用電源
JP2000304805A (ja) 半導体試験装置におけるコンパレータ回路

Legal Events

Date Code Title Description
R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees