JPH046882B2 - - Google Patents
Info
- Publication number
- JPH046882B2 JPH046882B2 JP57103849A JP10384982A JPH046882B2 JP H046882 B2 JPH046882 B2 JP H046882B2 JP 57103849 A JP57103849 A JP 57103849A JP 10384982 A JP10384982 A JP 10384982A JP H046882 B2 JPH046882 B2 JP H046882B2
- Authority
- JP
- Japan
- Prior art keywords
- light
- interference fringes
- measured
- separated
- wavelength
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/2441—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using interferometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10384982A JPS58221104A (ja) | 1982-06-18 | 1982-06-18 | 表面形状測定方法および装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10384982A JPS58221104A (ja) | 1982-06-18 | 1982-06-18 | 表面形状測定方法および装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58221104A JPS58221104A (ja) | 1983-12-22 |
JPH046882B2 true JPH046882B2 (enrdf_load_stackoverflow) | 1992-02-07 |
Family
ID=14364881
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10384982A Granted JPS58221104A (ja) | 1982-06-18 | 1982-06-18 | 表面形状測定方法および装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58221104A (enrdf_load_stackoverflow) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62135708A (ja) * | 1985-12-10 | 1987-06-18 | Yokogawa Electric Corp | 3次元形状測定装置 |
JPS62204106A (ja) * | 1986-03-05 | 1987-09-08 | Yokogawa Electric Corp | 3次元形状測定装置 |
JPS6325503A (ja) * | 1986-07-17 | 1988-02-03 | Ee D S:Kk | 表面粗さ計 |
JPS6325502A (ja) * | 1986-07-17 | 1988-02-03 | Ee D S:Kk | 表面粗さ計 |
GB2242976A (en) * | 1990-04-12 | 1991-10-16 | Rank Taylor Hobson Ltd | Measuring surface characteristics |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5533001B2 (enrdf_load_stackoverflow) * | 1972-09-20 | 1980-08-28 | ||
JPS56128407A (en) * | 1980-03-07 | 1981-10-07 | Hitachi Ltd | Light interference device |
-
1982
- 1982-06-18 JP JP10384982A patent/JPS58221104A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58221104A (ja) | 1983-12-22 |
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