JPH0429421Y2 - - Google Patents

Info

Publication number
JPH0429421Y2
JPH0429421Y2 JP14271986U JP14271986U JPH0429421Y2 JP H0429421 Y2 JPH0429421 Y2 JP H0429421Y2 JP 14271986 U JP14271986 U JP 14271986U JP 14271986 U JP14271986 U JP 14271986U JP H0429421 Y2 JPH0429421 Y2 JP H0429421Y2
Authority
JP
Japan
Prior art keywords
lead
component
terminal
dummy
side frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP14271986U
Other languages
English (en)
Japanese (ja)
Other versions
JPS6350074U (ko
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP14271986U priority Critical patent/JPH0429421Y2/ja
Publication of JPS6350074U publication Critical patent/JPS6350074U/ja
Application granted granted Critical
Publication of JPH0429421Y2 publication Critical patent/JPH0429421Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP14271986U 1986-09-19 1986-09-19 Expired JPH0429421Y2 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP14271986U JPH0429421Y2 (ko) 1986-09-19 1986-09-19

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP14271986U JPH0429421Y2 (ko) 1986-09-19 1986-09-19

Publications (2)

Publication Number Publication Date
JPS6350074U JPS6350074U (ko) 1988-04-05
JPH0429421Y2 true JPH0429421Y2 (ko) 1992-07-16

Family

ID=31051711

Family Applications (1)

Application Number Title Priority Date Filing Date
JP14271986U Expired JPH0429421Y2 (ko) 1986-09-19 1986-09-19

Country Status (1)

Country Link
JP (1) JPH0429421Y2 (ko)

Also Published As

Publication number Publication date
JPS6350074U (ko) 1988-04-05

Similar Documents

Publication Publication Date Title
JPH0429421Y2 (ko)
JP4757695B2 (ja) 検査用チップ型電子部品及び実装状態検査方法
KR950024290A (ko) 반도체 칩에서 연소과정 실행방법
JPH08227826A (ja) 積層セラミックコンデンサのスクリーニング方法
JPH06169033A (ja) 半導体チップの実装方法
JPH0240931A (ja) 混成集積回路装置の製造方法
JPH0436108Y2 (ko)
JPH0545050B2 (ko)
JP2002280693A (ja) 電子部品の実装方法
JPH0626175B2 (ja) ヒューズ付きチップ状固体電解コンデンサおよび製造方法
JP2976469B2 (ja) 電子装置の検査方法
JPH09113567A (ja) プリント基板のパターンショート・オープン検査装置
JPS6159657B2 (ko)
JPS6241246Y2 (ko)
JP3002137U (ja) チップコンデンサ容量抜け判定工具
JPH0232613Y2 (ko)
JPH0351968Y2 (ko)
JPH04166772A (ja) 電圧印加試験用治具
JPS6218042Y2 (ko)
JPH1073634A (ja) Icソケット及びicソケットを用いたicのテスト方 法
JPH11214568A (ja) 半導体装置及びその製造方法
JPH02223178A (ja) 半導体装置用ソケット
JPH04361549A (ja) 半導体装置の絶縁耐圧検査方法
JPH02210887A (ja) 磁気抵抗効果素子
JPH02266275A (ja) 半導体装置の検査方法およびそれに用いられるテープペア