JPH0421881U - - Google Patents
Info
- Publication number
- JPH0421881U JPH0421881U JP6079990U JP6079990U JPH0421881U JP H0421881 U JPH0421881 U JP H0421881U JP 6079990 U JP6079990 U JP 6079990U JP 6079990 U JP6079990 U JP 6079990U JP H0421881 U JPH0421881 U JP H0421881U
- Authority
- JP
- Japan
- Prior art keywords
- performance board
- pin card
- motherboard
- board
- socket
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000003780 insertion Methods 0.000 claims description 5
- 238000012360 testing method Methods 0.000 claims 4
- 230000037431 insertion Effects 0.000 description 1
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1990060799U JP2537892Y2 (ja) | 1990-06-08 | 1990-06-08 | Ic試験装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1990060799U JP2537892Y2 (ja) | 1990-06-08 | 1990-06-08 | Ic試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0421881U true JPH0421881U (fr) | 1992-02-24 |
JP2537892Y2 JP2537892Y2 (ja) | 1997-06-04 |
Family
ID=31588481
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1990060799U Expired - Lifetime JP2537892Y2 (ja) | 1990-06-08 | 1990-06-08 | Ic試験装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2537892Y2 (fr) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999042851A1 (fr) * | 1998-02-20 | 1999-08-26 | Advantest Corporation | Structure d'interface de dispositif de test |
JP2003503712A (ja) * | 1999-06-28 | 2003-01-28 | テラダイン・インコーポレーテッド | 半導体並列テスタ |
JP2007078675A (ja) * | 2005-09-15 | 2007-03-29 | Agilent Technol Inc | プローブアセンブリおよびこれを利用した装置 |
WO2008062579A1 (fr) * | 2006-11-22 | 2008-05-29 | Panasonic Corporation | Appareil d'inspection de semi-conducteur |
WO2010052761A1 (fr) * | 2008-11-04 | 2010-05-14 | 株式会社アドバンテスト | Dispositif de fixation/retrait de connecteur et tête d’essai |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5960269A (ja) * | 1982-09-29 | 1984-04-06 | Nec Corp | 汎用フイクスチヤ− |
JPS62120289U (fr) * | 1986-01-22 | 1987-07-30 | ||
JPS63153481A (ja) * | 1986-12-18 | 1988-06-25 | Asia Electron Kk | 集積回路測定用接続装置 |
-
1990
- 1990-06-08 JP JP1990060799U patent/JP2537892Y2/ja not_active Expired - Lifetime
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5960269A (ja) * | 1982-09-29 | 1984-04-06 | Nec Corp | 汎用フイクスチヤ− |
JPS62120289U (fr) * | 1986-01-22 | 1987-07-30 | ||
JPS63153481A (ja) * | 1986-12-18 | 1988-06-25 | Asia Electron Kk | 集積回路測定用接続装置 |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1999042851A1 (fr) * | 1998-02-20 | 1999-08-26 | Advantest Corporation | Structure d'interface de dispositif de test |
JP2003503712A (ja) * | 1999-06-28 | 2003-01-28 | テラダイン・インコーポレーテッド | 半導体並列テスタ |
JP2007078675A (ja) * | 2005-09-15 | 2007-03-29 | Agilent Technol Inc | プローブアセンブリおよびこれを利用した装置 |
WO2008062579A1 (fr) * | 2006-11-22 | 2008-05-29 | Panasonic Corporation | Appareil d'inspection de semi-conducteur |
WO2010052761A1 (fr) * | 2008-11-04 | 2010-05-14 | 株式会社アドバンテスト | Dispositif de fixation/retrait de connecteur et tête d’essai |
JP5161975B2 (ja) * | 2008-11-04 | 2013-03-13 | 株式会社アドバンテスト | コネクタ着脱装置およびテストヘッド |
Also Published As
Publication number | Publication date |
---|---|
JP2537892Y2 (ja) | 1997-06-04 |
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