JPH0421881U - - Google Patents

Info

Publication number
JPH0421881U
JPH0421881U JP6079990U JP6079990U JPH0421881U JP H0421881 U JPH0421881 U JP H0421881U JP 6079990 U JP6079990 U JP 6079990U JP 6079990 U JP6079990 U JP 6079990U JP H0421881 U JPH0421881 U JP H0421881U
Authority
JP
Japan
Prior art keywords
performance board
pin card
motherboard
board
socket
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP6079990U
Other languages
Japanese (ja)
Other versions
JP2537892Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1990060799U priority Critical patent/JP2537892Y2/en
Publication of JPH0421881U publication Critical patent/JPH0421881U/ja
Application granted granted Critical
Publication of JP2537892Y2 publication Critical patent/JP2537892Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの考案の一実施例を示す側面図、第
２図はゼロインサーシヨンフオース型コネクタの
一例を示す一部を切欠いた斜視図、第３図はゼロ
インサーシヨンフオース型コネクタの一例を説明
するための断面図、第４図はゼロインサーシヨン
フオース型コネコタの操作板の駆動機構の一例を
示す平面図、第５図は従来の技術を説明するため
の側面図、第６図は従来用いられている接触子の
構造を説明するための斜視図である。 １００……パフオーマンスボード、１０１……
ＩＣソケツト、２００……マザーボード、３００
……ピンカード、４００……ゼロインサーシヨン
フオース型コネクタ。 Fig. 1 is a side view showing an embodiment of this invention, Fig. 2 is a partially cutaway perspective view showing an example of a zero-insertion force connector, and Fig. 3 is a side view of an example of a zero-insertion force connector. FIG. 4 is a plan view showing an example of the driving mechanism of the operation plate of the zero-insertion force connector; FIG. 5 is a side view showing the conventional technology; FIG. The figure is a perspective view for explaining the structure of a conventionally used contactor. 100... Performance board, 101...
IC socket, 200...Motherboard, 300
...Pin card, 400...Zero insertion force type connector.

Claims (1)

【実用新案登録請求の範囲】 Ａ 被試験ＩＣ用ソケツトが実装され、この被試
験ＩＣ用ソケツトの各一つの端子から各種の試験
回路に接続するための複数の端子を導出するパフ
オーマンスボードと、パフオーマンスボードに導
出された各端子に接続する電気回路が実装された
ピンカードと、このピンカードと上記パフオーマ
ンスボードとの間に介在し、パフオーマンスボー
ドとピンカードとの間を電気的に接続するマザー
ボードと、 を具備して成るＩＣ試験装置において、 Ｂ 上記マザーボードとパフオーマンスボードと
の間およびマザーボードとピンカードとの間をゼ
ロインサーシヨンフオース型コネクタによつて接
続および切離しを行う構造としたＩＣ試験装置。[Scope of Claim for Utility Model Registration] A. A performance board on which a socket for an IC under test is mounted and a plurality of terminals for connecting to various test circuits are derived from each terminal of the socket for the IC under test, and a performance board. A pin card mounted with an electric circuit connected to each terminal led out on the board, and a motherboard interposed between the pin card and the performance board and electrically connecting the performance board and the pin card. , B. An IC testing device having a structure in which the motherboard and the performance board and the motherboard and the pin card are connected and disconnected by a zero-insertion force connector. .
JP1990060799U 1990-06-08 1990-06-08 IC test equipment Expired - Lifetime JP2537892Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1990060799U JP2537892Y2 (en) 1990-06-08 1990-06-08 IC test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1990060799U JP2537892Y2 (en) 1990-06-08 1990-06-08 IC test equipment

Publications (2)

Publication Number Publication Date
JPH0421881U true JPH0421881U (en) 1992-02-24
JP2537892Y2 JP2537892Y2 (en) 1997-06-04

Family

ID=31588481

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1990060799U Expired - Lifetime JP2537892Y2 (en) 1990-06-08 1990-06-08 IC test equipment

Country Status (1)

Country Link
JP (1) JP2537892Y2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999042851A1 (en) * 1998-02-20 1999-08-26 Advantest Corporation Structure of test fixture interface
JP2003503712A (en) * 1999-06-28 2003-01-28 テラダイン・インコーポレーテッド Semiconductor parallel tester
JP2007078675A (en) * 2005-09-15 2007-03-29 Agilent Technol Inc Probe assembly and device using same
WO2008062579A1 (en) * 2006-11-22 2008-05-29 Panasonic Corporation Semiconductor inspection equipment
WO2010052761A1 (en) * 2008-11-04 2010-05-14 株式会社アドバンテスト Connector attaching/detaching device and test head

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5960269A (en) * 1982-09-29 1984-04-06 Nec Corp Universal fixture
JPS62120289U (en) * 1986-01-22 1987-07-30
JPS63153481A (en) * 1986-12-18 1988-06-25 Asia Electron Kk Connecting device for measuring integrated circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5960269A (en) * 1982-09-29 1984-04-06 Nec Corp Universal fixture
JPS62120289U (en) * 1986-01-22 1987-07-30
JPS63153481A (en) * 1986-12-18 1988-06-25 Asia Electron Kk Connecting device for measuring integrated circuit

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999042851A1 (en) * 1998-02-20 1999-08-26 Advantest Corporation Structure of test fixture interface
JP2003503712A (en) * 1999-06-28 2003-01-28 テラダイン・インコーポレーテッド Semiconductor parallel tester
JP2007078675A (en) * 2005-09-15 2007-03-29 Agilent Technol Inc Probe assembly and device using same
WO2008062579A1 (en) * 2006-11-22 2008-05-29 Panasonic Corporation Semiconductor inspection equipment
WO2010052761A1 (en) * 2008-11-04 2010-05-14 株式会社アドバンテスト Connector attaching/detaching device and test head
JP5161975B2 (en) * 2008-11-04 2013-03-13 株式会社アドバンテスト Connector attaching / detaching device and test head

Also Published As

Publication number Publication date
JP2537892Y2 (en) 1997-06-04

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