JPS598172U - Terminal connection device for electronic component testing equipment - Google Patents
Terminal connection device for electronic component testing equipmentInfo
- Publication number
- JPS598172U JPS598172U JP10483382U JP10483382U JPS598172U JP S598172 U JPS598172 U JP S598172U JP 10483382 U JP10483382 U JP 10483382U JP 10483382 U JP10483382 U JP 10483382U JP S598172 U JPS598172 U JP S598172U
- Authority
- JP
- Japan
- Prior art keywords
- electronic component
- connection device
- terminal connection
- testing equipment
- component testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は電子部品試験装置の一例を示す外観斜視図、第
２図は電子部品の一種であるＩＣ素子を示す斜視図、第
３図Ａは従来の端子接続装置を示す断面図、第３図Ｂは
第３図Ａの等価回路図、第４図Ａはこの考案の一実施例
を示す断面図、第４図Ｂは第４図Ａの等価回路図、第５
図はこの考案の一応用例を示す断面図、第６図は第５図
に示した応用例を説明するための斜視図である。
７ａ、 ７ｂ：被試験電子部品の端子ピン、１５ａ。FIG. 1 is an external perspective view showing an example of an electronic component testing device, FIG. 2 is a perspective view showing an IC element, which is a type of electronic component, FIG. 3A is a sectional view showing a conventional terminal connection device, and FIG. Figure B is an equivalent circuit diagram of Figure 3A, Figure 4A is a sectional view showing an embodiment of this invention, Figure 4B is an equivalent circuit diagram of Figure 4A, Figure 5
The figure is a sectional view showing an example of application of this invention, and FIG. 6 is a perspective view for explaining the example of application shown in FIG. 7a, 7b: Terminal pins of the electronic component under test, 15a.
Claims (1)
の動作を試験する電子部品試験装置において、コンデン
サを取付けるための導体板と、該導体板と上記可動接片
とを電気的に接続させるための接触子とを有することを
特徴とする電子部品の端子接続装置。In an electronic component testing device that tests the operation of the electronic component by bringing a movable contact piece into contact with and separating from the terminal pin of the electronic component, a conductor plate for attaching a capacitor and the conductor plate and the movable contact piece are electrically connected. 1. A terminal connection device for an electronic component, comprising a contactor for connecting the terminal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10483382U JPS598172U (en) | 1982-07-09 | 1982-07-09 | Terminal connection device for electronic component testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10483382U JPS598172U (en) | 1982-07-09 | 1982-07-09 | Terminal connection device for electronic component testing equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS598172U true JPS598172U (en) | 1984-01-19 |
| JPS6319815Y2 JPS6319815Y2 (en) | 1988-06-02 |
Family
ID=30245986
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10483382U Granted JPS598172U (en) | 1982-07-09 | 1982-07-09 | Terminal connection device for electronic component testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS598172U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5893339A (en) * | 1981-11-27 | 1983-06-03 | デイマ−ク・コ−ポレイシヨン | Interface assembly for testing integrated circuit device |
-
1982
- 1982-07-09 JP JP10483382U patent/JPS598172U/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5893339A (en) * | 1981-11-27 | 1983-06-03 | デイマ−ク・コ−ポレイシヨン | Interface assembly for testing integrated circuit device |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS6319815Y2 (en) | 1988-06-02 |
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