JPS59154677U - Semiconductor device testing equipment - Google Patents
Semiconductor device testing equipmentInfo
- Publication number
- JPS59154677U JPS59154677U JP4879583U JP4879583U JPS59154677U JP S59154677 U JPS59154677 U JP S59154677U JP 4879583 U JP4879583 U JP 4879583U JP 4879583 U JP4879583 U JP 4879583U JP S59154677 U JPS59154677 U JP S59154677U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- testing equipment
- device testing
- contacts
- external lead
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の半導体装置試験装置の一例を示す回路図
、第２図及び第３図は本考案の二実施例を示す回路図で
ある。
２・・・・・・半導体装置、３・・・・・・外部リード
部材、４゜４ａ、 ４ａ’ 、 ４ｂ、 ４ｂ’
、 ４ｃ、 ４ｃ’ 、 ４ｄ。
４ｄ’・・・・・・接触子、８・・・・・・測定回路、
９・・・・・・測定電源、１２・・・・・・測定回路、
１３・・・・・・測定電源。FIG. 1 is a circuit diagram showing an example of a conventional semiconductor device testing apparatus, and FIGS. 2 and 3 are circuit diagrams showing two embodiments of the present invention. 2...Semiconductor device, 3...External lead member, 4゜4a, 4a', 4b, 4b'
, 4c, 4c', 4d. 4d'...contact, 8...measuring circuit,
9...Measurement power supply, 12...Measurement circuit,
13...Measurement power supply.
Claims (1)
接触子を電気的に接触させて特性測定を行う前に外部リ
ード部材と接触子間の電気的接触状態の良否を判定する
装置であって、前記複数組の接触子を並列的又は独立的
に接続する導通測定回路を具えたことを特徴とする半導
体装置の試験装置。A device that determines the quality of electrical contact between an external lead member and a contact before measuring characteristics by electrically contacting a set of two contacts to each of a plurality of external lead members of a semiconductor device. A test apparatus for a semiconductor device, comprising a continuity measuring circuit for connecting the plurality of sets of contacts in parallel or independently.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4879583U JPS59154677U (en) | 1983-03-31 | 1983-03-31 | Semiconductor device testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4879583U JPS59154677U (en) | 1983-03-31 | 1983-03-31 | Semiconductor device testing equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59154677U true JPS59154677U (en) | 1984-10-17 |
Family
ID=30179317
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4879583U Pending JPS59154677U (en) | 1983-03-31 | 1983-03-31 | Semiconductor device testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59154677U (en) |
-
1983
- 1983-03-31 JP JP4879583U patent/JPS59154677U/en active Pending
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