JPS6035537U - Electronic component measuring device - Google Patents
Electronic component measuring deviceInfo
- Publication number
- JPS6035537U JPS6035537U JP12766783U JP12766783U JPS6035537U JP S6035537 U JPS6035537 U JP S6035537U JP 12766783 U JP12766783 U JP 12766783U JP 12766783 U JP12766783 U JP 12766783U JP S6035537 U JPS6035537 U JP S6035537U
- Authority
- JP
- Japan
- Prior art keywords
- belt
- electronic component
- measuring device
- electrically connected
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図乃至第3図は従来の測定装置の一例を示し、第1
図は一部断面側面図、第2図は第1図の要部拡大正面図
、第3図は第1図の拡大側面図である。第4図乃至第6
図は、本考案に係る電子部品の測定装置を示し、第4図
は側面断面図、第5図は第4図の拡大側面図、第6図は
部分平面図である。
A・・・部品本体、B・・・リード、C・・・電子部品
、20.20・・・第1ベルト、21,21・・・第2
ベルト、26・・・測子、29・・・導電体。
、 z/
入
tt 、z7zi −z。
J1 to 3 show an example of a conventional measuring device.
2 is an enlarged front view of the main part of FIG. 1, and FIG. 3 is an enlarged side view of FIG. 1. Figures 4 to 6
The figures show an electronic component measuring device according to the present invention, in which FIG. 4 is a side sectional view, FIG. 5 is an enlarged side view of FIG. 4, and FIG. 6 is a partial plan view. A... Part body, B... Lead, C... Electronic component, 20.20... First belt, 21, 21... Second
Belt, 26... probe, 29... conductor. , z/ entertt , z7zi -z. J
Claims (1)
向に複数の半導体を形成し、各測子と各導電体とをそれ
ぞれ電気的に接続した無端状の第1ベルトと、第1ベル
トの外周面の一部と対向し対向し対向面が第1ベルトと
同期して同一方向に移動する無端状の第2ベルトと、導
電体を介し測子に電気的に接続された測定装置とを含み
、上記−第1ベルトと第2ベルトとの間に電子部品の各
リードを、測子に電気的に接続されるように支持し、電
子部品の電気的特性の測定を行うようにしたことを特徴
とする電子部品の測定装置。an endless first belt in which probes are arranged at regular intervals in the circumferential direction of an outer peripheral surface, a plurality of semiconductors are formed in the circumferential direction, and each probe and each conductor are electrically connected; an endless second belt that faces a part of the outer peripheral surface of the belt and whose opposing surface moves in the same direction in synchronization with the first belt; and a measuring device electrically connected to the probe via a conductor. - supporting each lead of the electronic component between the first belt and the second belt so as to be electrically connected to the probe, and measuring the electrical characteristics of the electronic component; An electronic component measuring device characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12766783U JPS6035537U (en) | 1983-08-16 | 1983-08-16 | Electronic component measuring device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12766783U JPS6035537U (en) | 1983-08-16 | 1983-08-16 | Electronic component measuring device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6035537U true JPS6035537U (en) | 1985-03-11 |
JPS6320119Y2 JPS6320119Y2 (en) | 1988-06-03 |
Family
ID=30289879
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12766783U Granted JPS6035537U (en) | 1983-08-16 | 1983-08-16 | Electronic component measuring device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6035537U (en) |
-
1983
- 1983-08-16 JP JP12766783U patent/JPS6035537U/en active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS6320119Y2 (en) | 1988-06-03 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JPS6035537U (en) | Electronic component measuring device | |
JPS607078U (en) | General purpose fixture for insert tester | |
JPS59184805U (en) | Heart rate measuring device with belt | |
JPS5997469U (en) | Semiconductor chip measurement probe | |
JPS59108605U (en) | Ultrasonic tomography device probe | |
JPS59154677U (en) | Semiconductor device testing equipment | |
JPS5832367U (en) | measurement cable | |
JPS60139276U (en) | probe card | |
JPS5866362U (en) | probe unit | |
JPS59149608U (en) | potentiometer | |
JPS59120485U (en) | Electronic component measuring device | |
JPS6134484U (en) | Characteristic measuring device for electronic components | |
JPS58182180U (en) | Measurement attachment for electronic wristwatch with heart rate monitor | |
JPS6367278U (en) | ||
JPS6018555U (en) | semiconductor equipment | |
JPS61164037U (en) | ||
JPS58127369U (en) | Measuring device for PNP transistor | |
JPS62163764U (en) | ||
JPS6119779U (en) | Probe for development support machine | |
JPS60141570U (en) | Contact inspection jig | |
JPS60183442U (en) | Integrated circuit measurement jig | |
JPS5813679U (en) | Contact structure of electronic components with case | |
JPS6098273U (en) | Structure of a test machine with a connector that can be easily connected to the screw terminal of the terminal block inside the electrical wiring box for railway vehicles | |
JPS5824898U (en) | shield probe | |
JPS58125880U (en) | Semiconductor device measurement jig |