JPS5866362U - probe unit - Google Patents

probe unit

Info

Publication number
JPS5866362U
JPS5866362U JP16216181U JP16216181U JPS5866362U JP S5866362 U JPS5866362 U JP S5866362U JP 16216181 U JP16216181 U JP 16216181U JP 16216181 U JP16216181 U JP 16216181U JP S5866362 U JPS5866362 U JP S5866362U
Authority
JP
Japan
Prior art keywords
probe unit
probes
reciprocating motion
types
unit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP16216181U
Other languages
Japanese (ja)
Inventor
興一 佐藤
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP16216181U priority Critical patent/JPS5866362U/en
Publication of JPS5866362U publication Critical patent/JPS5866362U/en
Pending legal-status Critical Current

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  • Measuring Leads Or Probes (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は被検査物の一例の斜視図、第2図は本考案の一
実施例の斜視図、第3図a ” eは第2図に示す一実
施例の使用方法を説明するための側面図である。 10・・・・・・電子部品、11・・・・・・表面、1
2・・・・・・リードパターン、13・・・・・・端子
、21・・・・・・先端部、22・・・・・・第1接触
子、23・・・・・・第1プローブ、24・・・・・・
先端部、25・・・・・・第2接触子、26・・・・・
・第2プローブ、27・・・・・・ブローブホールダ。
Figure 1 is a perspective view of an example of an object to be inspected, Figure 2 is a perspective view of an embodiment of the present invention, and Figures 3a and 3e are diagrams for explaining how to use the embodiment shown in Figure 2. It is a side view. 10... Electronic component, 11... Surface, 1
2... Lead pattern, 13... Terminal, 21... Tip, 22... First contact, 23... First Probe, 24...
Tip part, 25...Second contact, 26...
-Second probe, 27... Probe holder.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 先端部に一定寸法の往復運動を行なう接触子を保持した
プローブを、前記往復運動の距離を相異ならせて構成し
た複数種類用意し、これらプローブの複数種類複数本を
被検査物である電気部品または電子部品の端子配列に整
合させてブローブホールダに埋設したことを特徴とする
7uo−ブユニット。
A plurality of types of probes each having a contact element that performs a reciprocating motion of a certain size at the tip and configured with different distances of the reciprocating motion are prepared, and multiple types of these probes are used to connect the electrical component to be inspected. Alternatively, a 7UO-bu unit is embedded in a probe holder in accordance with the terminal arrangement of an electronic component.
JP16216181U 1981-10-29 1981-10-29 probe unit Pending JPS5866362U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16216181U JPS5866362U (en) 1981-10-29 1981-10-29 probe unit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16216181U JPS5866362U (en) 1981-10-29 1981-10-29 probe unit

Publications (1)

Publication Number Publication Date
JPS5866362U true JPS5866362U (en) 1983-05-06

Family

ID=29954494

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16216181U Pending JPS5866362U (en) 1981-10-29 1981-10-29 probe unit

Country Status (1)

Country Link
JP (1) JPS5866362U (en)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5127166B2 (en) * 1971-10-29 1976-08-11

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5127166B2 (en) * 1971-10-29 1976-08-11

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