JPS6134484U - Characteristic measuring device for electronic components - Google Patents

Characteristic measuring device for electronic components

Info

Publication number
JPS6134484U
JPS6134484U JP11866584U JP11866584U JPS6134484U JP S6134484 U JPS6134484 U JP S6134484U JP 11866584 U JP11866584 U JP 11866584U JP 11866584 U JP11866584 U JP 11866584U JP S6134484 U JPS6134484 U JP S6134484U
Authority
JP
Japan
Prior art keywords
measuring device
electronic components
characteristic measuring
electronic component
probe
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11866584U
Other languages
Japanese (ja)
Inventor
政幸 金巻
伸幸 田中
Original Assignee
関西日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 関西日本電気株式会社 filed Critical 関西日本電気株式会社
Priority to JP11866584U priority Critical patent/JPS6134484U/en
Publication of JPS6134484U publication Critical patent/JPS6134484U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図乃至第３図は本考案の一実施例を示すもので、第
１図は側断面図、第２図は第１図Ｃ−Ｃ面図、第３図は
第２図Ｄ−Ｄ面図、第４図は本考案の他の実施例を示す
断面図、第５図は加振装置の他の取付例を示す断面図、
第６図は電子部品の一例を示す一部透視平面図、第７図
乃至第９図は従来の測定装置の一例を示すもので、第７
図は側断面図、第８図は第７図Ａ−Ａ面図、第９図は第
８１ｆｆｌＢ−Ｂ面図、第１０図は測子の接続例を示す
回路図である。 １６・・・電子部品、９・・・測子、１１・・・測定装
置、１５・・・加振装置。1 to 3 show an embodiment of the present invention, in which FIG. 1 is a side sectional view, FIG. 2 is a cross-sectional view taken along the line C-C in FIG. 1, and FIG. 4 is a sectional view showing another embodiment of the present invention, and FIG. 5 is a sectional view showing another example of mounting the vibration device,
FIG. 6 is a partially transparent plan view showing an example of an electronic component, and FIGS. 7 to 9 show an example of a conventional measuring device.
8 is a side sectional view of FIG. 7, FIG. 9 is a view of 81fflB-B, and FIG. 10 is a circuit diagram showing an example of connection of probes. 16... Electronic component, 9... Probe, 11... Measuring device, 15... Vibrating device.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電子部品の電極に測子を介して測定装置を接続し電子部
品の特性を測定するものにおいて、上記測子に加振装置
を付加したことを特徴とする電子部品の特性測定装置。What is claimed is: 1. A characteristic measuring device for electronic components, characterized in that a measuring device is connected to an electrode of an electronic component via a probe to measure the characteristics of the electronic component, the device being characterized in that an excitation device is added to the probe.
JP11866584U 1984-07-31 1984-07-31 Characteristic measuring device for electronic components Pending JPS6134484U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11866584U JPS6134484U (en) 1984-07-31 1984-07-31 Characteristic measuring device for electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11866584U JPS6134484U (en) 1984-07-31 1984-07-31 Characteristic measuring device for electronic components

Publications (1)

Publication Number Publication Date
JPS6134484U true JPS6134484U (en) 1986-03-03

Family

ID=30677545

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11866584U Pending JPS6134484U (en) 1984-07-31 1984-07-31 Characteristic measuring device for electronic components

Country Status (1)

Country Link
JP (1) JPS6134484U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016206118A (en) * 2015-04-28 2016-12-08 三菱電機株式会社 Semiconductor inspection tool

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016206118A (en) * 2015-04-28 2016-12-08 三菱電機株式会社 Semiconductor inspection tool

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