JPS60111282U - Electrical property measuring device for electronic components - Google Patents
Electrical property measuring device for electronic componentsInfo
- Publication number
- JPS60111282U JPS60111282U JP20120083U JP20120083U JPS60111282U JP S60111282 U JPS60111282 U JP S60111282U JP 20120083 U JP20120083 U JP 20120083U JP 20120083 U JP20120083 U JP 20120083U JP S60111282 U JPS60111282 U JP S60111282U
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- electronic components
- measuring device
- electrical property
- property measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は従来の測子を示す側面図、第2図は第1図測子
を用いた測定結果を示すグラフ、第3図は本考案による
測定装置に用いる測子の側面図、第4図は本考案による
測定装置の接続図、第5図は従来の測定装置の接続等価
回置、第6図は本考案による測定装置の接続等価回路を
示す。
1・・・・・・電子部品、1a・・・・・・電子部品本
体、2’、2d・・・・・・接地リード、44・・・・
・・測子、4a・・・・・・信号系接触子、4b・・・
・・・電源系接触子。
第3図
第4図Fig. 1 is a side view showing a conventional probe, Fig. 2 is a graph showing measurement results using the probe in Fig. 1, Fig. 3 is a side view of the probe used in the measuring device according to the present invention, and Fig. 4 is a graph showing measurement results using the probe in Fig. 1. The figure shows a connection diagram of a measuring device according to the present invention, FIG. 5 shows an equivalent connection circuit of a conventional measuring device, and FIG. 6 shows a connection equivalent circuit of a measuring device according to the present invention. 1...Electronic component, 1a...Electronic component body, 2', 2d...Ground lead, 44...
...Sensor, 4a...Signal system contact, 4b...
...Power system contact. Figure 3 Figure 4
Claims (1)
を有する能動素子を含む電子部品本体の各電極よりリー
ドを導出した電子部品を測子を介して電気的特性を測定
するものにおいて、上記接地電極に接続されたリードに
接触する測子は信号系接触子と電源系接触子に分離され
ていることを特徴とする電子部品の電気的特性測定装置
。The above-mentioned grounding method is used to measure the electrical characteristics of an electronic component whose leads are derived from each electrode of the electronic component body through a probe, including an active element having at least a signal system input/output electrode, a power supply electrode, and a ground electrode. An apparatus for measuring electrical characteristics of electronic components, characterized in that a probe that contacts a lead connected to an electrode is separated into a signal system contact and a power supply system contact.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20120083U JPS60111282U (en) | 1983-12-29 | 1983-12-29 | Electrical property measuring device for electronic components |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20120083U JPS60111282U (en) | 1983-12-29 | 1983-12-29 | Electrical property measuring device for electronic components |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60111282U true JPS60111282U (en) | 1985-07-27 |
Family
ID=30762762
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20120083U Pending JPS60111282U (en) | 1983-12-29 | 1983-12-29 | Electrical property measuring device for electronic components |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60111282U (en) |
-
1983
- 1983-12-29 JP JP20120083U patent/JPS60111282U/en active Pending
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