JPS61158881U - - Google Patents
Info
- Publication number
- JPS61158881U JPS61158881U JP4152785U JP4152785U JPS61158881U JP S61158881 U JPS61158881 U JP S61158881U JP 4152785 U JP4152785 U JP 4152785U JP 4152785 U JP4152785 U JP 4152785U JP S61158881 U JPS61158881 U JP S61158881U
- Authority
- JP
- Japan
- Prior art keywords
- contact
- electronic components
- measuring
- terminals
- terminal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 4
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Description
第1図は本考案の一実施例に係るICの測定具
とICの測定装置を接続する状態を示す正面図、
第2図はIC端子に対し対応する接触子を接続す
る状態を示す斜視図、第3図は第1図の―線
に沿う断面図、第4図は第1図の―線に沿う
断面図、第5図は第1図の―線に沿う断面図
、第6図は従来のICの測定具と測定装置を接続
する状態を示す正面図、第7図は第6図の―
線に沿う断面図、第8図は第6図の―線に沿
う断面図である。
10,40……ICの測定具、14,44……
IC、16,47……端子、17,48……接触
子、25,60……接続端子、30,62……I
Cの測定装置、32,64……測定端子、33,
65……測定部、58……溝孔。
FIG. 1 is a front view showing a state in which an IC measuring tool and an IC measuring device according to an embodiment of the present invention are connected;
Fig. 2 is a perspective view showing how the corresponding contact is connected to the IC terminal, Fig. 3 is a sectional view taken along the - line in Fig. 1, and Fig. 4 is a sectional view taken along the - line in Fig. 1. , FIG. 5 is a cross-sectional view taken along line - in FIG. 1, FIG. 6 is a front view showing a state in which a conventional IC measuring tool and measuring device are connected, and FIG. 7 is a cross-sectional view taken along line - in FIG. 6.
FIG. 8 is a cross-sectional view taken along the line --- in FIG. 6. 10,40...IC measuring tool, 14,44...
IC, 16,47...terminal, 17,48...contact, 25,60...connection terminal, 30,62...I
C measuring device, 32, 64... measurement terminal, 33,
65...Measurement part, 58...Slot hole.
Claims (1)
接触子と、各接触子に対応して形成され、各々対
応する接触子との間で導通される複数の接触続子
とを備え、上記各接続端子を測定装置における複
数の測定端子にそれぞれ接続し、該測定装置より
発信される測定信号を電子部品との間で送受可能
とする電子部品の測定具において、上記各接続端
子を、対応して接続する測定端子の位置に合せて
、位置調整可能としたことを特徴とする電子部品
の測定具。 Each of the above-mentioned connections comprises a plurality of contacts that respectively contact each terminal of an electronic component, and a plurality of contact connectors that are formed corresponding to each contact and are electrically connected to each corresponding contact. In a measuring tool for electronic components, in which terminals are connected to a plurality of measurement terminals in a measuring device, and measurement signals emitted from the measuring device can be transmitted and received between the electronic components, each of the connection terminals is connected to a corresponding one. A measuring tool for electronic components, characterized in that the position can be adjusted according to the position of the measuring terminal to be connected.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4152785U JPS61158881U (en) | 1985-03-25 | 1985-03-25 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP4152785U JPS61158881U (en) | 1985-03-25 | 1985-03-25 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61158881U true JPS61158881U (en) | 1986-10-02 |
Family
ID=30551437
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP4152785U Pending JPS61158881U (en) | 1985-03-25 | 1985-03-25 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61158881U (en) |
-
1985
- 1985-03-25 JP JP4152785U patent/JPS61158881U/ja active Pending