JPS594474U - semiconductor measurement equipment - Google Patents
semiconductor measurement equipmentInfo
- Publication number
- JPS594474U JPS594474U JP9907782U JP9907782U JPS594474U JP S594474 U JPS594474 U JP S594474U JP 9907782 U JP9907782 U JP 9907782U JP 9907782 U JP9907782 U JP 9907782U JP S594474 U JPS594474 U JP S594474U
- Authority
- JP
- Japan
- Prior art keywords
- measurement equipment
- semiconductor measurement
- tester
- semiconductor
- output circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来のディスクリート素子用テスターにおける
複合素子の測定回路構成図であり、第２図は本考案の実
施例を示す測定回路構成図である。
尚、図において、１・・間ディスクリート素子用テスタ
一本体、２・・・・・・ディスクリート素子用ＤＵＴ部
、３・・・・・・複合素子の各素子切替え部、４・・・
・・・被測定物、５・・・・・・マルチプレクサドライ
ブ用コントロールビット出力回路、６・・・・・・ＢＣ
Ｄ−１０進（ＤＥＣＩＭＡＬ）デコーダ回路、７・・・
・・・リレーコイル群、８・・・・・・リレー接点群で
ある。FIG. 1 is a block diagram of a measuring circuit for a complex element in a conventional tester for discrete elements, and FIG. 2 is a block diagram of a measuring circuit showing an embodiment of the present invention. In the figure, 1... the main body of the tester for discrete elements, 2... the DUT section for discrete elements, 3... each element switching section of the composite element, 4...
...Object to be measured, 5...Control bit output circuit for multiplexer drive, 6...BC
D-decimal (DECIMAL) decoder circuit, 7...
. . . Relay coil group, 8 . . . Relay contact group.
Claims (1)
サドライブ用コントロール・ビット出力回路を付加する
ことで複合素子の各素子の電気的特性を自動測定可能に
したことを特徴とする半導一体測定装置。A semiconductor integrated measurement device, which is a tester for discrete devices, and is characterized in that it is capable of automatically measuring the electrical characteristics of each element of a composite device by adding a control bit output circuit for multiplexer drives.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9907782U JPS594474U (en) | 1982-06-30 | 1982-06-30 | semiconductor measurement equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9907782U JPS594474U (en) | 1982-06-30 | 1982-06-30 | semiconductor measurement equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS594474U true JPS594474U (en) | 1984-01-12 |
Family
ID=30234951
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9907782U Pending JPS594474U (en) | 1982-06-30 | 1982-06-30 | semiconductor measurement equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS594474U (en) |
-
1982
- 1982-06-30 JP JP9907782U patent/JPS594474U/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS594474U (en) | semiconductor measurement equipment | |
| JPS60183879U (en) | Semiconductor test equipment contacts | |
| JPS58158371U (en) | Semiconductor characteristics measurement equipment | |
| JPS584081U (en) | Semiconductor device testing equipment | |
| JPS5966158U (en) | test equipment | |
| JPS5842942U (en) | integrated circuit | |
| JPH0259476U (en) | ||
| JPS5987684U (en) | Semiconductor device measurement equipment | |
| JPS5814177U (en) | Equipment for measuring electrical characteristics of semiconductor devices | |
| JPS593537U (en) | Semiconductor device inspection equipment probe card | |
| JPS59160351U (en) | Power control type CPU device | |
| JPS6025902U (en) | Strain measurement device | |
| JPS59154678U (en) | semiconductor measuring instruments | |
| JPS6124675U (en) | Withstand voltage tester | |
| JPS59134077U (en) | Solar cell output characteristics measuring device | |
| JPS6146481U (en) | Automatic voltage proof insulation test equipment | |
| JPS6046078U (en) | Integrated circuit testing equipment | |
| JPS60141027U (en) | signal switching device | |
| JPS5935874U (en) | Electrical resistance measuring device | |
| JPS6073257U (en) | semiconductor equipment | |
| JPS5960574U (en) | Thermal resistance measuring device | |
| JPS58125879U (en) | Semiconductor device measurement equipment | |
| JPS5989229U (en) | Cryogenic measurement equipment | |
| JPS6098077U (en) | Leakage current measuring device for semiconductor devices | |
| JPS59137575U (en) | DC circuit ground fault resistance measuring device |