JPS6046078U - Integrated circuit testing equipment - Google Patents

Integrated circuit testing equipment

Info

Publication number
JPS6046078U
JPS6046078U JP13858783U JP13858783U JPS6046078U JP S6046078 U JPS6046078 U JP S6046078U JP 13858783 U JP13858783 U JP 13858783U JP 13858783 U JP13858783 U JP 13858783U JP S6046078 U JPS6046078 U JP S6046078U
Authority
JP
Japan
Prior art keywords
integrated circuit
testing equipment
circuit testing
tray
integrated circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13858783U
Other languages
Japanese (ja)
Inventor
小西 遊亀彦
Original Assignee
日本電気株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日本電気株式会社 filed Critical 日本電気株式会社
Priority to JP13858783U priority Critical patent/JPS6046078U/en
Publication of JPS6046078U publication Critical patent/JPS6046078U/en
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

図は本考案の一実施例を示す構成図である。 1・・・・・・ハイブリッドIC,2・・・・・・トレ
イ、3・・・・・・インタフェース回路、4・・・・・
・切替器、5・・・・・・測定器、、6・・・・・・制
御部。
The figure is a configuration diagram showing an embodiment of the present invention. 1...Hybrid IC, 2...Tray, 3...Interface circuit, 4...
- Switching device, 5... Measuring device, 6... Control section.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 複数個の集積回路を接続でき、内部に該集積回路の測定
をするために必要なインタフェース回路を持つトレイと
、該トレイに接続された前記集積回路のそれぞれの信号
線を選択し選択された信号線を前記トレイ内のインタフ
ェース回路を介して測定器に接続する切替器と、前記切
替器に信号線の選択動作をさせ、測定器に測定動作をさ
せる制御部とを含むことを特徴とする集積回路検査装置
A tray to which a plurality of integrated circuits can be connected and which has an interface circuit necessary for measuring the integrated circuits, and a signal line of each of the integrated circuits connected to the tray are selected and the selected signals are selected. An integrated circuit comprising: a switch that connects a line to a measuring device via an interface circuit in the tray; and a control section that causes the switch to select a signal line and causes the measuring device to perform a measuring operation. Circuit inspection equipment.
JP13858783U 1983-09-07 1983-09-07 Integrated circuit testing equipment Pending JPS6046078U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13858783U JPS6046078U (en) 1983-09-07 1983-09-07 Integrated circuit testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13858783U JPS6046078U (en) 1983-09-07 1983-09-07 Integrated circuit testing equipment

Publications (1)

Publication Number Publication Date
JPS6046078U true JPS6046078U (en) 1985-04-01

Family

ID=30310909

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13858783U Pending JPS6046078U (en) 1983-09-07 1983-09-07 Integrated circuit testing equipment

Country Status (1)

Country Link
JP (1) JPS6046078U (en)

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