JPS59109967U - Integrated circuit test equipment - Google Patents
Integrated circuit test equipmentInfo
- Publication number
- JPS59109967U JPS59109967U JP388283U JP388283U JPS59109967U JP S59109967 U JPS59109967 U JP S59109967U JP 388283 U JP388283 U JP 388283U JP 388283 U JP388283 U JP 388283U JP S59109967 U JPS59109967 U JP S59109967U
- Authority
- JP
- Japan
- Prior art keywords
- integrated circuit
- test equipment
- circuit test
- test device
- abstract
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は本考案の一実施例を示すブロック図である。
１・・・・・・試験装置制御部、２・・・・・・試験部
、３・・・・・−゛良品判定信号タイマー、４・・・・
・・不良品判定信号タイマー、５・・・・・・判定結果
表示部、６・・曲不良判定表示部、７・・・・・・良判
定表示部、８・・・・・・試験信号伝送線路、９・・・
・・・不良判定信号伝送線路、１ｏ・・・・・・良判定
信号伝送線路。 ′FIG. 1 is a block diagram showing an embodiment of the present invention. 1...Testing device control section, 2...Testing section, 3...-゛Good product judgment signal timer, 4...
... Defective product judgment signal timer, 5 ... Judgment result display section, 6 ... Song defective judgment display section, 7 ... Good judgment display section, 8 ... Test signal Transmission line, 9...
...Bad judgment signal transmission line, 1o...Good judgment signal transmission line. ′
Claims (1)
験装置を動作さ、せた後の判定結果表示を一定時間後に
消滅させることを特徴とする集積回路用試験装置。1. A test device for determining the quality of integrated circuits, characterized in that a display of a determination result after operating the test device disappears after a certain period of time.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP388283U JPS59109967U (en) | 1983-01-14 | 1983-01-14 | Integrated circuit test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP388283U JPS59109967U (en) | 1983-01-14 | 1983-01-14 | Integrated circuit test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS59109967U true JPS59109967U (en) | 1984-07-24 |
Family
ID=30135493
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP388283U Pending JPS59109967U (en) | 1983-01-14 | 1983-01-14 | Integrated circuit test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS59109967U (en) |
-
1983
- 1983-01-14 JP JP388283U patent/JPS59109967U/en active Pending
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