JPS5987684U - Semiconductor device measurement equipment - Google Patents
Semiconductor device measurement equipmentInfo
- Publication number
- JPS5987684U JPS5987684U JP18450782U JP18450782U JPS5987684U JP S5987684 U JPS5987684 U JP S5987684U JP 18450782 U JP18450782 U JP 18450782U JP 18450782 U JP18450782 U JP 18450782U JP S5987684 U JPS5987684 U JP S5987684U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- measurement equipment
- device measurement
- current
- detecting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来のドレイン耐圧測定装置の実施例を示すブ
冶ツク図、第２図は本考案の一実施例を示すブロック図
である。
１・・・・・・被測定素子（ＦＥＴ）、２・・・・・・
Ｖｏｓ電源、３・・・・・・■３電源、４・・・・・・
電流プローブ、５・・・・・・電流・電圧変換器、６・
・・・・・オシロスコープ、７，８・・・・・・スイッ
チ、９・・・・・・定電流電源、１０・・・・・・ステ
ップを源、１１．１３・・・・・・コンパレータ、１２
・・・・・・サンプル・ホールド回路、１４・・・・・
・コントローラ。FIG. 1 is a block diagram showing an embodiment of a conventional drain withstand voltage measuring device, and FIG. 2 is a block diagram showing an embodiment of the present invention. 1... Element under test (FET), 2...
Vos power supply, 3...■3 power supply, 4...
Current probe, 5...Current/voltage converter, 6.
...Oscilloscope, 7,8...Switch, 9...Constant current power supply, 10...Step source, 11.13...Comparator , 12
...Sample and hold circuit, 14...
·controller.
Claims (1)
定の値になるまで入力印加電圧を段階的に増加させるた
めの制御回路を設けたことを特徴とする半導体素子の測
定装置。1. A measuring device for a semiconductor device, comprising a control circuit for increasing an applied input voltage in steps by detecting a current in the semiconductor device until the current value reaches a predetermined value.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18450782U JPS5987684U (en) | 1982-12-06 | 1982-12-06 | Semiconductor device measurement equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18450782U JPS5987684U (en) | 1982-12-06 | 1982-12-06 | Semiconductor device measurement equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5987684U true JPS5987684U (en) | 1984-06-13 |
Family
ID=30399045
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18450782U Pending JPS5987684U (en) | 1982-12-06 | 1982-12-06 | Semiconductor device measurement equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5987684U (en) |
-
1982
- 1982-12-06 JP JP18450782U patent/JPS5987684U/en active Pending
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