JPS5958375U - Semiconductor device testing equipment - Google Patents
Semiconductor device testing equipmentInfo
- Publication number
- JPS5958375U JPS5958375U JP15434382U JP15434382U JPS5958375U JP S5958375 U JPS5958375 U JP S5958375U JP 15434382 U JP15434382 U JP 15434382U JP 15434382 U JP15434382 U JP 15434382U JP S5958375 U JPS5958375 U JP S5958375U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- device testing
- testing equipment
- limit value
- control
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の半導体素子試験装置の回路図、第２図は
本考案の一実施例の回路図である。
１・・・・・・試験電圧印加用電源、２・・・・・・ヒ
ユーズ、３・・・・・・分流器、４・・・・・・被試験
半導体素子、５・・・・・・負荷抵抗、８・・・・・・
表示用発光ダイオード、１０・・・・・・制御手段、１
１・・・・・・電源正出力端子、１２・・・・・・電源
負出力端子、１３・・・・・・上限値設定用可変抵抗、
１４・・・・・・下限値設定用可変抵抗、１５．１６・
・・・・・演算増幅器、１７・・・・・・トランジ、ス
タ。FIG. 1 is a circuit diagram of a conventional semiconductor device testing apparatus, and FIG. 2 is a circuit diagram of an embodiment of the present invention. 1... Power supply for applying test voltage, 2... Fuse, 3... Shunt, 4... Semiconductor element under test, 5...・Load resistance, 8...
Display light emitting diode, 10... Control means, 1
1...Power supply positive output terminal, 12...Power supply negative output terminal, 13...Variable resistor for upper limit value setting,
14...Variable resistor for lower limit value setting, 15.16.
...Operation amplifier, 17...Transistor, star.
Claims (1)
を検出する検出手段と、前記検出電流の上限値および下
限値を設定する設定手段と、この設定手段により設定の
上限および下限の範囲内の検出電流により制御信号を出
力する制御手段と、こめ制御手段の制御出力信号により
駆動される表示用発光ダイオードとを含むことを特徴と
する半・導体素子試験装置。a detection means for detecting a current flowing through a semiconductor device under test to which a test voltage is applied; a setting means for setting an upper limit value and a lower limit value of the detected current; 1. A semiconductor/conductor device testing apparatus comprising: a control means for outputting a control signal based on a detected current; and a display light emitting diode driven by a control output signal of the control means.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15434382U JPS5958375U (en) | 1982-10-12 | 1982-10-12 | Semiconductor device testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15434382U JPS5958375U (en) | 1982-10-12 | 1982-10-12 | Semiconductor device testing equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5958375U true JPS5958375U (en) | 1984-04-16 |
Family
ID=30341204
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15434382U Pending JPS5958375U (en) | 1982-10-12 | 1982-10-12 | Semiconductor device testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5958375U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5518159B2 (en) * | 1975-09-10 | 1980-05-16 |
-
1982
- 1982-10-12 JP JP15434382U patent/JPS5958375U/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5518159B2 (en) * | 1975-09-10 | 1980-05-16 |
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