JPS63190974U - - Google Patents

Info

Publication number
JPS63190974U
JPS63190974U JP8259687U JP8259687U JPS63190974U JP S63190974 U JPS63190974 U JP S63190974U JP 8259687 U JP8259687 U JP 8259687U JP 8259687 U JP8259687 U JP 8259687U JP S63190974 U JPS63190974 U JP S63190974U
Authority
JP
Japan
Prior art keywords
current detection
detection resistor
circuit
subtraction circuit
operational amplifier
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8259687U
Other languages
Japanese (ja)
Other versions
JPH0645909Y2 (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8259687U priority Critical patent/JPH0645909Y2/en
Publication of JPS63190974U publication Critical patent/JPS63190974U/ja
Application granted granted Critical
Publication of JPH0645909Y2 publication Critical patent/JPH0645909Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの考案の一実施例を示す接続図、第
２図は従来技術を説明するための接続図、第３図
は従来技術の動作を説明するための波形図である
。 １：演算増幅器、２：被試験ＩＣ、２Ａ，２Ｂ
：電圧を印加する端子、ＥＣ：直流電圧源、３：
電流検出用抵抗器、４：帰還回路、５：電流測定
回路、６：レンジ切替回路。 FIG. 1 is a connection diagram showing an embodiment of this invention, FIG. 2 is a connection diagram for explaining the prior art, and FIG. 3 is a waveform diagram for explaining the operation of the prior art. 1: Operational amplifier, 2: IC under test, 2A, 2B
: Terminal for applying voltage, EC: DC voltage source, 3:
Current detection resistor, 4: Feedback circuit, 5: Current measurement circuit, 6: Range switching circuit.

Claims (1)

【実用新案登録請求の範囲】 Ａ 被試験ＩＣの端子に所定の電圧を印加する演
算増幅器と、 Ｂ この演算増幅器の出力端子と上記被試験ＩＣ
の端子の間に接続した電流検出用抵抗器と、 Ｃ この電流検出用抵抗器に並列接続したダイオ
ードの逆並列回路と、 Ｄ 上記電流検出用抵抗器に発生する電圧を取り
出す引き算回路と、 Ｅ この引き算回路の後段に接続され、引き算回
路から出力される電圧信号のレベルを切替えるレ
ンジ切替回路と、 から成るＩＣ試験装置。[Claims for Utility Model Registration] A. An operational amplifier that applies a predetermined voltage to the terminals of the IC under test; B. The output terminal of this operational amplifier and the IC under test.
A current detection resistor connected between the terminals of C, an anti-parallel circuit of diodes connected in parallel to this current detection resistor, D a subtraction circuit that extracts the voltage generated in the current detection resistor, and E An IC test device comprising: a range switching circuit that is connected to a subsequent stage of the subtraction circuit and switches the level of a voltage signal output from the subtraction circuit.
JP8259687U 1987-05-29 1987-05-29 IC test equipment Expired - Lifetime JPH0645909Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8259687U JPH0645909Y2 (en) 1987-05-29 1987-05-29 IC test equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8259687U JPH0645909Y2 (en) 1987-05-29 1987-05-29 IC test equipment

Publications (2)

Publication Number Publication Date
JPS63190974U true JPS63190974U (en) 1988-12-08
JPH0645909Y2 JPH0645909Y2 (en) 1994-11-24

Family

ID=30935385

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8259687U Expired - Lifetime JPH0645909Y2 (en) 1987-05-29 1987-05-29 IC test equipment

Country Status (1)

Country Link
JP (1) JPH0645909Y2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3426254B2 (en) * 1997-11-20 2003-07-14 株式会社アドバンテスト IC test method and IC test apparatus using this test method
JP2007003368A (en) * 2005-06-24 2007-01-11 Yokogawa Electric Corp Voltage application device
JP2013104859A (en) * 2011-11-17 2013-05-30 Hioki Ee Corp Voltage output device and resistance measuring device
JP2014119379A (en) * 2012-12-18 2014-06-30 Sharp Corp Test method for semiconductor transistor
WO2021039753A1 (en) * 2019-08-28 2021-03-04 パナソニックＩｐマネジメント株式会社 Ventilation device

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3426254B2 (en) * 1997-11-20 2003-07-14 株式会社アドバンテスト IC test method and IC test apparatus using this test method
JP2007003368A (en) * 2005-06-24 2007-01-11 Yokogawa Electric Corp Voltage application device
JP4581865B2 (en) * 2005-06-24 2010-11-17 横河電機株式会社 Voltage application device
JP2013104859A (en) * 2011-11-17 2013-05-30 Hioki Ee Corp Voltage output device and resistance measuring device
JP2014119379A (en) * 2012-12-18 2014-06-30 Sharp Corp Test method for semiconductor transistor
WO2021039753A1 (en) * 2019-08-28 2021-03-04 パナソニックＩｐマネジメント株式会社 Ventilation device
JP6865361B1 (en) * 2019-08-28 2021-04-28 パナソニックＩｐマネジメント株式会社 Ventilation device
US11486903B2 (en) 2019-08-28 2022-11-01 Panasonic Intellectual Property Management Co., Ltd. Ventilation device

Also Published As

Publication number Publication date
JPH0645909Y2 (en) 1994-11-24

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