JPS584081U - Semiconductor device testing equipment - Google Patents
Semiconductor device testing equipmentInfo
- Publication number
- JPS584081U JPS584081U JP9870381U JP9870381U JPS584081U JP S584081 U JPS584081 U JP S584081U JP 9870381 U JP9870381 U JP 9870381U JP 9870381 U JP9870381 U JP 9870381U JP S584081 U JPS584081 U JP S584081U
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor device
- device testing
- testing equipment
- circuit
- voltage generation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の半導体素子試験装置の回路図、第２図は
本考案の一実施例の回路図である。
１・・・試験電圧発生回路、２・・・供試半導体素子、
３・・・ヒユーズ、４・・・リーク電流検出抵抗、′５
・・・リードリレー、６・・・リーク電流比較回路、７
・・・リーク電流設定回路、８・・・ドライブ回路。FIG. 1 is a circuit diagram of a conventional semiconductor device testing apparatus, and FIG. 2 is a circuit diagram of an embodiment of the present invention. 1... Test voltage generation circuit, 2... Semiconductor element under test,
3... Fuse, 4... Leak current detection resistor, '5
...Reed relay, 6...Leak current comparison circuit, 7
... Leak current setting circuit, 8... Drive circuit.
Claims (1)
の印加により供試半導体素子に流れるリーク電流を検出
する検出回路と、このリーク電流検出回路の所定値以上
の出力に応じ前記供試半導体素子の電流を遮断する遮断
回路とを備えｔコことを特徴とする半導体素子試験装置
。a test voltage generation circuit; a detection circuit that detects a leakage current flowing to the semiconductor device under test upon application of the output voltage of the test voltage generation circuit; A semiconductor device testing device comprising: a cutoff circuit for cutting off the current of the semiconductor device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9870381U JPS584081U (en) | 1981-07-02 | 1981-07-02 | Semiconductor device testing equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP9870381U JPS584081U (en) | 1981-07-02 | 1981-07-02 | Semiconductor device testing equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS584081U true JPS584081U (en) | 1983-01-11 |
Family
ID=29893454
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP9870381U Pending JPS584081U (en) | 1981-07-02 | 1981-07-02 | Semiconductor device testing equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS584081U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007292675A (en) * | 2006-04-27 | 2007-11-08 | Shindengen Electric Mfg Co Ltd | Reliability testing device |
-
1981
- 1981-07-02 JP JP9870381U patent/JPS584081U/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007292675A (en) * | 2006-04-27 | 2007-11-08 | Shindengen Electric Mfg Co Ltd | Reliability testing device |
| JP4640834B2 (en) * | 2006-04-27 | 2011-03-02 | 新電元工業株式会社 | Reliability test equipment |
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