JPS58112976U - MOSFET life test equipment - Google Patents
MOSFET life test equipmentInfo
- Publication number
- JPS58112976U JPS58112976U JP978982U JP978982U JPS58112976U JP S58112976 U JPS58112976 U JP S58112976U JP 978982 U JP978982 U JP 978982U JP 978982 U JP978982 U JP 978982U JP S58112976 U JPS58112976 U JP S58112976U
- Authority
- JP
- Japan
- Prior art keywords
- current
- test equipment
- life test
- mosfet
- source
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来のＭＯＳＦＥＴのドレイン電流−チヤンネ
ル部温度の関係の一例を示す特性図、第２図は本考案の
一実施例の回路図である。
１・・・・・・ドレイン電流検出用抵抗、２・曲・比較
回路、３・・・・・・スイッチ、４・・曲主電源、５・
・開基準電圧源、６・・・・・・被試験ＭＯ３ＦＥＴ、
７・・・・・・ゲート 。
電源。FIG. 1 is a characteristic diagram showing an example of the relationship between drain current and channel temperature of a conventional MOSFET, and FIG. 2 is a circuit diagram of an embodiment of the present invention. 1... Resistor for drain current detection, 2... Song/comparison circuit, 3... Switch, 4... Song main power supply, 5.
・Open reference voltage source, 6...MO3FET under test,
7...Gate. power supply.
Claims (1)
検出用抵抗と、この電流検出用抵抗両端の電位差を基準
電圧と比較する比較回路と、該比較回路の出力により前
記ＭＯ５ＦＥＴのドレイン・ソース間に流れている電流
−を開閉するスイッチとを含むことを特徴とするＭＯ３
ＦＥＴ寿命試験装置。A drain current detection resistor connected to the source of the MO3FET under test, a comparison circuit that compares the potential difference across the current detection resistor with a reference voltage, and a current flowing between the drain and source of the MO5FET due to the output of the comparison circuit. An MO3 characterized in that it includes a current that is connected to a current source and a switch that opens and closes the current.
FET life test equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP978982U JPS58112976U (en) | 1982-01-27 | 1982-01-27 | MOSFET life test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP978982U JPS58112976U (en) | 1982-01-27 | 1982-01-27 | MOSFET life test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58112976U true JPS58112976U (en) | 1983-08-02 |
Family
ID=30022402
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP978982U Pending JPS58112976U (en) | 1982-01-27 | 1982-01-27 | MOSFET life test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58112976U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016118399A (en) * | 2014-12-18 | 2016-06-30 | 株式会社シバソク | Testing apparatus |
-
1982
- 1982-01-27 JP JP978982U patent/JPS58112976U/en active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2016118399A (en) * | 2014-12-18 | 2016-06-30 | 株式会社シバソク | Testing apparatus |
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