JPS58165680U - MOSFET life test equipment - Google Patents
MOSFET life test equipmentInfo
- Publication number
- JPS58165680U JPS58165680U JP6310982U JP6310982U JPS58165680U JP S58165680 U JPS58165680 U JP S58165680U JP 6310982 U JP6310982 U JP 6310982U JP 6310982 U JP6310982 U JP 6310982U JP S58165680 U JPS58165680 U JP S58165680U
- Authority
- JP
- Japan
- Prior art keywords
- switch
- mosfet
- test equipment
- life test
- mo3fet
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図はドレイン電流とチャネル部温度の関係) を
示す図、第2図は本考案の一実施例である。
フ なお図において、1・・・・・・被試験MO3
FET。
ζ 2・・・・・・ドレイン電流検出用抵抗、3・・
曲比較回路、1 4・・・・・・スイッチ、5・曲・タ
イマ一つきスイッチ、−6・・・・・・主電源、7・・
曲温度設定用基準電源、8・・・ミ ・・・ゲートバ
イアス電源、である。FIG. 1 is a diagram showing the relationship between drain current and channel temperature, and FIG. 2 is an embodiment of the present invention. In the figure, 1...MO3 to be tested
FET. ζ 2...Drain current detection resistor, 3...
Song comparison circuit, 1 4...Switch, 5.Switch with one song/timer, -6...Main power supply, 7...
Reference power supply for setting the music temperature, 8...mi...gate bias power supply.
Claims (1)
ン電流検出用抵抗とこの電流検出用抵抗両端C電位差を
基準電圧と比較回路と、゛比較回路の出ブにより被試験
MO3FETのドレイン電流を開がするスイッチと、前
記スイッチが開放後、定時■後に前記スイッチが回復す
るための補助スイッチとを含むことを特徴としたMOS
FET寿命試彫装置。A train current detection resistor connected to the source of the MO3FET under test, a comparison circuit that compares the potential difference between both ends of this current detection resistor with a reference voltage, and a switch that opens the drain current of the MO3FET under test when the output of the comparison circuit is output. and an auxiliary switch for recovering the switch after a predetermined time after the switch is opened.
FET life trial engraving device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6310982U JPS58165680U (en) | 1982-04-28 | 1982-04-28 | MOSFET life test equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP6310982U JPS58165680U (en) | 1982-04-28 | 1982-04-28 | MOSFET life test equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS58165680U true JPS58165680U (en) | 1983-11-04 |
Family
ID=30073227
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP6310982U Pending JPS58165680U (en) | 1982-04-28 | 1982-04-28 | MOSFET life test equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58165680U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5414744A (en) * | 1977-07-05 | 1979-02-03 | Ricoh Co Ltd | Copying apparatus using laser |
JPS54158251A (en) * | 1978-06-05 | 1979-12-13 | Hitachi Ltd | Optical recorder |
-
1982
- 1982-04-28 JP JP6310982U patent/JPS58165680U/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5414744A (en) * | 1977-07-05 | 1979-02-03 | Ricoh Co Ltd | Copying apparatus using laser |
JPS54158251A (en) * | 1978-06-05 | 1979-12-13 | Hitachi Ltd | Optical recorder |
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