JPS58119775U - semiconductor test equipment - Google Patents
semiconductor test equipmentInfo
- Publication number
- JPS58119775U JPS58119775U JP1619382U JP1619382U JPS58119775U JP S58119775 U JPS58119775 U JP S58119775U JP 1619382 U JP1619382 U JP 1619382U JP 1619382 U JP1619382 U JP 1619382U JP S58119775 U JPS58119775 U JP S58119775U
- Authority
- JP
- Japan
- Prior art keywords
- test equipment
- semiconductor test
- transistor
- under test
- semiconductor device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は、従来の順方向通電の回路例、第２図 ′
は本考案の一実施例を示す回路構成図、第３図、第４図
は本考案の他の実施例を示す回路図である。
１・・・・・・主電源、２・・・・・・供試半導体装置
、３・・・・・・トランジスタ、４・・・・・・サンプ
リング抵抗、５・・・・・・差動増幅器、６・・・・・
・基準電圧。Figure 1 shows an example of a conventional forward energizing circuit, and Figure 2'
1 is a circuit diagram showing one embodiment of the present invention, and FIGS. 3 and 4 are circuit diagrams showing other embodiments of the present invention. 1... Main power supply, 2... Semiconductor device under test, 3... Transistor, 4... Sampling resistor, 5... Differential Amplifier, 6...
・Reference voltage.
Claims (1)
び抵抗を含む直列回路と、前記抵抗の電圧降下と基準電
圧とを比較して前記トランジスタのベースへ比較出力を
供給する差動増幅器とを備え、前記供試半導体装置へ一
定電流を供給することを特徴とする半導体試験装置。comprising a series circuit including a semiconductor device under test, a transistor, and a resistor connected between power supplies, and a differential amplifier that compares a voltage drop across the resistor with a reference voltage and supplies a comparison output to the base of the transistor; A semiconductor testing device characterized in that a constant current is supplied to the semiconductor device under test.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1619382U JPS58119775U (en) | 1982-02-08 | 1982-02-08 | semiconductor test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1619382U JPS58119775U (en) | 1982-02-08 | 1982-02-08 | semiconductor test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS58119775U true JPS58119775U (en) | 1983-08-15 |
Family
ID=30028569
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1619382U Pending JPS58119775U (en) | 1982-02-08 | 1982-02-08 | semiconductor test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS58119775U (en) |
-
1982
- 1982-02-08 JP JP1619382U patent/JPS58119775U/en active Pending
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