JPS5923673U - IC test equipment - Google Patents
IC test equipmentInfo
- Publication number
- JPS5923673U JPS5923673U JP11820282U JP11820282U JPS5923673U JP S5923673 U JPS5923673 U JP S5923673U JP 11820282 U JP11820282 U JP 11820282U JP 11820282 U JP11820282 U JP 11820282U JP S5923673 U JPS5923673 U JP S5923673U
- Authority
- JP
- Japan
- Prior art keywords
- test
- power supply
- test equipment
- setting end
- end signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図はＩＣの直流特性試験の電流印加電圧測定モード
の状態を説明する接続図、第２図はＩＣの直流特性試験
の電圧印加電流測定モードを説明するための接続図、第
３図は従来のＩＣ試験装置を説明するためのブロック図
、第４図はこの考案の一実施例を示すブロック図である
。
１０１：被試験ＩＣ，１０５：試験用電源、３０５ａ
〜３０５ｂ、ピン制御部、３１１：制御用プロセッサ、
４０１：試験用電源の設定変更終了検出手段、４０２：
ピン制御部の状態を検出する手段。Figure 1 is a connection diagram to explain the current applied voltage measurement mode for IC DC characteristics testing, Figure 2 is a connection diagram to explain the voltage applied current measurement mode for IC DC characteristics tests, and Figure 3 is FIG. 4 is a block diagram illustrating a conventional IC testing device. FIG. 4 is a block diagram showing an embodiment of this invention. 101: IC under test, 105: Test power supply, 305a
~305b, pin control unit, 311: control processor,
401: Test power supply setting change end detection means, 402:
Means for detecting the state of the pin control.
Claims (1)
び電圧を与える試験用電源と、 Ｂ この試験用電源において設定が完了したか否かを表
示する信号を出力する設定終了信号発生手段と、 Ｃこの設定終了信号の有無に応じて直流試験の状態に制
御する制御手段と、 から成るＩＣ試験装置。[Scope of Claim for Utility Model Registration] A. A test power supply that provides the current and voltage necessary for the DC characteristic test to each terminal of the IC under test, and B. A signal that indicates whether or not the settings have been completed in this test power supply. An IC testing device comprising: means for generating a setting end signal to output; and controlling means for controlling to a DC test state depending on the presence or absence of the setting end signal.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11820282U JPS5923673U (en) | 1982-08-02 | 1982-08-02 | IC test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP11820282U JPS5923673U (en) | 1982-08-02 | 1982-08-02 | IC test equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5923673U true JPS5923673U (en) | 1984-02-14 |
Family
ID=30271786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP11820282U Pending JPS5923673U (en) | 1982-08-02 | 1982-08-02 | IC test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5923673U (en) |
-
1982
- 1982-08-02 JP JP11820282U patent/JPS5923673U/en active Pending
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