JPS60183879U - Semiconductor test equipment contacts - Google Patents

Semiconductor test equipment contacts

Info

Publication number
JPS60183879U
JPS60183879U JP7207384U JP7207384U JPS60183879U JP S60183879 U JPS60183879 U JP S60183879U JP 7207384 U JP7207384 U JP 7207384U JP 7207384 U JP7207384 U JP 7207384U JP S60183879 U JPS60183879 U JP S60183879U
Authority
JP
Japan
Prior art keywords
contact
semiconductor test
test equipment
equipment contacts
lead part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7207384U
Other languages
Japanese (ja)
Other versions
JPH0428067Y2 (en
Inventor
遠山　繁喜
井上　義成
立山　茂
Original Assignee
三菱電機株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱電機株式会社 filed Critical 三菱電機株式会社
Priority to JP7207384U priority Critical patent/JPS60183879U/en
Publication of JPS60183879U publication Critical patent/JPS60183879U/en
Application granted granted Critical
Publication of JPH0428067Y2 publication Critical patent/JPH0428067Y2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of drawings]

第１図ａｔ　ｂは従来の半導体試験装置の概略を示す側
面図および正面図、第２図は従来のリード部と接触子と
の接触状態を示す側面図、第３図は従来の他の接触状態
を示す側面図、第４図ａ、　ｂはこの考案の一実施例を
示す半導体試験装置の側面図および正面図、第５図〜第
８図はこの考案によるリード部と接触子との接触態様を
示す図である。 図中、１は接触子、２は固定治具、３は固定ネジ、４は
押え治具、５はモールド部、６はリード部、７はハンド
ラレール、８は金属片、８ａは可動部である。なお、図
中の同一符号は同一または相当部分を示す。Fig. 1 at b is a side view and a front view schematically showing a conventional semiconductor testing device, Fig. 2 is a side view showing the contact state between the conventional lead part and the contact, and Fig. 3 is a side view showing the contact state of the conventional lead part and the contact. Figures 4a and 4b are side views and front views of a semiconductor testing device showing an embodiment of this invention, and Figures 5 to 8 are views showing the contact between the lead portion and the contact according to this invention. It is a figure showing an aspect. In the figure, 1 is a contact, 2 is a fixing jig, 3 is a fixing screw, 4 is a holding jig, 5 is a mold part, 6 is a lead part, 7 is a handler rail, 8 is a metal piece, and 8a is a movable part. be. Note that the same reference numerals in the figures indicate the same or corresponding parts.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 被測定ＩＣの各リード部にそれぞれ接触子を接触せしめ
、電気信号を加えて電気的測定を行う半導体試験装置に
おいて、前記接触子の先端に前記リード部の角度に応じ
て面接触が得られるように金属片を回動自在に取り付け
たことを特徴とする半導体試験装置の接触子。In a semiconductor test device that performs electrical measurements by bringing a contact into contact with each lead part of an IC to be measured and applying an electric signal, a surface contact can be obtained at the tip of the contact according to the angle of the lead part. A contact for semiconductor testing equipment, characterized in that a metal piece is rotatably attached to the contact.
JP7207384U 1984-05-15 1984-05-15 Semiconductor test equipment contacts Granted JPS60183879U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7207384U JPS60183879U (en) 1984-05-15 1984-05-15 Semiconductor test equipment contacts

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7207384U JPS60183879U (en) 1984-05-15 1984-05-15 Semiconductor test equipment contacts

Publications (2)

Publication Number Publication Date
JPS60183879U true JPS60183879U (en) 1985-12-06
JPH0428067Y2 JPH0428067Y2 (en) 1992-07-07

Family

ID=30610144

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7207384U Granted JPS60183879U (en) 1984-05-15 1984-05-15 Semiconductor test equipment contacts

Country Status (1)

Country Link
JP (1) JPS60183879U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012068063A (en) * 2010-09-21 2012-04-05 Fujitsu Telecom Networks Ltd Contact probe and charging and discharging device
WO2013001910A1 (en) * 2011-06-27 2013-01-03 Ｊｘ日鉱日石エネルギー株式会社 Solar cell measurement jig
WO2013001911A1 (en) * 2011-06-27 2013-01-03 Ｊｘ日鉱日石エネルギー株式会社 Solar cell measurement jig

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4656606B2 (en) * 2006-07-28 2011-03-23 株式会社ライテク Auxiliary tools for the production of support pillars such as avalanches and rockfalls

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4957370A (en) * 1972-10-04 1974-06-04
JPS5040753A (en) * 1973-08-13 1975-04-14
JPS53156569U (en) * 1977-05-13 1978-12-08
JPS58180953A (en) * 1982-04-15 1983-10-22 Mitsubishi Electric Corp Measuring apparatus

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4957370A (en) * 1972-10-04 1974-06-04
JPS5040753A (en) * 1973-08-13 1975-04-14
JPS53156569U (en) * 1977-05-13 1978-12-08
JPS58180953A (en) * 1982-04-15 1983-10-22 Mitsubishi Electric Corp Measuring apparatus

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012068063A (en) * 2010-09-21 2012-04-05 Fujitsu Telecom Networks Ltd Contact probe and charging and discharging device
WO2013001910A1 (en) * 2011-06-27 2013-01-03 Ｊｘ日鉱日石エネルギー株式会社 Solar cell measurement jig
WO2013001911A1 (en) * 2011-06-27 2013-01-03 Ｊｘ日鉱日石エネルギー株式会社 Solar cell measurement jig

Also Published As

Publication number Publication date
JPH0428067Y2 (en) 1992-07-07

Similar Documents

Publication Publication Date Title
JPS60183879U (en) Semiconductor test equipment contacts
JPS60183442U (en) Integrated circuit measurement jig
JPS6157867U (en)
JPS5827784U (en) Probe fixing jig
JPS613473U (en) Contact for low resistance measurement
JPS60183877U (en) IC handler measurement socket
JPS6074066U (en) Jig for electrical testing of integrated circuits
JPS5966158U (en) test equipment
JPS6117678U (en) tester
JPS6059160U (en) measuring device
JPS59120485U (en) Electronic component measuring device
JPS6228183U (en)
JPS59162671U (en) High temperature test equipment for semiconductor devices
JPS59103288U (en) resistance measurement circuit
JPH0323368U (en)
JPS598171U (en) Terminal connection device for electronic component testing equipment
JPS59148251U (en) Wafer prober measurement needle polishing device
JPS59154636U (en) Adhesive strength tester
JPS6126103U (en) Jumper wire measurement jig
JPS5842942U (en) integrated circuit
JPS588174U (en) Thick film circuit board measuring device
JPS618872U (en) Electrode terminal measurement probe
JPS60111284U (en) Printed circuit board measuring device
JPS6021966U (en) Slit type contact for handler
JPS60191978U (en) IC inspection equipment