JPS60191978U - IC inspection equipment - Google Patents
IC inspection equipmentInfo
- Publication number
- JPS60191978U JPS60191978U JP8018984U JP8018984U JPS60191978U JP S60191978 U JPS60191978 U JP S60191978U JP 8018984 U JP8018984 U JP 8018984U JP 8018984 U JP8018984 U JP 8018984U JP S60191978 U JPS60191978 U JP S60191978U
- Authority
- JP
- Japan
- Prior art keywords
- leads
- group
- inspection equipment
- measurement electrodes
- package
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は本考案の一実施例の一部断面図、第２区は従来
の検査方法を示す斜視図である。
１・・・・・・シングルイン用ソケット、３，４，９゜
１０・・・・・・リード、６．訃・・・・・配線基板、
１１・・・・・・支持台、１２，１３・・・・・・スプ
リングプローブ、１４・・・・・・プロージ支持腕、１
６・・・・・・テスター。FIG. 1 is a partial sectional view of one embodiment of the present invention, and the second section is a perspective view showing a conventional inspection method. 1... Single-in socket, 3, 4, 9° 10... Lead, 6. Death...Wiring board,
11... Support stand, 12, 13... Spring probe, 14... Prouge support arm, 1
6...Tester.
Claims (1)
プリングプローブを列設させた測定電極１、群と、前記
ＩＣパッケージのリードを当接させる弾性平面を有する
支持台と、前記測定電極群と前記支持台とを相対的に接
近、隔間可能な進退機構とを具備することを特徴とする
ＩＣ用検査装置。A group of measurement electrodes 1 and 1 in which spring probes are arranged in a row at intervals corresponding to the leads of an IC package to be measured; a support base having an elastic plane on which the leads of the IC package come into contact; the group of measurement electrodes and the support. An IC inspection device characterized by comprising an advancing/retracting mechanism capable of moving relatively close to and away from a stand.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8018984U JPS60191978U (en) | 1984-05-30 | 1984-05-30 | IC inspection equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8018984U JPS60191978U (en) | 1984-05-30 | 1984-05-30 | IC inspection equipment |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60191978U true JPS60191978U (en) | 1985-12-19 |
Family
ID=30625804
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8018984U Pending JPS60191978U (en) | 1984-05-30 | 1984-05-30 | IC inspection equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60191978U (en) |
-
1984
- 1984-05-30 JP JP8018984U patent/JPS60191978U/en active Pending
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JPS60191978U (en) | IC inspection equipment | |
| JPS60107773U (en) | Connection confirmation device between circuit board and circuit tester | |
| JPS5821879U (en) | Electronic circuit testing equipment | |
| JPS60183879U (en) | Semiconductor test equipment contacts | |
| JPS60185263U (en) | Contact probe for inspection equipment for circuit boards, etc. | |
| JPS62108874U (en) | ||
| JP3052874B2 (en) | Probe device for BGA type semiconductor device | |
| JPH0323368U (en) | ||
| JPS6023738U (en) | Inspection jig for semiconductor light emitting devices | |
| JPS6297966U (en) | ||
| JPS6132968U (en) | test probe card | |
| JPS5849274U (en) | Circuit component inspection equipment | |
| JPS59192839U (en) | Wafer measurement equipment | |
| JPS60109326U (en) | Semiconductor pseudo test equipment | |
| JPS58164235U (en) | Semiconductor device testing equipment | |
| JPS60168075U (en) | Integrated circuit testing equipment | |
| JPS60129677U (en) | Test board for integrated circuits | |
| JPS62108870U (en) | ||
| JPS60183877U (en) | IC handler measurement socket | |
| JPS60111284U (en) | Printed circuit board measuring device | |
| JPS58148934U (en) | integrated circuit measurement equipment | |
| JPS60144237U (en) | Semiconductor device inspection equipment | |
| JPS58159740U (en) | Wire peel test equipment | |
| JPS6117671U (en) | Printed board testing equipment | |
| JPS60183442U (en) | Integrated circuit measurement jig |