JPS60129677U - Test board for integrated circuits - Google Patents
Test board for integrated circuitsInfo
- Publication number
- JPS60129677U JPS60129677U JP1762584U JP1762584U JPS60129677U JP S60129677 U JPS60129677 U JP S60129677U JP 1762584 U JP1762584 U JP 1762584U JP 1762584 U JP1762584 U JP 1762584U JP S60129677 U JPS60129677 U JP S60129677U
- Authority
- JP
- Japan
- Prior art keywords
- test board
- integrated circuits
- integrated circuit
- contact
- terminals
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図ａは従来のテストボードの斜視図、第１図すは従
来の試験用ＩＣとテストボードの実装を示す模式図、第
２図は一実施例のテストボードの斜視図、第３図は漏斗
状コンタクトプローブの断面図、第４図ａおよ゛びｂは
試験用ＩＣとＩＣテスト 。
ボードの実装過程を示す模式図をそれぞれ示している。
図において、１は従来のテストボード、１１〜１ｎはコ
ンタクトプローブ、２は試験用ＩＣ，２−１、、、′：
”＝’二ｇコ〒５Ｈ７−；、７−；はコンタクトプロ
ーブ受台、５はスプリング、６は漏斗状導電体をそれぞ
れ示している。Fig. 1a is a perspective view of a conventional test board, Fig. 1 is a schematic diagram showing the mounting of a conventional test IC and a test board, Fig. 2 is a perspective view of a test board of one embodiment, Fig. 3 Figure 4 is a cross-sectional view of the funnel-shaped contact probe, and Figures 4a and 4b are the test IC and IC test. Each shows a schematic diagram showing the board mounting process. In the figure, 1 is a conventional test board, 11 to 1n are contact probes, 2 is a test IC, 2-1,...':
"='2g 5H7-;, 7-; indicates a contact probe holder, 5 indicates a spring, and 6 indicates a funnel-shaped conductor, respectively.
Claims (1)
ーブにて集積回路の端子を当接せしめ当該集積回路の測
定を行う集積回路用テストボードにおいて、前記コンタ
クトプローブの少なくとも３ケ所の先端部に、前記集積
回路の端子を案内し、全ピンの当接を行い得る漏斗状導
電体を付設したことを特徴とする集積回路用テストボー
ド。In an integrated circuit test board in which a plurality of contact probes are installed and the terminals of the integrated circuit are brought into contact with the contact probes to measure the integrated circuit, the integrated circuit A test board for integrated circuits, characterized in that it is equipped with a funnel-shaped conductor that can guide circuit terminals and bring all pins into contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1762584U JPS60129677U (en) | 1984-02-10 | 1984-02-10 | Test board for integrated circuits |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1762584U JPS60129677U (en) | 1984-02-10 | 1984-02-10 | Test board for integrated circuits |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS60129677U true JPS60129677U (en) | 1985-08-30 |
Family
ID=30505500
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1762584U Pending JPS60129677U (en) | 1984-02-10 | 1984-02-10 | Test board for integrated circuits |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS60129677U (en) |
-
1984
- 1984-02-10 JP JP1762584U patent/JPS60129677U/en active Pending
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