JPS5862275U - Fixing structure of probe pin socket for printed circuit board inspection - Google Patents

Fixing structure of probe pin socket for printed circuit board inspection

Info

Publication number
JPS5862275U
JPS5862275U JP15674981U JP15674981U JPS5862275U JP S5862275 U JPS5862275 U JP S5862275U JP 15674981 U JP15674981 U JP 15674981U JP 15674981 U JP15674981 U JP 15674981U JP S5862275 U JPS5862275 U JP S5862275U
Authority
JP
Japan
Prior art keywords
circuit board
printed circuit
board inspection
fixing structure
probe pin
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15674981U
Other languages
Japanese (ja)
Inventor
地頭園 茂
秀臣 林
二見 菊男
美土路 研二
Original Assignee
株式会社フジクラ
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社フジクラ filed Critical 株式会社フジクラ
Priority to JP15674981U priority Critical patent/JPS5862275U/en
Publication of JPS5862275U publication Critical patent/JPS5862275U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの考案の一実施例を示す一部を切欠した側面
図、第2図はこの考案が適用される被検査プリン7ト回
路板の一部を省略した平面図、第3図はこの考案の他の
実施例を示す要部の側面図である。 1・・・・・・検査器、2・・・・・・ソケット支持板
、3・・・・・・被検査プリント回路板、4・・曲スル
ーホール、5・・・・・・貫通孔、6・・・・・・ソケ
ット、7・・・・・・おねじ、12・・・・・・プロー
ブピン。
Fig. 1 is a partially cutaway side view showing an embodiment of this invention, Fig. 2 is a partially omitted plan view of a printed circuit board to be inspected to which this invention is applied, and Fig. 3 is a partially cutaway side view showing an embodiment of this invention. It is a side view of the main part which shows another Example of this invention. 1... Inspection device, 2... Socket support plate, 3... Printed circuit board to be inspected, 4... Bent through hole, 5... Through hole , 6...Socket, 7...Male thread, 12...Probe pin.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 先端にプローブピア′12が嵌着されるとともに外周に
おねじ7が形成された多数のソケット6が、ソケット支
持板2を貫通したおねじによってソケット支持板に固定
されたプリント回路板検査用プローブピンソケットの固
定構造。
A printed circuit board inspection probe in which a large number of sockets 6 each having a probe pier '12 fitted to the tip and having screws 7 formed on the outer periphery are fixed to a socket support plate by male screws passing through the socket support plate 2. Fixed structure of pin socket.
JP15674981U 1981-10-21 1981-10-21 Fixing structure of probe pin socket for printed circuit board inspection Pending JPS5862275U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15674981U JPS5862275U (en) 1981-10-21 1981-10-21 Fixing structure of probe pin socket for printed circuit board inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15674981U JPS5862275U (en) 1981-10-21 1981-10-21 Fixing structure of probe pin socket for printed circuit board inspection

Publications (1)

Publication Number Publication Date
JPS5862275U true JPS5862275U (en) 1983-04-26

Family

ID=29949282

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15674981U Pending JPS5862275U (en) 1981-10-21 1981-10-21 Fixing structure of probe pin socket for printed circuit board inspection

Country Status (1)

Country Link
JP (1) JPS5862275U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62257066A (en) * 1986-05-01 1987-11-09 Yamaichi Seiko:Kk Rotary type flexible contact probe
JP2015001448A (en) * 2013-06-14 2015-01-05 三菱電機株式会社 Probe device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62257066A (en) * 1986-05-01 1987-11-09 Yamaichi Seiko:Kk Rotary type flexible contact probe
JP2015001448A (en) * 2013-06-14 2015-01-05 三菱電機株式会社 Probe device

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