JPS59134070U - Contact probe pin for printed circuit board inspection - Google Patents

Contact probe pin for printed circuit board inspection

Info

Publication number
JPS59134070U
JPS59134070U JP2590283U JP2590283U JPS59134070U JP S59134070 U JPS59134070 U JP S59134070U JP 2590283 U JP2590283 U JP 2590283U JP 2590283 U JP2590283 U JP 2590283U JP S59134070 U JPS59134070 U JP S59134070U
Authority
JP
Japan
Prior art keywords
printed circuit
circuit board
contact probe
probe pin
board inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2590283U
Other languages
Japanese (ja)
Inventor
佐藤 正吉
Original Assignee
株式会社河合楽器製作所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社河合楽器製作所 filed Critical 株式会社河合楽器製作所
Priority to JP2590283U priority Critical patent/JPS59134070U/en
Publication of JPS59134070U publication Critical patent/JPS59134070U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、検査時のプリント基板とコンタクトプローブ
ピンとの接続関係を示す図、第2図A及びB乃至第4図
は従来のプリント基板検査用コンタクトプローブピンの
拡大平面図及び側面図、第5図A及びB1100A及び
Bはそれぞれ本考案の実施例の拡大平面図及び側面図、
第7因は第5図A及びBに示すコンタクトプローブピン
にプリント基板を載置した状態を示す要部側面図である
。 1・・・先端部、2・・・円錐形、3・・・溝。
FIG. 1 is a diagram showing the connection relationship between a printed circuit board and contact probe pins during inspection; FIGS. 2A and B to FIG. 4 are enlarged plan and side views of conventional contact probe pins for inspecting printed circuit boards; 5A and B1100A and B are respectively an enlarged plan view and a side view of an embodiment of the present invention;
The seventh factor is a side view of main parts showing a state in which a printed circuit board is placed on the contact probe pins shown in FIGS. 5A and 5B. 1...Tip, 2...Conical shape, 3...Groove.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 電気部品のリード端子がはんだ付けされたプリント基板
の接続部に接触し、該プリント基板を支持する式のコン
タクトプローブピンにおいて一先端部が円錐形に形成さ
れると共に、該先端面に中心から周縁に至る溝が3個乃
至5個形成されたことを特徴とするプリント基板検査用
コンタクトプローブピン。
In a contact probe pin of the type that supports the printed circuit board by contacting the connection part of the printed circuit board to which the lead terminal of the electrical component is soldered, one tip part is formed into a conical shape, and the tip part is formed in a conical shape. A contact probe pin for printed circuit board inspection, characterized in that three to five grooves are formed therein.
JP2590283U 1983-02-25 1983-02-25 Contact probe pin for printed circuit board inspection Pending JPS59134070U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2590283U JPS59134070U (en) 1983-02-25 1983-02-25 Contact probe pin for printed circuit board inspection

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2590283U JPS59134070U (en) 1983-02-25 1983-02-25 Contact probe pin for printed circuit board inspection

Publications (1)

Publication Number Publication Date
JPS59134070U true JPS59134070U (en) 1984-09-07

Family

ID=30156874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2590283U Pending JPS59134070U (en) 1983-02-25 1983-02-25 Contact probe pin for printed circuit board inspection

Country Status (1)

Country Link
JP (1) JPS59134070U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007218675A (en) * 2006-02-15 2007-08-30 Fujitsu Ltd Probe, and manufacturing method of probe
JP2013174626A (en) * 2013-06-14 2013-09-05 Hioki Ee Corp Contact probe

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007218675A (en) * 2006-02-15 2007-08-30 Fujitsu Ltd Probe, and manufacturing method of probe
JP2013174626A (en) * 2013-06-14 2013-09-05 Hioki Ee Corp Contact probe

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