JPS62108874U - - Google Patents
Info
- Publication number
- JPS62108874U JPS62108874U JP19916485U JP19916485U JPS62108874U JP S62108874 U JPS62108874 U JP S62108874U JP 19916485 U JP19916485 U JP 19916485U JP 19916485 U JP19916485 U JP 19916485U JP S62108874 U JPS62108874 U JP S62108874U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- printed wiring
- circuit pattern
- contact
- wiring board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 11
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第１図は、本考案によるプリント配線板の導通
検査装置を示す側面図、第２図は、導通検査時の
状態を示す側面図、第３図は、被検体のプリント
配線板の１例を示す平面図である。
１……位置決めピン、２……接触探針（プロー
ブ）、３……配線、４……電子制御器を含む測
定器、５……先端が導電性ゴムより成る接触探針
（プローブ）、６……プローブヘツド、７……
プローブヘツド、８……プローブを上下動させ
るためのエアープツシヤー及びバネ、９……バネ
、１０……プリント配線板、１１……位置決め穴
、１２……ステツチ部、１３……端子、１４……
スルホール。
Fig. 1 is a side view showing a continuity testing device for a printed wiring board according to the present invention, Fig. 2 is a side view showing the state during continuity testing, and Fig. 3 is an example of a printed wiring board to be tested. FIG. 1... Positioning pin, 2... Contact probe (probe), 3... Wiring, 4... Measuring device including electronic controller, 5... Contact probe (probe) whose tip is made of conductive rubber, 6 ...Probe head, 7...
Probe head, 8... Air pusher and spring for moving the probe up and down, 9... Spring, 10... Printed wiring board, 11... Positioning hole, 12... Stitch portion, 13... Terminal, 14...
Thru hole.
Claims (1)
ント配線板の回路パターン外周部の端子およびス
ルホール部分に対応する位置に配置された、複数
の接触探針（プローブ）および被検体の微細な
回路パターン（ステツチ部）に対応する位置に配
置された導電性ゴムよりなる接触探針（プローブ
）を有し、そのプローブおよびプローブを
被検体であるプリント配線板の回路パターンに別
々又は同時に接触させる構造を有することを特徴
とするプリント配線板の導通検査装置。 A plurality of contact probes are placed at positions corresponding to terminals and through-holes on the outer periphery of the circuit pattern of a printed wiring board having a fine circuit pattern to be tested. It has a contact probe made of conductive rubber arranged at a position corresponding to part), and has a structure in which the probe and the probe are brought into contact with the circuit pattern of the printed wiring board that is the test object, either separately or simultaneously. A continuity testing device for printed wiring boards characterized by:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19916485U JPS62108874U (en) | 1985-12-26 | 1985-12-26 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP19916485U JPS62108874U (en) | 1985-12-26 | 1985-12-26 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS62108874U true JPS62108874U (en) | 1987-07-11 |
Family
ID=31160531
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP19916485U Pending JPS62108874U (en) | 1985-12-26 | 1985-12-26 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS62108874U (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63111474A (en) * | 1986-10-30 | 1988-05-16 | Eastern:Kk | Method and device for inspecting pattern of printed wiring board |
| JPH01227078A (en) * | 1988-03-07 | 1989-09-11 | Tokyo Electron Ltd | Inspecting device for glass substrate |
| JP2002189048A (en) * | 2000-12-21 | 2002-07-05 | Hioki Ee Corp | Inspection apparatus for printed wiring board |
| WO2004038435A1 (en) * | 2002-10-22 | 2004-05-06 | Sony Chemicals Corp. | Wiring board inspection device, and wiring board inspection method |
-
1985
- 1985-12-26 JP JP19916485U patent/JPS62108874U/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63111474A (en) * | 1986-10-30 | 1988-05-16 | Eastern:Kk | Method and device for inspecting pattern of printed wiring board |
| JPH01227078A (en) * | 1988-03-07 | 1989-09-11 | Tokyo Electron Ltd | Inspecting device for glass substrate |
| JP2002189048A (en) * | 2000-12-21 | 2002-07-05 | Hioki Ee Corp | Inspection apparatus for printed wiring board |
| WO2004038435A1 (en) * | 2002-10-22 | 2004-05-06 | Sony Chemicals Corp. | Wiring board inspection device, and wiring board inspection method |
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