JP2002189048A - Inspection apparatus for printed wiring board - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a printed wiring board inspecting device of elevation fixture type which saves space by simplifying the constitution of the apparatus. SOLUTION: This apparatus is provided with an upper fixture 15 and a lower fixture 35, which are individually coupled with elevation control plates 19 and 39 and arranged so as to enable probe pins 17 and 37 to freely contact and leave the top surface 2 and reverse surface of 3 of an inspected board 1 located in an apparatus body 12; and the upper fixture 15 is coupled with the elevation control plate 19 across a support rod material 22, which is freely retractable according to the contact pressure is made to be interposed, when the probe pin 17 is brought into contact with the inspected board 1 and a conductive member 29, which relatively projects through a cut part 18 formed in the upper fixture, when the support rod material 17 retracts to come into contact with the inspected board 1 is fitted to the elevation control plate 19.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a jig with a probe pin called a fixture at a predetermined position of a wiring pattern provided on a printed wiring board to be inspected.
This is a technique relating to a printed wiring board inspection apparatus used for inspecting the characteristics of a substrate to be inspected by pressing the substrate to make electrical contact with the substrate.

[0002]

2. Description of the Related Art A fixture provided in a printed wiring board inspection apparatus is generally classified into a type in which a fixture pin is lifted up and down with respect to a board to be inspected, which is fixed, and a probe pin is pressed from above or below (hereinafter, referred to as "fixed board"). And a type in which the side of the substrate to be inspected is forcibly drawn to the fixture side where the position is fixed by vacuum suction and brought into contact with the probe pins.

FIG. 5 shows a case where a double-sided printed wiring board is a substrate to be measured, in which a probe pin is brought into contact with a predetermined wiring pattern in a non-short-circuit state (open) to perform a predetermined inspection or be prepared separately. Description of a main part of a conventional example of an elevating fixture type printed wiring board inspection apparatus in which a specific wiring pattern is subjected to a required inspection under a short-circuit condition (short-circuit) by being brought into contact with a probe pin on the short-circuit side. FIG.

According to FIG. 1, a lifting fixture type printed wiring board inspection apparatus 101 has a large number of probe pins 104 erected on an upper surface 103, and is provided below a fixed substrate 1 to be measured. It has a lower fixture 102, which is disposed so as to be capable of ascending and descending control, and a large number of probe pins 107 vertically provided on a lower surface 106, so that its ascending and descending control can be freely performed above the substrate 1 to be measured. And an upper fixture 105 which is disposed as follows.

In this case, at least the upper fixture 1
The lift control plate 1 is provided with a plurality of support members 115 interposed between the lift control plate 111 and the lift control plate 111.
11 are integrated.

Further, each of the support rods 115 is loosely inserted into the compression coil spring 119 at the lower side and into the guide cylinder 120 between the compression coil spring 119 and the elevation control plate 111, respectively. And the guide cylinder 1
The lifting control plate 111 is supported under the abutment with the flange portion 121 of FIG.

The support rod 115 has an upper end 117 projecting toward the upper surface 112 through a through hole 113. On the other hand, it can be moved forward and backward without getting out.

Further, a printed wiring board inspection apparatus 101
Are cutouts 114, 1 provided separately at predetermined facing portions of the elevation control plate 111 and the upper fixture 105.
08, an air cylinder portion 122 is provided at the portion to be measured located on the upper surface 2 of the substrate to be measured 1 for controlling the vertical movement of the conductive member 124 such as a probe pin or a conductive pad for short circuit. ing. Reference numeral 125 in the drawing indicates a pressing operation rod which is disposed so as to be able to freely perform a controlled forced down with respect to the elevation control plate 111.

For this reason, the probe pins 107 of the upper fixture 105 and the probe pins 104 of the lower fixture 102 are connected to the upper surface 2 from the upper and lower directions with respect to the double-sided printed wiring board as the substrate 1 to be measured. A predetermined inspection can be performed by simultaneously making contact with the lower surface 3 under a non-short circuit state (open). Further, the conductive member 124 provided in the air cylinder portion 122 is connected to the upper surface 2 of the substrate 1 to be measured.
The required inspection can also be performed by bringing a specific wiring pattern into a short-circuit state (short-circuit) by contacting the measurement site located at the position (1).

[0010]

However, in the case of using the conventional printed wiring board inspection apparatus 101, an air cylinder portion 122 necessary for a continuity inspection in which a wiring pattern is short-circuited (short) is separately prepared. Therefore, it is necessary to route the air supply pipe 123 for that purpose, and a related device such as a compressor is separately required.
There was an inconvenience that the installation location of No. 2 became a dead space.

According to the present invention, in view of the above-mentioned problems encountered in the conventional apparatus, the components required for the continuity inspection are integrated into the fixture side to simplify the apparatus configuration, thereby saving space. It is an object to provide a printed circuit board inspection device that has been designed.

[0012]

Means for Solving the Problems The present invention has been made to achieve the above-mentioned object, and a first invention of the invention is connected to an elevating control plate which is controlled to elevate and is fixed in a main body of the apparatus. A fixture provided so that the probe pins can be freely moved into and out of contact with at least one of the upper surface and the lower surface of the substrate to be inspected. The fixture contacts the probe pins with the substrate to be inspected. While being connected to the elevation control plate via a supporting rod that can retreat in accordance with the contact pressure at the time of the retraction, it relatively protrudes through a notch provided in the fixture when retreating. There is a structural feature in that a conductive member that comes into contact with the substrate to be inspected is attached to the elevation control plate.

According to a second aspect of the present invention, a probe pin is freely connected to and separated from an upper surface and a lower surface of a substrate to be inspected which is fixed in an apparatus main body and is separately connected to a lifting control plate which is controlled to move up and down. An upper fixture and a lower fixture are provided, and either one of the upper fixture and the lower fixture has a contact pressure when the probe pin is brought into contact with the board to be inspected. The reciprocating support rod is connected to the elevation control plate via a reversible supporting rod member, and at the time of retreat, relatively protrudes through a notch provided in the fixture and is brought into conductive contact with the substrate to be inspected. There is a structural feature in that the conductive member is attached to the elevation control plate.

In any of the above inventions, it is preferable that the elevation control plate is freely movable up and down via a screw member to which a rotational force is applied by a motor whose drive is controlled.

[0015]

FIG. 1 shows a probe pin on a double-sided printed wiring board as a substrate to be measured in a non-short-circuited state (open)
Under the condition, the specified wiring pattern is brought into contact with the specified wiring pattern to perform the specified inspection, or the specified wiring pattern is short-circuited by making contact with the separately prepared short-side probe pin (short-circuit)
FIG. 4 is an explanatory diagram showing a configuration of a main part of an example of the present invention applied to an elevating fixture type configured to perform a necessary inspection under the condition.

According to FIG. 1, a printed wiring board inspection apparatus 11 such as an in-circuit tester is provided so that a probe pin 17 can be freely moved toward and away from an upper surface 2 of a substrate 1 to be inspected which is fixed in an apparatus body 12. Upper fixture 15
And probe pins 37 with respect to the lower surface 3 side of the substrate 1 to be inspected.
And the lower fixture 35, which is arranged freely to contact and separate
It is formed so as to be individually connected to the lift control plates 19 and 39 which are controlled to move up and down.

Among these, the upper fixture 15 is a supporting rod member which can retreat freely according to the contact pressure when a plurality of probe pins 17 suspended from the lower surface 16 are simultaneously brought into contact with the substrate 1 to be inspected. The lift control plate 19 is connected to the lift control plate 19 through the intermediary of the lift control plate 19.

This will be described in more detail with reference to an illustrated example. The upper fixture 15 has a plurality of supporting members 22 interposed between the upper fixture 15 and an elevating control plate 19 so that the upper supporting member 15 has a plurality of supporting members. Each of the lower end portions 22 is a fixed end, and is integrated with the lift control plate 19.

Further, each of the supporting rod members 22 is provided with a compression coil spring 25 at a lower portion, and a guide cylinder 2 between the compression coil spring 25 and the elevation control plate 19.
6, each of which is loosely inserted, and abuts against the flange portion 27 of the guide cylinder 26 to support the lifting control plate 19 side.

The upper end 24 of the support member 22 projects through the through hole 20 to the upper surface 19a of the elevation control plate 19, and the projecting portion contacts the upper surface 19a of the elevation control plate 19. The fastening member 28 made of an appropriate member is fastened, so that it can be moved forward and backward without being pulled out of the elevation control plate 19.

Further, the upper fixture 15 is provided with a notch 18 at a predetermined position. The notch 18 is provided at a predetermined position of the elevation control plate 19 facing the notch 18.
A conductive member 29 that can freely contact the upper surface 2 of the substrate 1 to be inspected via the substrate is provided.

That is, when the probe pin 17 comes into contact with the upper surface 2 of the substrate 1 to be inspected and the upper fixture 15 retreats to an appropriate position, the conductive member 29 can protrude downward through the notch 18. Is attached to the elevation control plate 19, so that it can freely contact the upper surface 2 of the substrate 1 to be inspected. The mounting structure of the conductive member 29 to the elevation control plate 19 is preferably detachable so that it can be replaced. However, a fixing structure that cannot be replaced as needed may be adopted. Although FIG. 1 shows a conductive member 29 in which a plurality of probe pins 29b are suspended from the lower surface of a base material 29a, the present invention is not limited to this. The conductive member can be formed by a pad.

As shown in FIG. 4A, the conductive member 29 can be attached to two places of the elevation control plate 19, or can be attached to more places. In this case, a number of notches 18 corresponding to the number of the conductive members 29 attached to the upper fixture 15 are also provided.

On the other hand, the lower fixture 35 is directly connected to an elevating control plate 39 which is controlled to elevate. In addition, the upper fixture 15 with respect to the elevation control plate 19,
It is preferable that the attachment structure of the lower fixture 35 to the elevation control plate 39 be detachable so that they can be exchanged with each other, but a fixing structure that cannot be exchanged as desired may be adopted.

Further, as shown in FIG. 1, the lifting and lowering control plates 19 and 39 are moved up and down by a screw member 52 to which a rotational force is applied via a coupling 53 by a motor 51 whose driving is controlled.
The control can be freely performed under an appropriate structure such as a ball screw structure screwed to each of the female screw portions 21 and 40 provided on the lifting control plates 19 and 39 respectively. In addition, the elevation control of the elevation control plates 19 and 39 is as follows.
Elevation control plates 19 and 39 are mounted on the same threaded rod which is threaded in the opposite direction in one half and one half in the vertical direction.
May be screwed together to apply a rotational force by one motor. Further, the operation may be performed by a pressing operation rod 125 shown in FIG. 5 whose operation is controlled by an air cylinder.

Further, the substrate to be measured is a single-sided printed wiring board, and the probe pins are brought into contact with a predetermined wiring pattern in a non-short-circuit state (open) to perform a predetermined inspection or to separately prepare a short-circuit side. When a required inspection is performed under a short circuit condition (short circuit) by bringing the specific wiring pattern into contact with the same probe pin, the lifting / lowering fixture type printed wiring board inspection apparatus 11 is also fixed in the apparatus main body 12. Considering one of the surfaces of the substrate 1 to be inspected, the example shown in the drawing, a fixture provided so that the probe pins 17 can be freely moved toward and away from the upper surface 2 of the substrate 1 to be inspected.
That is, the upper fixture 15 can be formed by being connected to the elevation control plate 19 that is controlled to elevate. When the above configuration is adopted, the lower surface 3 side of the substrate 1 to be inspected is supported by an appropriate support member.

The specific positional relationship between the fixture and the elevation control plate in this case is the same as the positional relationship between the upper fixture 15 and the elevation control plate 19 shown in FIG. I do.

Next, the operation of the present invention having the above-described structure will be described. As shown in FIG. 1, the substrate 1 to be measured is horizontally fixed in the apparatus main body 12 by being supported by an appropriate support member (not shown). .

Thereafter, as shown in FIG. 2, the respective motors 51 are drive-controlled to lower the lift control plate 19 side and raise the lift control plate 39 side, so that the probe pins of the upper fixture 15 are moved. Reference numeral 17 makes contact with the upper surface 2 of the substrate 1 to be inspected, and probe pins 37 of the lower fixture 35 make contact with the lower surface 3 of the substrate 1 to be inspected.

In this way, the probe pins 17 are simultaneously brought into contact with the upper surface 2 of the substrate 1 to be inspected and the probe pins 37 are brought into contact with the lower surface 3 of the substrate 1 to be inspected. In contrast, a predetermined inspection can be performed by contacting a predetermined wiring pattern under a non-short circuit state (open).

When a necessary inspection is performed under a short-circuit condition (short-circuit), the motor 51 is driven and the elevating control plate 19 is further lowered.

As a result, the contact pressure of the probe pin 17 against the substrate 1 to be measured increases, and the upper end 24 of the support rod 22 is pressed against the urging force of the compression coil spring 25 to release the increased contact pressure. Is supported by the flange portion 27 of the guide cylinder 26, and the upper surface 19 of the elevation control plate 19 is
The projection length is extended over a. That is,
As a result of the upper fixture 15 being raised and the space between the upper fixture 15 and the elevation control plate 19 being narrowed, the notch 1 of the upper fixture 15 is formed.
The conductive member 29 protrudes toward the upper surface 2 of the substrate 1 to be measured via 8, and comes into electrical contact as shown in FIG.

In this way, by bringing the conductive member 29 into contact with the upper surface 2 of the substrate 1 to be inspected, it is possible to perform a necessary inspection on a specific wiring pattern of the substrate 1 to be measured under a short circuit state (short circuit). Can be.

Therefore, by simply raising and lowering the lift control plates 19 and 39, the inspection of the substrate 1 to be measured in the non-short-circuit state (open) and the inspection in the short-circuit state (short) can be performed. Thus, it is possible to provide a lifting and lowering fixture type printed wiring board inspection apparatus which saves space by eliminating dead spaces.

Further, as shown in FIG.
When 9 is attached to two or more places on the elevation control plate 19, necessary inspections are performed for a plurality of places under a short-circuit state (short-circuit) as shown in FIG. 4B. be able to. Although not shown, when the conducting members 29 are attached with different sitting heights, the inspection required under a stepwise short-circuit state (short) divided into two or three stages. It can be performed.

The above is a description of a preferred embodiment of the present invention, and the implementation thereof is not limited to the above description. For example, the upper fixture 15
The arrangement relationship between the lower fixture 35 and the lower fixture 35 is, contrary to the illustrated example, by interposing a support rod that can retreat freely according to the contact pressure when the probe pins 37 are simultaneously brought into contact with the substrate 1 to be inspected. The lower fixture 35 may be connected to the elevation control plate 39, and the upper fixture 15 may be directly connected to the elevation control plate 19. Further, the telescopic member may be made to retreat freely in accordance with the contact pressure by incorporating a telescopic structure in the supporting rod itself connected to the vertically controlled lifting control plate.

Further, when the substrate to be inspected is a single-sided printed wiring board, it is sufficient to provide a fixture in which the probe pins can freely contact and separate only on the one side, so that the upper side in the illustrated example is sufficient. Necessary inspection can be performed only by the movement of the fixture 15 side.

[0038]

As described above, according to the present invention, the test in the non-short-circuit state (open) and the test in the short-circuit state (short) are performed on the substrate to be measured simply by raising and lowering the lift control plate. Therefore, it is possible to provide a vertically movable fixture-type printed wiring board inspection apparatus that saves space by simplifying the apparatus configuration and eliminating dead spaces.

When the conductive member is attached to a plurality of positions on the elevation control plate, necessary inspections can be performed for the plurality of positions under a short-circuit state (short circuit).

[Brief description of the drawings]

FIG. 1 is an explanatory view showing a configuration example of a main part of a second invention according to the present invention.

FIG. 2 is an explanatory diagram showing a state at the time of a non-conductivity test for the example shown in FIG. 1;

FIG. 3 is an explanatory diagram showing a state during a continuity test for the example shown in FIG. 1;

FIG. 4 is an explanatory view showing another example of the second invention of the present invention, wherein (a) shows a state at the time of non-inspection;
(B) shows the state at the time of the continuity test.

FIG. 5 is an explanatory view of a main part showing a conventional example of a lifting / lowering fixture type printed wiring board inspection apparatus when the substrate to be measured is a double-sided printed wiring board.

[Explanation of symbols]

 REFERENCE SIGNS LIST 1 substrate to be measured 2 upper surface 3 lower surface 11 printed wiring board inspection device 12 device main body 15 upper fixture 16 lower surface 17 probe pin 18 notch portion 19 elevating control plate 19a upper surface 20 through hole 21 female screw portion 22 support rod member 23 lower end portion 24 upper end Part 25 Coil spring for compression 26 Guide cylinder 27 Flange part 28 Hook material 29 Conductive member 29a base material 29b Probe pin 35 Upper fixture 36 Upper surface 37 Probe pin 39 Elevation control plate 40 Female screw part 51 Motor 52 Thread member 53 Coupling 101 Printed wiring board inspection device 102 Lower fixture 103 Upper surface 104 Probe pin 105 Upper fixture 106 Lower surface 107 Probe pin 108 Notch 111 Lift control plate 112 Upper surface 113 Through hole 114 Notch 115 Support rod 116 Lower end 117 upper portion 118 Kaketomezai 119 compression coil spring 120 guide tube 121 flange portion 122 the air cylinder unit 123 the air supply pipe 124 conductive member 125 pushing the operating member

Claims (3)

[Claims] 1. A probe pin connected to an elevation control plate that is controlled to elevate, and allows a probe pin to freely contact and separate with at least one of an upper surface and a lower surface of a substrate to be inspected that is fixed in an apparatus main body. The fixture is provided, and the fixture is connected to the elevation control plate via a support rod that can retreat in accordance with the contact pressure when the probe pin is brought into contact with the substrate to be inspected. A printed circuit board inspection apparatus, wherein a conductive member that protrudes relatively through a notch provided in the fixture and comes into contact with the substrate to be inspected is attached to the elevation control plate when the regression is performed. . 2. An upper side, which is separately connected to an elevation control board whose elevation is controlled, and which is arranged such that probe pins can freely contact and separate from an upper surface side and a lower surface side of a substrate to be inspected which is fixed in the apparatus main body. It has a fixture and a lower fixture, and either one of the upper fixture and the lower fixture can retreat freely according to the contact pressure when the probe pins are brought into contact with the board to be inspected. The lifting and lowering control plate is connected with a supporting rod interposed therebetween, and at the time of retreat, a conductive member which protrudes relatively through a notch provided in the fixture and comes into contact with the substrate to be inspected is moved up and down. A printed wiring board inspection device which is attached to a control board. 3. The print according to claim 1, wherein the elevation control plate is freely moved up and down via a screw member to which a rotational force is applied by a motor whose drive is controlled. Wiring board inspection equipment.