JP2002189048A - Inspection apparatus for printed wiring board - Google Patents
Inspection apparatus for printed wiring boardInfo
- Publication number
- JP2002189048A JP2002189048A JP2000388163A JP2000388163A JP2002189048A JP 2002189048 A JP2002189048 A JP 2002189048A JP 2000388163 A JP2000388163 A JP 2000388163A JP 2000388163 A JP2000388163 A JP 2000388163A JP 2002189048 A JP2002189048 A JP 2002189048A
- Authority
- JP
- Japan
- Prior art keywords
- fixture
- contact
- control plate
- inspected
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
【0001】[0001]
【発明の属する技術分野】本発明は、被検査基板である
プリント配線板が備える配線パターンの所定位置にフィ
クスチャと称されるプローブピン付きの治具(以下、
「フィクスチャ」という)を押し当てて電気的に接触さ
せ、当該被検査基板上の必要情報を取り込むことにより
その特性を検査する際に用いられるプリント配線板検査
装置に関する技術である。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a jig with a probe pin called a fixture at a predetermined position of a wiring pattern provided on a printed wiring board to be inspected.
This is a technique relating to a printed wiring board inspection apparatus used for inspecting the characteristics of a substrate to be inspected by pressing the substrate to make electrical contact with the substrate.
【0002】[0002]
【従来の技術】プリント配線板検査装置が備えるフィク
スチャには、大別すると定置されている被検査基板に対
しフィクスチャの側を昇降させてプローブピンを上や下
から押し当てるタイプ(以下、「昇降フィクスチャタイ
プ」という)のものと、真空吸引により被検査基板の側
を位置固定されているフィクスチャの側に強制的に引き
寄せてプローブピンに接触させるタイプのものとがあ
る。2. Description of the Related Art A fixture provided in a printed wiring board inspection apparatus is generally classified into a type in which a fixture pin is lifted up and down with respect to a board to be inspected, which is fixed, and a probe pin is pressed from above or below (hereinafter, referred to as "fixed board"). And a type in which the side of the substrate to be inspected is forcibly drawn to the fixture side where the position is fixed by vacuum suction and brought into contact with the probe pins.
【0003】図5は、両面プリント配線板が被測定基板
であって、プローブピンを非短絡状態(オープン)のも
とで所定の配線パターンに接触させて所定の検査をした
り、別途用意される短絡側のプローブピンともども接触
させて特定の配線パターンを短絡状態(ショート)のも
とで必要な検査を行うようにした昇降フィクスチャタイ
プのプリント配線板検査装置の従来例を示す要部説明図
である。FIG. 5 shows a case where a double-sided printed wiring board is a substrate to be measured, in which a probe pin is brought into contact with a predetermined wiring pattern in a non-short-circuit state (open) to perform a predetermined inspection or be prepared separately. Description of a main part of a conventional example of an elevating fixture type printed wiring board inspection apparatus in which a specific wiring pattern is subjected to a required inspection under a short-circuit condition (short-circuit) by being brought into contact with a probe pin on the short-circuit side. FIG.
【0004】同図によれば、昇降フィクスチャタイプの
プリント配線板検査装置101は、上面103に立設さ
れた多数本のプローブピン104を有して、定置されて
いる被測定基板1の下方にその昇降制御が自在となって
配設される下側フィクスチャ102と、下面106に垂
設された多数本のプローブピン107を有して、被測定
基板1の上方にその昇降制御が自在となって配設される
上側フィクスチャ105とを備えている。According to FIG. 1, a lifting fixture type printed wiring board inspection apparatus 101 has a large number of probe pins 104 erected on an upper surface 103, and is provided below a fixed substrate 1 to be measured. It has a lower fixture 102, which is disposed so as to be capable of ascending and descending control, and a large number of probe pins 107 vertically provided on a lower surface 106, so that its ascending and descending control can be freely performed above the substrate 1 to be measured. And an upper fixture 105 which is disposed as follows.
【0005】この場合、少なくとも上側フィクスチャ1
05は、上方に配置される昇降制御板111との間に複
数本の支杆材115を介在させることにより、該支杆材
115の各下端部116側を固定端として昇降制御板1
11と一体化されている。In this case, at least the upper fixture 1
The lift control plate 1 is provided with a plurality of support members 115 interposed between the lift control plate 111 and the lift control plate 111.
11 are integrated.
【0006】しかも、該支杆材115のそれぞれは、下
側部にて圧縮用コイルスプリング119に、該圧縮用コ
イルスプリング119と昇降制御板111との間にてガ
イド筒120にそれぞれ遊挿されており、該ガイド筒1
20のフランジ部121と当接して昇降制御板111が
下支えされている。Further, each of the support rods 115 is loosely inserted into the compression coil spring 119 at the lower side and into the guide cylinder 120 between the compression coil spring 119 and the elevation control plate 111, respectively. And the guide cylinder 1
The lifting control plate 111 is supported under the abutment with the flange portion 121 of FIG.
【0007】また、支杆材115は、上端部117が通
孔113を介してその上面112側に突出しており、こ
の突出部位に掛止材118を止着することにより、昇降
制御板111に対して抜脱することなく進退自在となっ
て配設されている。The support rod 115 has an upper end 117 projecting toward the upper surface 112 through a through hole 113. On the other hand, it can be moved forward and backward without getting out.
【0008】さらに、プリント配線板検査装置101
は、昇降制御板111と上側フィクスチャ105との所
定の対面部位に各別に設けられている切欠部114,1
08を介することにより、被測定基板1の上面2に位置
する被測定部位に対短絡用のプローブピンや導通パッド
などからなる導通部材124の接離を自在に昇降制御す
るエアシリンダ部122を備えている。なお、図中の符
号125は、昇降制御板111に対し制御された強制的
な押下げを自在に配設された押圧作動杆を示す。Further, a printed wiring board inspection apparatus 101
Are cutouts 114, 1 provided separately at predetermined facing portions of the elevation control plate 111 and the upper fixture 105.
08, an air cylinder portion 122 is provided at the portion to be measured located on the upper surface 2 of the substrate to be measured 1 for controlling the vertical movement of the conductive member 124 such as a probe pin or a conductive pad for short circuit. ing. Reference numeral 125 in the drawing indicates a pressing operation rod which is disposed so as to be able to freely perform a controlled forced down with respect to the elevation control plate 111.
【0009】このため、被測定基板1である両面プリン
ト配線板に対しては、上側フィクスチャ105のプロー
ブピン107と、下側フィクスチャ102のプローブピ
ン104とを、上下双方向から上面2と下面3とに対し
非短絡状態(オープン)のもとで同時に接触させること
により、所定の検査ができる。さらに、エアシリンダ部
122が備える導通部材124を被測定基板1の上面2
に位置する被測定部位に接触させることにより、特定の
配線パターンを短絡状態(ショート)とすることで必要
な検査を行うこともできる。For this reason, the probe pins 107 of the upper fixture 105 and the probe pins 104 of the lower fixture 102 are connected to the upper surface 2 from the upper and lower directions with respect to the double-sided printed wiring board as the substrate 1 to be measured. A predetermined inspection can be performed by simultaneously making contact with the lower surface 3 under a non-short circuit state (open). Further, the conductive member 124 provided in the air cylinder portion 122 is connected to the upper surface 2 of the substrate 1 to be measured.
The required inspection can also be performed by bringing a specific wiring pattern into a short-circuit state (short-circuit) by contacting the measurement site located at the position (1).
【0010】[0010]
【発明が解決しようとする課題】しかし、従来からある
プリント配線板検査装置101による場合には、配線パ
ターンを短絡状態(ショート)とする導通検査のために
必要なエアシリンダ部122を別途に用意しなければな
らず、そのための給気管123を引き回す必要が生じた
り、コンプレッサ等の関連装置が別途に必要になるほ
か、スペース的な余裕がないなかでエアシリンダ部12
2の設置箇所がデッドスペースとなってしまうなどの不
都合があった。However, in the case of using the conventional printed wiring board inspection apparatus 101, an air cylinder portion 122 necessary for a continuity inspection in which a wiring pattern is short-circuited (short) is separately prepared. Therefore, it is necessary to route the air supply pipe 123 for that purpose, and a related device such as a compressor is separately required.
There was an inconvenience that the installation location of No. 2 became a dead space.
【0011】本発明は、従来装置にみられた上記課題に
鑑み、上記導通検査に必要となる構成部材をフィクスチ
ャ側に一体的に組み込んで装置構成を簡素化することに
より、省スペース化を図ったプリント配線板検査装置を
提供することに目的がある。According to the present invention, in view of the above-mentioned problems encountered in the conventional apparatus, the components required for the continuity inspection are integrated into the fixture side to simplify the apparatus configuration, thereby saving space. It is an object to provide a printed circuit board inspection device that has been designed.
【0012】[0012]
【課題を解決するための手段】本発明は、上記目的を達
成すべくなされたものであり、そのうちの第1の発明
は、昇降制御された昇降制御板に連結されて、装置本体
内に定置される被検査基板の上面と下面との少なくとも
いずれか一方の側の面に対するプローブピンの接離を自
在に配設されたフィクスチャを備え、該フィクスチャ
は、被検査基板にプローブピンを接触させた際の接触圧
に応じた退行が自在な支杆材を介在させて前記昇降制御
板と連結させるとともに、その退行時に、当該フィクス
チャに設けられた切欠部を介して相対的に突出して前記
被検査基板と接触する導通部材を、前記昇降制御板に取
り付けたことに構成上の特徴がある。Means for Solving the Problems The present invention has been made to achieve the above-mentioned object, and a first invention of the invention is connected to an elevating control plate which is controlled to elevate and is fixed in a main body of the apparatus. A fixture provided so that the probe pins can be freely moved into and out of contact with at least one of the upper surface and the lower surface of the substrate to be inspected. The fixture contacts the probe pins with the substrate to be inspected. While being connected to the elevation control plate via a supporting rod that can retreat in accordance with the contact pressure at the time of the retraction, it relatively protrudes through a notch provided in the fixture when retreating. There is a structural feature in that a conductive member that comes into contact with the substrate to be inspected is attached to the elevation control plate.
【0013】また、第2の発明は、昇降制御された昇降
制御板に各別に連結されて、装置本体内に定置される被
検査基板の上面側と下面側とに対するプローブピンの接
離を自在に配設された上側フィクスチャと下側フィクス
チャとを備え、これら上側フィクスチャと下側フィクス
チャとのいずれか一方の側は、被検査基板にプローブピ
ンを接触させた際の接触圧に応じた退行が自在な支杆材
を介在させて昇降制御板と連結させるとともに、その退
行時に、当該フィクスチャに設けられた切欠部を介して
相対的に突出して前記被検査基板と導通接触する導通部
材を、前記昇降制御板に取り付けたことことに構成上の
特徴がある。According to a second aspect of the present invention, a probe pin is freely connected to and separated from an upper surface and a lower surface of a substrate to be inspected which is fixed in an apparatus main body and is separately connected to a lifting control plate which is controlled to move up and down. An upper fixture and a lower fixture are provided, and either one of the upper fixture and the lower fixture has a contact pressure when the probe pin is brought into contact with the board to be inspected. The reciprocating support rod is connected to the elevation control plate via a reversible supporting rod member, and at the time of retreat, relatively protrudes through a notch provided in the fixture and is brought into conductive contact with the substrate to be inspected. There is a structural feature in that the conductive member is attached to the elevation control plate.
【0014】なお、上記いずれの発明においても、前記
昇降制御板は、駆動制御されたモータにより回転力が付
与される螺杆材を介してその昇降を自在に配設するのが
好ましい。In any of the above inventions, it is preferable that the elevation control plate is freely movable up and down via a screw member to which a rotational force is applied by a motor whose drive is controlled.
【0015】[0015]
【発明の実施の形態】図1は、被測定基板である両面プ
リント配線板にプローブピンを非短絡状態(オープン)
のもとで所定の配線パターンに接触させて所定の検査を
したり、別途用意される短絡側のプローブピンともども
接触させて特定の配線パターンを短絡状態(ショート)
のもとで必要な検査を行うようにした昇降フィクスチャ
タイプに適用した、本発明の一例についての要部構成を
示す説明図である。FIG. 1 shows a probe pin on a double-sided printed wiring board as a substrate to be measured in a non-short-circuited state (open)
Under the condition, the specified wiring pattern is brought into contact with the specified wiring pattern to perform the specified inspection, or the specified wiring pattern is short-circuited by making contact with the separately prepared short-side probe pin (short-circuit)
FIG. 4 is an explanatory diagram showing a configuration of a main part of an example of the present invention applied to an elevating fixture type configured to perform a necessary inspection under the condition.
【0016】同図によれば、インサーキットテスタなど
のプリント配線板検査装置11は、装置本体12内に定
置される被検査基板1の上面2側に対するプローブピン
17の接離を自在に配設された上側フィクスチャ15
と、被検査基板1の下面3側に対するプローブピン37
の接離を自在に配設された下側フィクスチャ35とを、
昇降制御された昇降制御板19,39に各別に連結させ
て形成されている。According to FIG. 1, a printed wiring board inspection apparatus 11 such as an in-circuit tester is provided so that a probe pin 17 can be freely moved toward and away from an upper surface 2 of a substrate 1 to be inspected which is fixed in an apparatus body 12. Upper fixture 15
And probe pins 37 with respect to the lower surface 3 side of the substrate 1 to be inspected.
And the lower fixture 35, which is arranged freely to contact and separate
It is formed so as to be individually connected to the lift control plates 19 and 39 which are controlled to move up and down.
【0017】このうち、上側フィクスチャ15は、その
下面16に垂設された複数本のプローブピン17を被検
査基板1に同時接触させた際の接触圧に応じた退行が自
在な支杆材22を介在させて昇降制御板19と連結され
ている。Among these, the upper fixture 15 is a supporting rod member which can retreat freely according to the contact pressure when a plurality of probe pins 17 suspended from the lower surface 16 are simultaneously brought into contact with the substrate 1 to be inspected. The lift control plate 19 is connected to the lift control plate 19 through the intermediary of the lift control plate 19.
【0018】これを図示例に従いさらに詳しく説明すれ
ば、上側フィクスチャ15は、上方に配置される昇降制
御板19との間に複数本の支杆材22を介在させること
により、該支杆材22の各下端部23側を固定端として
昇降制御板19と一体化されている。This will be described in more detail with reference to an illustrated example. The upper fixture 15 has a plurality of supporting members 22 interposed between the upper fixture 15 and an elevating control plate 19 so that the upper supporting member 15 has a plurality of supporting members. Each of the lower end portions 22 is a fixed end, and is integrated with the lift control plate 19.
【0019】しかも、該支杆材22のそれぞれは、下側
部にて圧縮用コイルスプリング25に、該圧縮用コイル
スプリング25と昇降制御板19との間にてガイド筒2
6にそれぞれ遊挿されており、該ガイド筒26のフラン
ジ部27と当接して昇降制御板19の側が下支えされて
いる。Further, each of the supporting rod members 22 is provided with a compression coil spring 25 at a lower portion, and a guide cylinder 2 between the compression coil spring 25 and the elevation control plate 19.
6, each of which is loosely inserted, and abuts against the flange portion 27 of the guide cylinder 26 to support the lifting control plate 19 side.
【0020】また、支杆材22は、その上端部24が通
孔20を介して昇降制御板19の上面19a側に突出し
ており、この突出部位に昇降制御板19の上面19a側
と当接する適宜の部材からなる掛止材28を止着するこ
とにより、昇降制御板19に対して抜脱することなく進
退自在となって配設されている。The upper end 24 of the support member 22 projects through the through hole 20 to the upper surface 19a of the elevation control plate 19, and the projecting portion contacts the upper surface 19a of the elevation control plate 19. The fastening member 28 made of an appropriate member is fastened, so that it can be moved forward and backward without being pulled out of the elevation control plate 19.
【0021】さらに、上側フィクスチャ15には、所定
の部位に切欠部18が設けられており、該切欠部18と
対面する昇降制御板19の所定位置には、同切欠部18
を介して被検査基板1の上面2への接触が自在となった
導通部材29が配設されている。Further, the upper fixture 15 is provided with a notch 18 at a predetermined position. The notch 18 is provided at a predetermined position of the elevation control plate 19 facing the notch 18.
A conductive member 29 that can freely contact the upper surface 2 of the substrate 1 to be inspected via the substrate is provided.
【0022】つまり、該導通部材29は、プローブピン
17が被検査基板1の上面2に接触して上側フィクスチ
ャ15が適宜位置にまで退行した際、切欠部18を介し
て下方に突出し得る高さが付与されて昇降制御板19に
取り付けられているので、被検査基板1の上面2への接
触が自在となっている。該昇降制御板19に対する導通
部材29の取付け構造は、交換できるように着脱自在と
するのが好ましいが、所望に応じて交換できない固着構
造を採用するものであってもよい。なお、図1には、基
材29aの下面に複数本のプローブピン29bが垂設さ
れてなる導通部材29が示されているが、これに限られ
るものではなく、例えば面として導通接触する導通パッ
ドにより導通部材を形成することもできる。That is, when the probe pin 17 comes into contact with the upper surface 2 of the substrate 1 to be inspected and the upper fixture 15 retreats to an appropriate position, the conductive member 29 can protrude downward through the notch 18. Is attached to the elevation control plate 19, so that it can freely contact the upper surface 2 of the substrate 1 to be inspected. The mounting structure of the conductive member 29 to the elevation control plate 19 is preferably detachable so that it can be replaced. However, a fixing structure that cannot be replaced as needed may be adopted. Although FIG. 1 shows a conductive member 29 in which a plurality of probe pins 29b are suspended from the lower surface of a base material 29a, the present invention is not limited to this. The conductive member can be formed by a pad.
【0023】また、導通部材29は、図4(a)に示す
ように昇降制御板19の2箇所に取り付けたり、それ以
上の箇所に取り付けることもできる。この場合、導通部
材29の取付け個数に応じて上側フィクスチャ15にも
対応する個数の切欠部18が設けられることになる。As shown in FIG. 4A, the conductive member 29 can be attached to two places of the elevation control plate 19, or can be attached to more places. In this case, a number of notches 18 corresponding to the number of the conductive members 29 attached to the upper fixture 15 are also provided.
【0024】一方、下側フィクスチャ35は、昇降制御
された昇降制御板39に対し直に連結されている。な
お、昇降制御板19に対する上側フィクスチャ15と、
昇降制御板39に対する下側フィクスチャ35との取付
け構造は、それぞれが交換できるように着脱自在とする
のが好ましいが、所望に応じて交換できない固着構造を
採用するものであってもよい。On the other hand, the lower fixture 35 is directly connected to an elevating control plate 39 which is controlled to elevate. In addition, the upper fixture 15 with respect to the elevation control plate 19,
It is preferable that the attachment structure of the lower fixture 35 to the elevation control plate 39 be detachable so that they can be exchanged with each other, but a fixing structure that cannot be exchanged as desired may be adopted.
【0025】また、昇降制御板19,39の昇降は、図
1に示すように駆動制御されたモータ51によりカップ
リング53を介して回転力が付与される螺杆材52を、
昇降制御板19,39に各別に設けられている雌ねじ部
21,40のそれぞれに螺合させたボールねじ構造など
の適宜構造のもとでその制御が自在となって行われるこ
とになる。なお、昇降制御板19,39の昇降制御は、
上下方向での一側半分の部位と他側半部の部位とに逆方
向のねじを切った同一の螺杆材に昇降制御板19,39
を螺合させ、1個のモータにより回転力を付与して行う
ものであってもよい。また、エアシリンダによりその作
動が制御される図5に示す押圧作動杆125により行わ
せるものであってもよい。Further, as shown in FIG. 1, the lifting and lowering control plates 19 and 39 are moved up and down by a screw member 52 to which a rotational force is applied via a coupling 53 by a motor 51 whose driving is controlled.
The control can be freely performed under an appropriate structure such as a ball screw structure screwed to each of the female screw portions 21 and 40 provided on the lifting control plates 19 and 39 respectively. In addition, the elevation control of the elevation control plates 19 and 39 is as follows.
Elevation control plates 19 and 39 are mounted on the same threaded rod which is threaded in the opposite direction in one half and one half in the vertical direction.
May be screwed together to apply a rotational force by one motor. Further, the operation may be performed by a pressing operation rod 125 shown in FIG. 5 whose operation is controlled by an air cylinder.
【0026】さらに、被測定基板が片面プリント配線板
であり、プローブピンを非短絡状態(オープン)のもと
で所定の配線パターンに接触させて所定の検査をした
り、別途用意される短絡側のプローブピンともども接触
させて特定の配線パターンを短絡状態(ショート)のも
とで必要な検査を行う場合には、昇降フィクスチャタイ
プのプリント配線板検査装置11も、装置本体12内に
定置される被検査基板1のいずれか一方の面、図示例を
参酌するならば、被検査基板1の上面2側に対するプロ
ーブピン17の接離を自在に配設されたフィクスチャ、
つまり上側フィクスチャ15を昇降制御された昇降制御
板19に連結させて形成することもできる。なお、上記
構成を採用する場合、被検査基板1の下面3側は、適宜
の支持部材により下支えされることになる。Further, the substrate to be measured is a single-sided printed wiring board, and the probe pins are brought into contact with a predetermined wiring pattern in a non-short-circuit state (open) to perform a predetermined inspection or to separately prepare a short-circuit side. When a required inspection is performed under a short circuit condition (short circuit) by bringing the specific wiring pattern into contact with the same probe pin, the lifting / lowering fixture type printed wiring board inspection apparatus 11 is also fixed in the apparatus main body 12. Considering one of the surfaces of the substrate 1 to be inspected, the example shown in the drawing, a fixture provided so that the probe pins 17 can be freely moved toward and away from the upper surface 2 of the substrate 1 to be inspected.
That is, the upper fixture 15 can be formed by being connected to the elevation control plate 19 that is controlled to elevate. When the above configuration is adopted, the lower surface 3 side of the substrate 1 to be inspected is supported by an appropriate support member.
【0027】この場合におけるフィクスチャと昇降制御
板との間の具体的な配置関係は、図1に示す上側フィク
スチャ15と昇降制御板19との間の配置関係と同じな
ので、その説明を省略する。The specific positional relationship between the fixture and the elevation control plate in this case is the same as the positional relationship between the upper fixture 15 and the elevation control plate 19 shown in FIG. I do.
【0028】次に、上記構成からなる本発明の作用を説
明すれば、図1に示すように図示しない適宜の支持部材
に支持させて装置本体12内に被測定基板1を水平方向
に定置させる。Next, the operation of the present invention having the above-described structure will be described. As shown in FIG. 1, the substrate 1 to be measured is horizontally fixed in the apparatus main body 12 by being supported by an appropriate support member (not shown). .
【0029】しかる後、図2に示すようにそれぞれのモ
ータ51を駆動制御して昇降制御板19の側は下降さ
せ、昇降制御板39の側は上昇させることにより、上側
フィクスチャ15のプローブピン17は被検査基板1の
上面2に、下側フィクスチャ35のプローブピン37は
被検査基板1の下面3にそれぞれ接触させる。Thereafter, as shown in FIG. 2, the respective motors 51 are drive-controlled to lower the lift control plate 19 side and raise the lift control plate 39 side, so that the probe pins of the upper fixture 15 are moved. Reference numeral 17 makes contact with the upper surface 2 of the substrate 1 to be inspected, and probe pins 37 of the lower fixture 35 make contact with the lower surface 3 of the substrate 1 to be inspected.
【0030】このようにして被検査基板1の上面2には
プローブピン17を、被検査基板1の下面3にはプロー
ブピン37を同時に接触させることにより、被測定基板
1である両面プリント配線板に対し非短絡状態(オープ
ン)のもとで所定の配線パターンに接触させて所定の検
査をすることができる。In this way, the probe pins 17 are simultaneously brought into contact with the upper surface 2 of the substrate 1 to be inspected and the probe pins 37 are brought into contact with the lower surface 3 of the substrate 1 to be inspected. In contrast, a predetermined inspection can be performed by contacting a predetermined wiring pattern under a non-short circuit state (open).
【0031】また、短絡状態(ショート)のもとで必要
な検査を行う場合には、モータ51を駆動制御して昇降
制御板19をさらに下降させる。When a necessary inspection is performed under a short-circuit condition (short-circuit), the motor 51 is driven and the elevating control plate 19 is further lowered.
【0032】これにより、被測定基板1に対するプロー
ブピン17の接触圧は増加し、この増加する接触圧を逃
がすために圧縮用コイルスプリング25の付勢力に抗し
て支杆材22の上端部24がガイド筒26のフランジ部
27に下支えされた状態で、昇降制御板19の上面19
a上にその突出長を長くして突出するに至る。つまり、
上側フィクスチャ15が上昇して昇降制御板19との間
の間隔が狭まる結果、上側フィクスチャ15の切欠部1
8を介して導通部材29が被測定基板1の上面2側に突
出し、図3に示すように電気的に接触するに至る。As a result, the contact pressure of the probe pin 17 against the substrate 1 to be measured increases, and the upper end 24 of the support rod 22 is pressed against the urging force of the compression coil spring 25 to release the increased contact pressure. Is supported by the flange portion 27 of the guide cylinder 26, and the upper surface 19 of the elevation control plate 19 is
The projection length is extended over a. That is,
As a result of the upper fixture 15 being raised and the space between the upper fixture 15 and the elevation control plate 19 being narrowed, the notch 1 of the upper fixture 15 is formed.
The conductive member 29 protrudes toward the upper surface 2 of the substrate 1 to be measured via 8, and comes into electrical contact as shown in FIG.
【0033】このようにして被検査基板1の上面2に導
通部材29を接触させることにより、被測定基板1の特
定の配線パターンに対し短絡状態(ショート)のもとで
必要な検査を行うことができる。In this way, by bringing the conductive member 29 into contact with the upper surface 2 of the substrate 1 to be inspected, it is possible to perform a necessary inspection on a specific wiring pattern of the substrate 1 to be measured under a short circuit state (short circuit). Can be.
【0034】したがって、単に昇降制御板19,39を
昇降させることにより、被測定基板1に対する非短絡状
態(オープン)での検査と短絡状態(ショート)での検
査とができるので、装置構成を簡素化してデッドスペー
スをなくすことにより省スペース化を図った昇降フィク
スチャタイプのプリント配線板検査装置を提供すること
ができる。Therefore, by simply raising and lowering the lift control plates 19 and 39, the inspection of the substrate 1 to be measured in the non-short-circuit state (open) and the inspection in the short-circuit state (short) can be performed. Thus, it is possible to provide a lifting and lowering fixture type printed wiring board inspection apparatus which saves space by eliminating dead spaces.
【0035】また、図4(a)に示すように導通部材2
9が昇降制御板19の2箇所やそれ以上の箇所に取り付
けられている場合には、図4(b)に示すように複数箇
所に対し短絡状態(ショート)のもとで必要な検査を行
うことができる。なお、図示はしていないが、それぞれ
の座高を異ならせて導通部材29を取り付けてある場合
には、2段や3段に分けた段階的な短絡状態(ショー
ト)のもとで必要な検査を行うことができる。Further, as shown in FIG.
When 9 is attached to two or more places on the elevation control plate 19, necessary inspections are performed for a plurality of places under a short-circuit state (short-circuit) as shown in FIG. 4B. be able to. Although not shown, when the conducting members 29 are attached with different sitting heights, the inspection required under a stepwise short-circuit state (short) divided into two or three stages. It can be performed.
【0036】なお、以上は、本発明の好適例について説
明したものであり、その実施に際しては上述の内容に限
定されるものではない。例えば、上側フィクスチャ15
と下側フィクスチャ35との配置関係は、図示例とは逆
にプローブピン37を被検査基板1に同時接触させた際
の接触圧に応じた退行が自在な支杆材を介在させること
により下側フィクスチャ35を昇降制御板39と連結さ
せ、上側フィクスチャ15を昇降制御板19に対し直に
連結するものであってもよい。また、昇降制御された昇
降制御板に連結される支杆材自体に伸縮構造を内蔵させ
ることにより、接触圧に応じた退行を自在とするもので
あってもよい。The above is a description of a preferred embodiment of the present invention, and the implementation thereof is not limited to the above description. For example, the upper fixture 15
The arrangement relationship between the lower fixture 35 and the lower fixture 35 is, contrary to the illustrated example, by interposing a support rod that can retreat freely according to the contact pressure when the probe pins 37 are simultaneously brought into contact with the substrate 1 to be inspected. The lower fixture 35 may be connected to the elevation control plate 39, and the upper fixture 15 may be directly connected to the elevation control plate 19. Further, the telescopic member may be made to retreat freely in accordance with the contact pressure by incorporating a telescopic structure in the supporting rod itself connected to the vertically controlled lifting control plate.
【0037】さらに、被検査基板が片面プリント配線板
である場合には、当該片面側に対してのみプローブピン
の接離が自在となったフィクスチャを配設すれば足りる
ので、図示例における上側フィクスチャ15側の動きの
みで必要な検査を行うことができることになる。Further, when the substrate to be inspected is a single-sided printed wiring board, it is sufficient to provide a fixture in which the probe pins can freely contact and separate only on the one side, so that the upper side in the illustrated example is sufficient. Necessary inspection can be performed only by the movement of the fixture 15 side.
【0038】[0038]
【発明の効果】以上に述べたよう本発明によれば、単に
昇降制御板を昇降制御することにより、被測定基板に対
する非短絡状態(オープン)での検査と、短絡状態(シ
ョート)での検査とができるので、装置構成を簡素化し
てデッドスペースをなくすことにより省スペース化を図
った昇降フィクスチャタイプのプリント配線板検査装置
を提供することができる。As described above, according to the present invention, the test in the non-short-circuit state (open) and the test in the short-circuit state (short) are performed on the substrate to be measured simply by raising and lowering the lift control plate. Therefore, it is possible to provide a vertically movable fixture-type printed wiring board inspection apparatus that saves space by simplifying the apparatus configuration and eliminating dead spaces.
【0039】また、導通部材が昇降制御板の複数箇所に
取り付けられている場合には、複数箇所に対し短絡状態
(ショート)のもとで必要な検査を行うことができる。When the conductive member is attached to a plurality of positions on the elevation control plate, necessary inspections can be performed for the plurality of positions under a short-circuit state (short circuit).
【図1】本発明における第2の発明についての要部構成
例を示す説明図。FIG. 1 is an explanatory view showing a configuration example of a main part of a second invention according to the present invention.
【図2】図1に示す例についての非導通検査時の状態を
示す説明図。FIG. 2 is an explanatory diagram showing a state at the time of a non-conductivity test for the example shown in FIG. 1;
【図3】図1に示す例についての導通検査時の状態を示
す説明図。FIG. 3 is an explanatory diagram showing a state during a continuity test for the example shown in FIG. 1;
【図4】本発明における第2の発明についての他例を示
す説明図であり、(a)は非検査時における状態を、
(b)は導通検査時における状態をそれぞれ示す。FIG. 4 is an explanatory view showing another example of the second invention of the present invention, wherein (a) shows a state at the time of non-inspection;
(B) shows the state at the time of the continuity test.
【図5】被測定基板が両面プリント配線板である場合に
おける昇降フィクスチャタイプのプリント配線板検査装
置の従来例を示す要部説明図。FIG. 5 is an explanatory view of a main part showing a conventional example of a lifting / lowering fixture type printed wiring board inspection apparatus when the substrate to be measured is a double-sided printed wiring board.
1 被測定基板 2 上面 3 下面 11 プリント配線板検査装置 12装置本体 15 上側フィクスチャ 16 下面 17 プローブピン 18 切欠部 19 昇降制御板 19a 上面 20 通孔 21 雌ねじ部 22 支杆材 23 下端部 24 上端部 25 圧縮用コイルスプリング 26 ガイド筒 27 フランジ部 28 掛止材 29導電部材 29a基材 29b プローブピン 35 上側フィクスチャ 36 上面 37 プローブピン 39 昇降制御板 40 雌ねじ部 51 モータ 52 螺杆材 53 カップリング 101 プリント配線板検査装置 102 下側フィクスチャ 103 上面 104 プローブピン 105 上側フィクスチャ 106 下面 107 プローブピン 108 切欠部 111 昇降制御板 112 上面 113 通孔 114 切欠部 115 支杆材 116 下端部 117 上端部 118 掛止材 119 圧縮用コイルスプリング 120 ガイド筒 121 フランジ部 122 エアシリンダ部 123 給気管 124 導通部材 125 押圧作動杆 REFERENCE SIGNS LIST 1 substrate to be measured 2 upper surface 3 lower surface 11 printed wiring board inspection device 12 device main body 15 upper fixture 16 lower surface 17 probe pin 18 notch portion 19 elevating control plate 19a upper surface 20 through hole 21 female screw portion 22 support rod member 23 lower end portion 24 upper end Part 25 Coil spring for compression 26 Guide cylinder 27 Flange part 28 Hook material 29 Conductive member 29a base material 29b Probe pin 35 Upper fixture 36 Upper surface 37 Probe pin 39 Elevation control plate 40 Female screw part 51 Motor 52 Thread member 53 Coupling 101 Printed wiring board inspection device 102 Lower fixture 103 Upper surface 104 Probe pin 105 Upper fixture 106 Lower surface 107 Probe pin 108 Notch 111 Lift control plate 112 Upper surface 113 Through hole 114 Notch 115 Support rod 116 Lower end 117 upper portion 118 Kaketomezai 119 compression coil spring 120 guide tube 121 flange portion 122 the air cylinder unit 123 the air supply pipe 124 conductive member 125 pushing the operating member
Claims (3)
て、装置本体内に定置される被検査基板の上面と下面と
の少なくともいずれか一方の側の面に対するプローブピ
ンの接離を自在に配設されたフィクスチャを備え、 該フィクスチャは、被検査基板にプローブピンを接触さ
せた際の接触圧に応じた退行が自在な支杆材を介在させ
て前記昇降制御板と連結させるとともに、 その退行時に、当該フィクスチャに設けられた切欠部を
介して相対的に突出して前記被検査基板と接触する導通
部材を、前記昇降制御板に取り付けたことを特徴とする
プリント配線板検査装置。1. A probe pin connected to an elevation control plate that is controlled to elevate, and allows a probe pin to freely contact and separate with at least one of an upper surface and a lower surface of a substrate to be inspected that is fixed in an apparatus main body. The fixture is provided, and the fixture is connected to the elevation control plate via a support rod that can retreat in accordance with the contact pressure when the probe pin is brought into contact with the substrate to be inspected. A printed circuit board inspection apparatus, wherein a conductive member that protrudes relatively through a notch provided in the fixture and comes into contact with the substrate to be inspected is attached to the elevation control plate when the regression is performed. .
されて、装置本体内に定置される被検査基板の上面側と
下面側とに対するプローブピンの接離を自在に配設され
た上側フィクスチャと下側フィクスチャとを備え、 これら上側フィクスチャと下側フィクスチャとのいずれ
か一方の側は、被検査基板にプローブピンを接触させた
際の接触圧に応じた退行が自在な支杆材を介在させて前
記昇降制御板と連結させるとともに、 その退行時に、当該フィクスチャに設けられた切欠部を
介して相対的に突出して前記被検査基板と接触する導通
部材を、前記昇降制御板に取り付けたことを特徴とする
プリント配線板検査装置。2. An upper side, which is separately connected to an elevation control board whose elevation is controlled, and which is arranged such that probe pins can freely contact and separate from an upper surface side and a lower surface side of a substrate to be inspected which is fixed in the apparatus main body. It has a fixture and a lower fixture, and either one of the upper fixture and the lower fixture can retreat freely according to the contact pressure when the probe pins are brought into contact with the board to be inspected. The lifting and lowering control plate is connected with a supporting rod interposed therebetween, and at the time of retreat, a conductive member which protrudes relatively through a notch provided in the fixture and comes into contact with the substrate to be inspected is moved up and down. A printed wiring board inspection device which is attached to a control board.
タにより回転力が付与される螺杆材を介してその昇降を
自在に配設したことを特徴とする請求項1又は2に記載
のプリント配線板検査装置。3. The print according to claim 1, wherein the elevation control plate is freely moved up and down via a screw member to which a rotational force is applied by a motor whose drive is controlled. Wiring board inspection equipment.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000388163A JP2002189048A (en) | 2000-12-21 | 2000-12-21 | Inspection apparatus for printed wiring board |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2000388163A JP2002189048A (en) | 2000-12-21 | 2000-12-21 | Inspection apparatus for printed wiring board |
Publications (1)
Publication Number | Publication Date |
---|---|
JP2002189048A true JP2002189048A (en) | 2002-07-05 |
Family
ID=18854953
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2000388163A Pending JP2002189048A (en) | 2000-12-21 | 2000-12-21 | Inspection apparatus for printed wiring board |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2002189048A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006062145A (en) * | 2004-08-25 | 2006-03-09 | Kyocera Corp | Method of inspecting thermal head |
CN105842614A (en) * | 2016-06-03 | 2016-08-10 | 苏州赛腾精密电子股份有限公司 | Rotary test mechanism and PCB test method based on rotary test mechanism |
CN112098692A (en) * | 2019-06-18 | 2020-12-18 | 旺矽科技股份有限公司 | Electronic component probe testing device |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56110060A (en) * | 1980-02-06 | 1981-09-01 | Nec Corp | Inspecting method and device for base plate of circuit |
JPS62108874U (en) * | 1985-12-26 | 1987-07-11 | ||
JPH08184631A (en) * | 1994-12-27 | 1996-07-16 | Fuji Micro Kogyo Kk | Wiring pattern inspection equipment |
JPH10319076A (en) * | 1997-05-16 | 1998-12-04 | U H T Kk | Continuity inspecting method for ic package board of b/g/a |
-
2000
- 2000-12-21 JP JP2000388163A patent/JP2002189048A/en active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS56110060A (en) * | 1980-02-06 | 1981-09-01 | Nec Corp | Inspecting method and device for base plate of circuit |
JPS62108874U (en) * | 1985-12-26 | 1987-07-11 | ||
JPH08184631A (en) * | 1994-12-27 | 1996-07-16 | Fuji Micro Kogyo Kk | Wiring pattern inspection equipment |
JPH10319076A (en) * | 1997-05-16 | 1998-12-04 | U H T Kk | Continuity inspecting method for ic package board of b/g/a |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006062145A (en) * | 2004-08-25 | 2006-03-09 | Kyocera Corp | Method of inspecting thermal head |
JP4638191B2 (en) * | 2004-08-25 | 2011-02-23 | 京セラ株式会社 | Thermal head inspection method |
CN105842614A (en) * | 2016-06-03 | 2016-08-10 | 苏州赛腾精密电子股份有限公司 | Rotary test mechanism and PCB test method based on rotary test mechanism |
CN112098692A (en) * | 2019-06-18 | 2020-12-18 | 旺矽科技股份有限公司 | Electronic component probe testing device |
CN112098692B (en) * | 2019-06-18 | 2023-10-20 | 旺矽科技股份有限公司 | Electronic component needle-testing device |
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